Aberration Corrected Beam Scanning Stimulated Emission Depletion Microscopy

We present an aberration corrected beam scanning stimulated emission depletion (STED) microscopy. The beam scanning is essential to get images fast for practical usages in the biological applications. In this work the beam scanning method is applied to the STED microscopy. To maintain the imaging pe...

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Bibliographic Details
Published inInternational journal of optomechatronics Vol. 2; no. 4; pp. 401 - 412
Main Authors Yoo, Hongki, Song, Incheon, Gweon, Dae-Gab
Format Journal Article
LanguageEnglish
Published Taylor & Francis Group 26.11.2008
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Summary:We present an aberration corrected beam scanning stimulated emission depletion (STED) microscopy. The beam scanning is essential to get images fast for practical usages in the biological applications. In this work the beam scanning method is applied to the STED microscopy. To maintain the imaging performance optimally, the aberration induced by the optic components, especially beam scanning parts, is corrected using adaptive optics. Thus, high resolution over the diffraction limit and high scanning speed are achieved without resolution and signal loss caused by the aberration.
ISSN:1559-9612
1559-9620
DOI:10.1080/15599610802564550