Duan, C., Makis, V., & Deng, C. (2019). Optimal Bayesian early fault detection for CNC equipment using hidden semi-Markov process. Mechanical systems and signal processing, 122, 290-306. https://doi.org/10.1016/j.ymssp.2018.11.040
Chicago Style (17th ed.) CitationDuan, Chaoqun, Viliam Makis, and Chao Deng. "Optimal Bayesian Early Fault Detection for CNC Equipment Using Hidden Semi-Markov Process." Mechanical Systems and Signal Processing 122 (2019): 290-306. https://doi.org/10.1016/j.ymssp.2018.11.040.
MLA (9th ed.) CitationDuan, Chaoqun, et al. "Optimal Bayesian Early Fault Detection for CNC Equipment Using Hidden Semi-Markov Process." Mechanical Systems and Signal Processing, vol. 122, 2019, pp. 290-306, https://doi.org/10.1016/j.ymssp.2018.11.040.
Warning: These citations may not always be 100% accurate.