Estimating errors in design sensitivities

• Published in: IEEE transactions on magnetics Vol. 42; no. 4; pp. 559 - 562
• Main Authors: Nair, D., Webb, J.P.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.04.2006; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Automation; Computation; Computer errors; Cross-disciplinary physics: materials science; rheology; Design automation; Design engineering; Discretization; Electromagnetic waveguides; Equations; error analysis; Error detection; Estimation error; Estimators; Exact sciences and technology; Finite element method; Finite element methods; Magnetism; Materials science; Mathematical analysis; Microwave devices; Microwave filters; Microwave theory and techniques; Other topics in materials science; Physics; Scattering parameters; sensitivity; Waveguide filters; Design; Finite element method; Proceedings; Automation; Design automation; error analysis; Microwave devices; Calculus; Modelling; sensitivity; Magnetic properties
• ISSN: 0018-9464; 1941-0069
• DOI: 10.1109/TMAG.2006.871459

Design sensitivities are useful quantities that may be efficiently computed by finite element analysis, from the field solution and its adjoint. However, the computed sensitivities are subject to discretization error. A method is described for the a posteriori estimation of this error, making use of the properties of hierarchal finite elements. The method is applied to the sensitivities of microwave scattering parameters, computed with three-dimensional tetrahedral elements. Results for a waveguide filter, a waveguide transformer, and a magic T demonstrate the quality of the estimator