Automatic PCB Inspection Algorithms: A Survey
The importance of the inspection process has been magnified by the requirements of the modern manufacturing environment. In electronics mass-production manufacturing facilities, an attempt is often made to achieve 100% quality assurance of all parts, subassemblies, and finished goods. A variety of a...
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Published in | Computer vision and image understanding Vol. 63; no. 2; pp. 287 - 313 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier Inc
01.03.1996
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Online Access | Get full text |
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Abstract | The importance of the inspection process has been magnified by the requirements of the modern manufacturing environment. In electronics mass-production manufacturing facilities, an attempt is often made to achieve 100% quality assurance of all parts, subassemblies, and finished goods. A variety of approaches for automated visual inspection of printed circuits have been reported over the past two decades. In this survey, algorithms and techniques for the automated inspection of printed circuit boards are examined. A classification tree for these algorithms is presented and the algorithms are grouped according to this classification. This survey concentrates mainly on image analysis and fault detection strategies; these also include state-of-the-art techniques. A summary of the commercial PCB inspection systems is also presented. |
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AbstractList | The importance of the inspection process has been magnified by the requirements of the modern manufacturing environment. In electronics mass-production manufacturing facilities, an attempt is often made to achieve 100% quality assurance of all parts, subassemblies, and finished goods. A variety of approaches for automated visual inspection of printed circuits have been reported over the past two decades. In this survey, algorithms and techniques for the automated inspection of printed circuit boards are examined. A classification tree for these algorithms is presented and the algorithms are grouped according to this classification. This survey concentrates mainly on image analysis and fault detection strategies; these also include state-of-the-art techniques. A summary of the commercial PCB inspection systems is also presented. |
Author | Moganti, Madhav Ercal, Fikret Dagli, Cihan H. Tsunekawa, Shou |
Author_xml | – sequence: 1 givenname: Madhav surname: Moganti fullname: Moganti, Madhav organization: Department of Computer Science, University of Missouri-Rolla, Rolla, Missouri, 65401 – sequence: 2 givenname: Fikret surname: Ercal fullname: Ercal, Fikret organization: Department of Computer Science, University of Missouri-Rolla, Rolla, Missouri, 65401 – sequence: 3 givenname: Cihan H. surname: Dagli fullname: Dagli, Cihan H. organization: Department of Engineering Management, University of Missouri-Rolla, Rolla, Missouri, 65401 – sequence: 4 givenname: Shou surname: Tsunekawa fullname: Tsunekawa, Shou organization: Toshiba Corporation, Japan |
BookMark | eNp1kE1PhDAQhhuzJu6uXj1z8gZOKYXiDTd-JZtooibeGhgGrQG6trDJ_nsh69XTzOF93sw8K7bobU-MXXKIOEB6jXszRjzP0wgghhO25JBDGAv5sZj3LAsFT-IztvL-G4DzJOdLFhbjYLtyMBi8bG6Dp97vCAdj-6BoP60zw1fnb4IieB3dng7n7LQpW08Xf3PN3u_v3jaP4fb54WlTbEMUSgxhXtdZkirEFOsUK0gkUC4gU2UlK5TEVaXiWtS5aDLIpGokryRVkILAVGIl1uzq2Ltz9mckP-jOeKS2LXuyo9exSISUSk7B6BhEZ7131OidM13pDpqDnq3o2YqerejZygSoI0DT-XtDTns01CPVxk2P69qa_9BflEppjw |
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ContentType | Journal Article |
Copyright | 1996 Academic Press |
Copyright_xml | – notice: 1996 Academic Press |
DBID | AAYXX CITATION 7SC 8FD JQ2 L7M L~C L~D |
DOI | 10.1006/cviu.1996.0020 |
DatabaseName | CrossRef Computer and Information Systems Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional |
DatabaseTitle | CrossRef Computer and Information Systems Abstracts Technology Research Database Computer and Information Systems Abstracts – Academic Advanced Technologies Database with Aerospace ProQuest Computer Science Collection Computer and Information Systems Abstracts Professional |
DatabaseTitleList | Computer and Information Systems Abstracts |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Applied Sciences Engineering Computer Science |
EISSN | 1090-235X |
EndPage | 313 |
ExternalDocumentID | 10_1006_cviu_1996_0020 S107731429690020X |
GroupedDBID | --K --M -~X .DC .~1 0R~ 1B1 1~. 1~5 29F 4.4 457 4G. 5GY 5VS 6TJ 7-5 71M 8P~ AABNK AACTN AAEDT AAEDW AAIAV AAIKC AAIKJ AAKOC AALRI AAMNW AAOAW AAQFI AAQXK AAXUO AAYFN ABBOA ABEFU ABFNM ABJNI ABMAC ABXDB ABYKQ ACDAQ ACGFS ACNNM ACRLP ACZNC ADBBV ADEZE ADFGL ADJOM ADMUD ADTZH AEBSH AECPX AEKER AENEX AFKWA AFTJW AGHFR AGUBO AGYEJ AHJVU AHZHX AIALX AIEXJ AIKHN AITUG AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ AOUOD ASPBG AVWKF AXJTR AZFZN BJAXD BKOJK BLXMC CAG COF CS3 DM4 DU5 EBS EFBJH EFLBG EJD EO8 EO9 EP2 EP3 F0J F5P FDB FEDTE FGOYB FIRID FNPLU FYGXN G-Q GBLVA GBOLZ HF~ HVGLF HZ~ IHE J1W JJJVA KOM LG5 M41 MO0 N9A O-L O9- OAUVE OZT P-8 P-9 P2P PC. Q38 R2- RIG RNS ROL RPZ SDF SDG SDP SES SEW SPC SPCBC SSV SSZ T5K TN5 XPP ZMT ~G- AAXKI AAYXX AFJKZ AKRWK CITATION SST 7SC 8FD JQ2 L7M L~C L~D |
ID | FETCH-LOGICAL-c383t-9dd7468cc6cd6cb0450e93078ab5bc5e18b82d3d93f70758f51b5eb0603c65cb3 |
IEDL.DBID | AIKHN |
ISSN | 1077-3142 |
IngestDate | Fri Oct 25 10:40:16 EDT 2024 Thu Sep 26 17:53:21 EDT 2024 Fri Feb 23 02:26:56 EST 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 2 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c383t-9dd7468cc6cd6cb0450e93078ab5bc5e18b82d3d93f70758f51b5eb0603c65cb3 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
PQID | 23435585 |
PQPubID | 23500 |
PageCount | 27 |
ParticipantIDs | proquest_miscellaneous_23435585 crossref_primary_10_1006_cviu_1996_0020 elsevier_sciencedirect_doi_10_1006_cviu_1996_0020 |
PublicationCentury | 1900 |
PublicationDate | 1996-03-01 |
PublicationDateYYYYMMDD | 1996-03-01 |
PublicationDate_xml | – month: 03 year: 1996 text: 1996-03-01 day: 01 |
PublicationDecade | 1990 |
PublicationTitle | Computer vision and image understanding |
PublicationYear | 1996 |
Publisher | Elsevier Inc |
Publisher_xml | – name: Elsevier Inc |
SSID | ssj0011491 |
Score | 2.0333202 |
Snippet | The importance of the inspection process has been magnified by the requirements of the modern manufacturing environment. In electronics mass-production... |
SourceID | proquest crossref elsevier |
SourceType | Aggregation Database Publisher |
StartPage | 287 |
Title | Automatic PCB Inspection Algorithms: A Survey |
URI | https://dx.doi.org/10.1006/cviu.1996.0020 https://search.proquest.com/docview/23435585 |
Volume | 63 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LT4NAEJ70cdGDj6qxPioHE09YYGEL3rCxaTU2JrVJbxt2WZREoWmhiRd_u7MFjBq9eB3Chny7M_MN81iAc1sKM3Bt3AF8rNshIToPiNBFJKkVhoEQXDU434_pcGrfzpxZDfpVL4wqqyxtf2HT19a6lHRLNLvzOO5OMHDpERPtKQZ4SHpmdWiiO7LcBjT90d1w_JlMwCDALEoP1S8526pmNxq0K1Zxrhr2VEZCXfn9u2_6YaXXrmewA1slZ9T84rN2oSaTFmyX_FErtXOJouqKhkrWgs0v8wb3QPfzLF3PaNUe-tfaKCn6LNNE81-e0kWcPb8urzRfm-SLlXzbh-ng5rE_1Mv7EnSBcWame2HYs6krBBUhFRzJmiE91GE34A4XjjRd7lohCT0S9ZApuJFjckdygxpEUEdwcgCNJE3kIWhUYtjmRZHRkxifoZpKzyCuFJ4hnYCbQRsuKqTYvBiLwYoByJQpTJnClClM22BWQLJvG8vQZv_5zlmFOMPTrlIYQSLTfMksYqt58M7RP1Y9ho2i5FoVkJ1AI1vk8hQZRcY7UL98NzvlufkA2W3KqQ |
link.rule.ids | 315,783,787,4509,24128,27936,27937,45597,45691 |
linkProvider | Elsevier |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LT8JAEJ4gHtSDD9SIL3ow8VRp2XZpvSHRgAIxARJum-52q020JdCSePG3O9uHUaMXr9Nt03w7M_tNdh4AF5YUpudYuAP4WLd8QnTuEaGLQNKW73tCcFXgPBzR3tS6n9mzCnTLWhiVVln4_tynZ966kDQLNJvzMGyOMXBpExP9KQZ4SHpma7BuKX6MSn31_pnngXw_G5unVutqedm50aBNsQpTVa6n7iPUwO_fT6YfPjo7eO52YbtgjFon_6k9qMioBjsFe9QK21yiqBzQUMpqsPWl2-A-6J00ibMOrdpj90brR3mVZRxpnZeneBEmz6_La62jjdPFSr4dwPTudtLt6cW0BF1glJnoru-3LeoIQYVPBUeqZkgXLdjxuM2FLU2HOy2f-C4J2sgTnMA2uS25QQ0iqC04OYRqFEfyCDQqMWhzg8BoS4zO0EilaxBHCteQtsdNrw6XJVJsnjfFYHn7Y8oUpkxhyhSmdTBLINm3bWXosf98p1EizlDX1QWGF8k4XbIWsVQ3ePv4H19twEZvMhywQX_0cAKbefK1SiU7hWqySOUZcouEn2e68wGmqcuC |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Automatic+PCB+Inspection+Algorithms%3A+A+Survey&rft.jtitle=Computer+vision+and+image+understanding&rft.au=Moganti%2C+Madhav&rft.au=Ercal%2C+Fikret&rft.au=Dagli%2C+Cihan+H.&rft.au=Tsunekawa%2C+Shou&rft.date=1996-03-01&rft.issn=1077-3142&rft.volume=63&rft.issue=2&rft.spage=287&rft.epage=313&rft_id=info:doi/10.1006%2Fcviu.1996.0020&rft.externalDBID=n%2Fa&rft.externalDocID=10_1006_cviu_1996_0020 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1077-3142&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1077-3142&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1077-3142&client=summon |