Lock-V: A heterogeneous fault tolerance architecture based on Arm and RISC-V - Marques, Ivo; Rodrigues, Cristiano; Tavares, Adriano; Pinto, Sandro; Gomes, Tiago (Microelectronics and reliability, 2021)
Keywords: Arm; Design diversity; Dual-core lockstep; Fault tolerance; Field-programmable gate array; RISC-V; Science & Technology; Design diversity; Field-programmable gate array; RISC-V; Fault tolerance; Dual-core lockstep; Arm