A digital CDS technique and its performance testing
Readout noise is a critical parameter for characterizing the performance of charge-coupled devices（CCDs）, which can be greatly reduced by the correlated double sampling（CDS） circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog compon...
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| Published in | Chinese physics C Vol. 39; no. 7; pp. 48 - 52 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
United States
IOP Publishing
01.07.2015
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1674-1137 0254-3052 |
| DOI | 10.1088/1674-1137/39/7/076101 |
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| Abstract | Readout noise is a critical parameter for characterizing the performance of charge-coupled devices（CCDs）, which can be greatly reduced by the correlated double sampling（CDS） circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique. |
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| AbstractList | Readout noise is a critical parameter for characterizing the performance of charge-coupled devices（CCDs）, which can be greatly reduced by the correlated double sampling（CDS） circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique. Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This article proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit, then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e - and an energy resolution of 121 eV@5.9 keV can be achieved via the digital CDS technique. Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit, then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e super(-) and an energy resolution of 121 eV.9 keV can be achieved via the digital CDS technique. |
| Author | 刘晓艳 陆景彬 杨彦佶 陆波 王于仨 徐玉朋 崔苇苇 李炜 李茂顺 王娟 韩大炜 陈田祥 霍嘉 胡渭 张艺 朱玥 张子良 尹国和 王宇 赵仲毅 付艳红 张娅 马克岩 陈勇 |
| AuthorAffiliation | College of Physics, Jilin University, No.2699, Qianjin Road, Changchun 130023, China Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Beijing 100049, China School of Physical Science and Technology, Yunnan University, Cuihu North Road 2, Kunming 650091, China |
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| BackLink | https://www.osti.gov/servlets/purl/1407298$$D View this record in Osti.gov |
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| Cites_doi | 10.1117/3.374903 10.1086/185701 10.1109/16.78399 10.1086/377082 10.1016/j.nuclphysbps.2006.12.070 |
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| Notes | Readout noise is a critical parameter for characterizing the performance of charge-coupled devices（CCDs）, which can be greatly reduced by the correlated double sampling（CDS） circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique. charge-coupled devices,readout noise,correlated double sampling 11-5641/O4 LIU Xiao-Yan LU Jing-Bin YANG Yan-Ji LU Bo WANG Yu-Sa XU Yu-Peng CUI Wei-Wei LI Wei LI Mao-Shun WANG Juan HAN Da-Wei CHEN Tian-Xiang HUO Jia HU Wei ZHANG Yi ZHU Yue ZHANG Zi-Liang YIN Guo-He WANG Yu ZHAO Zhong-Yi FU Yan-Hong ZHANG Ya MA Ke-Yan CHEN Yong（ 1 College of Physics, Jilin University, No.2699, Qianjin Road, Changchun 130023, China 2 Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Beijing 100049, China 3 School of Physical Science and Technology, Yunnan University, Cuihu North Road 2, Kunming 650091, China） ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 National Natural Science Foundation of China (NSFC) AC02-05CH11231 USDOE Office of Science (SC) |
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| References | 2 3 4 5 7 Yu-Sa Wang (6) 2009; 33 8 Jun-Min Zhang (1) 2009; 17 Yan-Ji Yang (9) 2014; 38 |
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| Snippet | Readout noise is a critical parameter for characterizing the performance of charge-coupled devices（CCDs）, which can be greatly reduced by the correlated double... Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated... |
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| SubjectTerms | Algorithms Charge coupled devices Circuits CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS correlated double sampling Digital ENGINEERING High speed Noise readout noise Sampling Transforms 光盘技术 性能测试 电荷耦合器件 相关双采样 种数 能量分辨率 运算放大器 高速数据采集卡 |
| Title | A digital CDS technique and its performance testing |
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