Optimal testing strategy in semiconductor testing process

We present an optimal test resource allocation strategy using uncertainty reduction in an environment where resource capacity changes dynamically according to engineering activity. The dynamics of test capacity change are modeled using a linear programming model and then extended and generalized to...

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Bibliographic Details
Published inInternational journal of advanced manufacturing technology Vol. 78; no. 9-12; pp. 2107 - 2117
Main Authors Ko, Sung-Seok, Han, Yong-Hee
Format Journal Article
LanguageEnglish
Published London Springer London 01.06.2015
Springer Nature B.V
Subjects
CAE) and Design
Computer-Aided Engineering (CAD
Decision analysis
Decision making
Engineering
Industrial and Production Engineering
Linear programming
Markov chains
Mechanical Engineering
Media Management
Original Article
Resource allocation
Capacity management
Production planning
Semiconductor test
Process improvement
Markov decision process
Statistical decision theory
Test time reduction
Engineering activity
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Summary:We present an optimal test resource allocation strategy using uncertainty reduction in an environment where resource capacity changes dynamically according to engineering activity. The dynamics of test capacity change are modeled using a linear programming model and then extended and generalized to a Markov decision process. We analyze the model to develop structural results and illustrate its behavior with numerical examples. To the best of our knowledge, this model is the first to define, formalize, and analyze the decision-making process associated with reducing final test time in an environment where capacity may be dynamically increased, depending on engineering activity results.
ISSN:0268-3768
1433-3015
DOI:10.1007/s00170-015-6783-1