Atomic origin of spin-valve magnetoresistance at the SrRuO3 grain boundary

• Published in: National science review Vol. 7; no. 4; pp. 755 - 762
• Main Authors: Li, Xujing, Yin, Li, Lai, Zhengxun, Wu, Mei, Sheng, Yu, Zhang, Lei, Sun, Yuanwei, Chen, Shulin, Li, Xiaomei, Zhang, Jingmin, Li, Yuehui, Liu, Kaihui, Wang, Kaiyou, Yu, Dapeng, Bai, Xuedong, Mi, Wenbo, Gao, Peng
• Format: Journal Article
• Language: English
• Published: Oxford University Press 01.04.2020
• Subjects: spin-valve; electron microscopy; magnetic defects; grain boundary

Abstract Defects exist ubiquitously in crystal materials, and usually exhibit a very different nature from the bulk matrix. Hence, their presence can have significant impacts on the properties of devices. Although it is well accepted that the properties of defects are determined by their unique atom...