Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

• Published in: Review of scientific instruments Vol. 84; no. 3; pp. 035105 - 35110
• Main Authors: Kummer, K., Fondacaro, A., Yakhou-Harris, F., Sessi, V., Pobedinskas, P., Janssens, S. D., Haenen, K., Williams, O. A., Hees, J., Brookes, N. B.
• Format: Journal Article
• Language: English
• Published: United States 01.03.2013
• Subjects: ABSORPTION SPECTROSCOPY; BEAMS; BORON; DIAMONDS; DICHROISM; DIFFRACTION; DOPED MATERIALS; EUROPEAN SYNCHROTRON RADIATION FACILITY; EXPERIMENTAL DATA; GOLD; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; MATERIALS SCIENCE; MONITORING; MONITORS; PHOTONS; RARE EARTHS; SOFT X RADIATION; THIN FILMS; X-RAY SPECTROSCOPY
• ISSN: 0034-6748; 1089-7623; 1089-7623
• DOI: 10.1063/1.4794439

Quantitative analysis of X-ray absorption and dichroism data requires knowledge of the beamline photon flux during the measurements. We show that thin conductive (B-doped) diamond thin films can be an alternative to the widely used gold meshes for monitoring the beam intensity of soft X-ray beamline...