Characterization of Different Shaped Nanocrystallites using X-ray Diffraction Line Profiles

• Published in: Particle & particle systems characterization Vol. 28; no. 1-2; pp. 19 - 24
• Main Author: Li, Zongquan
• Format: Journal Article
• Language: English
• Published: Weinheim WILEY-VCH Verlag 01.04.2011; WILEY‐VCH Verlag; Wiley Subscription Services, Inc
• Subjects: Computer simulation; Constants; Crystallites; Deviation; Diffraction; Lattice parameters; Line profile; Mathematical analysis; Nanocrystallite; Nanocrystals; X-ray diffraction; X-rays

Quantitative information on the X‐ray diffraction line profiles for different shaped nanocrystallites, using nanocrystalline Cu as an example, are obtained by using the Debye scattering equation, which is useful for characterizing nanocrystallite. The apparent lattice parameter obtained from line po...