Characterization of titania thin films grown by dip-coating technique

• Published in: Journal of materials science. Materials in electronics Vol. 27; no. 12; pp. 12291 - 12296
• Main Authors: Dastan, Davoud, Panahi, Seyedeh Leila, Chaure, Nandu B.
• Format: Journal Article
• Language: English
• Published: New York Springer US 01.12.2016; Springer Nature B.V
• Subjects: Agglomeration; Anatase; Annealing; Characterization and Evaluation of Materials; Chemistry and Materials Science; Dip coatings; Energy bands; Materials Science; Optical and Electronic Materials; Stretching; Thin films; Titanium dioxide; Anatase Phase; Field Emission Scanning Electron Microscopy Image; TiO2 Thin Film; Annealed Sample; TiO2

A dip-coating technique was employed to prepare anatase phase of titania thin films. Fluorine doped tin oxide substrates were used to prepare titania thin films. The samples were annealed at 550 °C for 18 h. X-ray diffraction results revealed the amorphous and anatase phases of TiO 2 for as-synthesi...