True Energy-Performance Analysis of the MTJ-Based Logic-in-Memory Architecture (1-Bit Full Adder)

The use of spin-transfer torque (STT) devices for memory design has been a subject of research since the discovery of the STT on MgO-based magnetic tunnel junctions (MTJs). Recently, MTJ-based computing architectures such as logic-in-memory have been proposed and claim superior energy-delay performa...

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Published inIEEE transactions on electron devices Vol. 57; no. 5; pp. 1023 - 1028
Main Authors Fengbo Ren, Markovic, Dejan
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.05.2010
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN0018-9383
1557-9646
DOI10.1109/TED.2010.2043389

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Abstract The use of spin-transfer torque (STT) devices for memory design has been a subject of research since the discovery of the STT on MgO-based magnetic tunnel junctions (MTJs). Recently, MTJ-based computing architectures such as logic-in-memory have been proposed and claim superior energy-delay performance over static CMOS. In this paper, we conduct exhaustive energy-performance analysis of an STT-MTJ-based logic-in-memory (LIM-MTJ) 1-bit full adder and compare it with its corresponding CMOS counterpart. Our results show that the LIM-MTJ circuit has no advantage in energy-performance over its equivalent CMOS designs. We also show that the MTJ-based logic circuit requiring frequent MTJ switching during the operation is hardly power efficient.
AbstractList The use of spin-transfer torque (STT) devices for memory design has been a subject of research since the discovery of the STT on MgO-based magnetic tunnel junctions (MTJs). Recently, MTJ-based computing architectures such as logic-in-memory have been proposed and claim superior energy-delay performance over static CMOS. In this paper, we conduct exhaustive energy-performance analysis of an STT-MTJ-based logic-in-memory (LIM-MTJ) 1-bit full adder and compare it with its corresponding CMOS counterpart. Our results show that the LIM-MTJ circuit has no advantage in energy-performance over its equivalent CMOS designs. We also show that the MTJ-based logic circuit requiring frequent MTJ switching during the operation is hardly power efficient.
Author Markovic, Dejan
Fengbo Ren
Author_xml – sequence: 1
  surname: Fengbo Ren
  fullname: Fengbo Ren
  email: fren@ee.ucla.edu
  organization: Dept. of Electr. Eng., Univ. of California, Los Angeles, CA, USA
– sequence: 2
  givenname: Dejan
  surname: Markovic
  fullname: Markovic, Dejan
  organization: Dept. of Electr. Eng., Univ. of California, Los Angeles, CA, USA
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22729704$$DView record in Pascal Francis
BookMark eNqNkUFrGzEUhEVJoE7ae6EXQSmkByXSk1ZaHZ3USRsc0oN7XmTt20RhvUql3YP_fWTs5pBD6ekx8M3wmDkhR0MckJBPgp8Lwe3FavH9HHhRwJWUtX1HZqKqDLNa6SMy41zUzMpavicnOT8VqZWCGXGrNCFdDJgetuwXpi6mjRs80vng-m0OmcaOjo9I71a37NJlbOkyPgTPwsDucBPTls6Tfwwj-nFKSM8EuwwjvZ76ns7bFtO3D-S4c33Gj4d7Sn5fL1ZXP9jy_ubn1XzJvKzNyNYIHkwnO25B8LXutGqVXktUvlVg6zVAi05pBFEpWYF1IFtZUFuhtwDylJztc59T_DNhHptNyB773g0Yp9wIbYQEU5n_QKWuRKWVUAX98gZ9ilMq3RSKgxFGlPYL9fVAuexd36VSYcjNcwobl7YNgAFr-C5N7zmfYs4Ju8aH0Y0hDmNyoS-RzW7MpozZ7MZsDmMWI39j_Jv9D8vnvSUg4iteuiu_cPkCFqWneA
CODEN IETDAI
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ContentType Journal Article
Copyright 2015 INIST-CNRS
Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) May 2010
Copyright_xml – notice: 2015 INIST-CNRS
– notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) May 2010
DBID 97E
RIA
RIE
AAYXX
CITATION
IQODW
7SP
8FD
L7M
F28
FR3
DOI 10.1109/TED.2010.2043389
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE/IET Electronic Library
CrossRef
Pascal-Francis
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList Technology Research Database

Engineering Research Database
Engineering Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE/IET Electronic Library
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Applied Sciences
Architecture
EISSN 1557-9646
EndPage 1028
ExternalDocumentID 2716693621
22729704
10_1109_TED_2010_2043389
5437290
Genre orig-research
GroupedDBID -~X
.DC
0R~
29I
3EH
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
ACKIV
ACNCT
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IDIHD
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
O9-
OCL
P2P
RIA
RIE
RNS
TAE
TN5
VH1
VJK
VOH
AAYXX
CITATION
RIG
IQODW
7SP
8FD
L7M
F28
FR3
ID FETCH-LOGICAL-c387t-be2c27f3f09210b6f64d46b3e4cd4298b22dea46e21543529a23d321095ec9223
IEDL.DBID RIE
ISSN 0018-9383
IngestDate Fri Jul 11 04:50:17 EDT 2025
Fri Jul 11 08:01:43 EDT 2025
Mon Jun 30 10:20:36 EDT 2025
Mon Jul 21 09:15:44 EDT 2025
Tue Jul 01 02:51:28 EDT 2025
Thu Apr 24 23:02:23 EDT 2025
Tue Aug 26 16:39:53 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 5
Keywords Performance evaluation
magnetic tunnel junction (MTJ) logic
Arithmetic circuit
energy-delay tradeoff
spin-transfer torque (STT) devices
CMOS digital integrated circuits
Switching
Logic circuit
Magnetic tunneling junction
Complementary MOS technology
Summing circuits
Integrated circuit
complimentary metal-oxide-semiconductor (CMOS) digital integrated circuits
Delay time
Adders
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
CC BY 4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c387t-be2c27f3f09210b6f64d46b3e4cd4298b22dea46e21543529a23d321095ec9223
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ObjectType-Article-2
ObjectType-Feature-1
content type line 23
PQID 1027171110
PQPubID 23500
PageCount 6
ParticipantIDs pascalfrancis_primary_22729704
proquest_miscellaneous_1365156414
ieee_primary_5437290
crossref_primary_10_1109_TED_2010_2043389
proquest_journals_1027171110
crossref_citationtrail_10_1109_TED_2010_2043389
proquest_miscellaneous_1671327572
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2010-05-01
PublicationDateYYYYMMDD 2010-05-01
PublicationDate_xml – month: 05
  year: 2010
  text: 2010-05-01
  day: 01
PublicationDecade 2010
PublicationPlace New York, NY
PublicationPlace_xml – name: New York, NY
– name: New York
PublicationTitle IEEE transactions on electron devices
PublicationTitleAbbrev TED
PublicationYear 2010
Publisher IEEE
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: Institute of Electrical and Electronics Engineers
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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– ident: ref13
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– ident: ref4
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– ident: ref10
  doi: 10.1109/TED.2007.914470
– ident: ref3
  doi: 10.1038/nmat2024
– ident: ref9
  doi: 10.1109/LED.2005.848129
– ident: ref12
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– ident: ref16
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SSID ssj0016442
Score 2.250079
Snippet The use of spin-transfer torque (STT) devices for memory design has been a subject of research since the discovery of the STT on MgO-based magnetic tunnel...
SourceID proquest
pascalfrancis
crossref
ieee
SourceType Aggregation Database
Index Database
Enrichment Source
Publisher
StartPage 1023
SubjectTerms Adders
Applied sciences
Architecture
Architecture (computers)
Circuit properties
CMOS
CMOS integrated circuits
complimentary metal-oxide-semiconductor (CMOS) digital integrated circuits
Design engineering
Design. Technologies. Operation analysis. Testing
Devices
Digital circuits
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
energy-delay tradeoff
Equivalence
Exact sciences and technology
Integrated circuits
Logic circuits
magnetic tunnel junction (MTJ) logic
Magnetic tunneling
Magnetoelectric, magnetostrictive, magnetoacoustic, magnetooptic and magnetothermal devices. Spintronics
Memory devices
Resistance
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
spin-transfer torque (STT) devices
Switches
Switching
Transistors
Tunnel junctions
Writing
Title True Energy-Performance Analysis of the MTJ-Based Logic-in-Memory Architecture (1-Bit Full Adder)
URI https://ieeexplore.ieee.org/document/5437290
https://www.proquest.com/docview/1027171110
https://www.proquest.com/docview/1365156414
https://www.proquest.com/docview/1671327572
Volume 57
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NT9swFH_qOMFhbBS0jg4ZaQeQcJvYToKP7VSEKnXiUCRukeMPCTGliKaH8dfz7HysYxPiFsl24vg9-72f3xfA90TGymllaaRkQVFeK4rKkaXSGJZlDsGY8veQi5_p9a2Y3yV3PbjoYmGstcH5zI78Y7Dlm5Xe-KuycRKMTAjQPyBwq2O1OosByvU6M3iMGxhhV2uSjOQYj4Dah8vHgXJf0H1LBIWaKt4jUq1xUVxdzeKfgzlIm6t9WLTzrJ1MHkabqhjp51cpHN_7I5_gY6N2kknNJ5-hZ8sD2NtKRtgHtXzaWDILsYD05k88AWnzlpCVI6guksVyTqco_AzxhZo1vS_pwvvr_iaTLasEOYvp9L4iHuOSic9Tcn4It1ez5Y9r2hRgoJpfZhUtLNMsc9xFEpFhkbpUGJEW3AptUI5dFowZq0RqUW9AtYtJxbjxQUEysVqi4nEEO-WqtF-AJEmq8HVcW8OFMAkCKYa00CEfXuzcAMYtTXLdZCf3RTJ-5QGlRDJHKuaeinlDxQGcdyMe68wcb_TteyJ0_Zr1H8DJX2Tv2hnD5iwSAxi2fJA3e3uNH2GIgVFG4PjTrhl3pTe1qNKuNtiH-xLzqYjFG33SLOYsSzL29f_TO4bd1lchioewUyEbfEMVqCpOAu-_AONP_18
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT9wwEB4hemh7oA9asZRSV-qhSPVu4keCj0sF2lKCOCwSt8jxQ0KgLILsAX59x86j21Kh3iLZThyPxzPjmfkG4ItUqfZGO5poVVGU15qicuSospbluUdjTId7yOI0m52L4wt5sQbfhlwY51wMPnPj8Bh9-XZhluGqbCKjkwkN9GcyJOO22VqDzwAle4sNniILo-HVOyUTNcFDoI3iCpmgPJR0XxFCsapKiInUd7gsvq1n8ehojvLm6BUU_UzbMJOr8bKpxubhLxDH__2V17DRKZ5k2u6UN7Dm6rfwcgWOcBP0_HbpyGHMBqRnvzMKSI9cQhaeoMJIivkxPUDxZ0ko1WzoZU2LELF7T6YrfgnyNaUHlw0JVi6ZBqSSvXdwfnQ4_z6jXQkGavh-3tDKMcNyz32i0DasMp8JK7KKO2EsSrL9ijHrtMgcag6oeDGlGbchLUhJZxSqHu9hvV7UbguIlJnG13HjLBfCSjSlGNLCRES81PsRTHqalKbDJw9lMq7LaKckqkQqloGKZUfFEewNI25abI4n-m4GIgz9uvUfwe4fZB_aGcPmPBEj2On3Qdlx9x1-hKEVjFICx38empEvg7NF126xxD48FJnPRCqe6JPlKWe5zNn2v6f3CZ7P5sVJefLj9OcHeNFHLiTpDqw3uCU-okLUVLuRD34BV1YCtg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=True+Energy-Performance+Analysis+of+the+MTJ-Based+Logic-in-Memory+Architecture+%281-Bit+Full+Adder%29&rft.jtitle=IEEE+transactions+on+electron+devices&rft.au=Ren%2C+Fengbo&rft.au=Markovi%C2%BF%2C+Dejan&rft.date=2010-05-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=0018-9383&rft.eissn=1557-9646&rft.volume=57&rft.issue=5&rft.spage=1023&rft_id=info:doi/10.1109%2FTED.2010.2043389&rft.externalDBID=NO_FULL_TEXT&rft.externalDocID=2716693621
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9383&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9383&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9383&client=summon