Formation of CdZnS thin films by Zn diffusion

• Published in: Journal of physics. D, Applied physics Vol. 39; no. 15; pp. 3221 - 3225
• Main Authors: Dzhafarov, T D, Ongul, F, Karabay, I
• Format: Journal Article
• Language: English
• Published: Bristol IOP Publishing 07.08.2006; Institute of Physics
• Subjects: Condensed matter: structure, mechanical and thermal properties; Diffusion; interface formation; Exact sciences and technology; Physics; Solid surfaces and solid-solid interfaces; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin films; Zinc sulfides; X ray fluorescence; Cadmium sulfides; XRD; Interface reaction; Absorption spectra; Melting points; Thermal annealing; Dispersive spectrometry; Depth profiles; Concentration distribution

The structural, composition and optical absorption properties of Cd1-xZnxS (CdZnS) thin films fabricated by the reactive diffusion of Zn in CdS have been investigated. These ternary compounds were characterized by x-ray diffraction (XRD), energy dispersive x-ray fluorescence and optical absorption m...