Using Orthogonal Arrays in the Sensitivity Analysis of Computer Models

We consider a class of input sampling plans, called permuted column sampling plans, that are popular in sensitivity analysis of computer models. Permuted column plans, including replicated Latin hypercube sampling, support estimation of first-order sensitivity coefficients, but these estimates are b...

Full description

Saved in:
Bibliographic Details
Published inTechnometrics Vol. 50; no. 2; pp. 205 - 215
Main Authors Morris, Max D., Moore, Leslie M., McKay, Michael D.
Format Journal Article
LanguageEnglish
Published Alexandria, VI Taylor & Francis 01.05.2008
Milwaukee, WI The American Society for Quality and The American Statistical Association
American Society for Quality Control
American Statistical Association
American Society for Quality
Subjects
Online AccessGet full text

Cover

Loading…
Abstract We consider a class of input sampling plans, called permuted column sampling plans, that are popular in sensitivity analysis of computer models. Permuted column plans, including replicated Latin hypercube sampling, support estimation of first-order sensitivity coefficients, but these estimates are biased when the usual practice of random column permutation is used to construct the sampling arrays. Deterministic column permutations may be used to eliminate this estimation bias. We prove that any permuted column sampling plan that eliminates estimation bias, using the smallest possible number of runs in each array and containing the largest possible number of arrays, can be characterized by an orthogonal array of strength 2. We derive approximate standard errors of the first-order sensitivityindices for this sampling plan. We give two examples demonstrating the sampling plan, behavior of the estimates, and standard errors, along with comparative results based on other approaches.
AbstractList We consider a class of input sampling plans, called permuted column sampling plans, that are popular in sensitivity analysis of computer models. Permuted column plans, including replicated Latin hypercube sampling, support estimation of first-order sensitivity coefficients, but these estimates are biased when the usual practice of random column permutation is used to construct the sampling arrays. Deterministic column permutations may be used to eliminate this estimation bias. We prove that any permuted column sampling plan that eliminates estimation bias, using the smallest possible number of runs in each array and containing the largest possible number of arrays, can be characterized by an orthogonal array of strength 2. We derive approximate standard errors of the first-order sensitivity indices for this sampling plan. We give two examples demonstrating the sampling plan, behavior of the estimates, and standard errors, along with comparative results based on other approaches.
We consider a class of input sampling plans, called permuted column sampling plans, that are popular in sensitivity analysis of computer models. Permuted column plans, including replicated Latin hypercube sampling, support estimation of first-order sensitivity coefficients, but these estimates are biased when the usual practice of random column permutation is used to construct the sampling arrays. Deterministic column permutations may be used to eliminate this estimation bias. We prove that any permuted column sampling plan that eliminates estimation bias, using the smallest possible number of runs in each array and containing the largest possible number of arrays, can be characterized by an orthogonal array of strength 2. We derive approximate standard errors of the first-order sensitivity indices for this sampling plan. We give two examples demonstrating the sampling plan, behavior of the estimates, and standard errors, along with comparative results based on other approaches. [PUBLICATION ABSTRACT]
We consider a class of input sampling plans, called permuted column sampling plans, that are popular in sensitivity analysis of computer models. Permuted column plans, including replicated Latin hypercube sampling, support estimation of first-order sensitivity coefficients, but these estimates are biased when the usual practice of random column permutation is used to construct the sampling arrays. Deterministic column permutations may be used to eliminate this estimation bias. We prove that any permuted column sampling plan that eliminates estimation bias, using the smallest possible number of runs in each array and containing the largest possible number of arrays, can be characterized by an orthogonal array of strength 2. We derive approximate standard errors of the first-order sensitivityindices for this sampling plan. We give two examples demonstrating the sampling plan, behavior of the estimates, and standard errors, along with comparative results based on other approaches.
Author Moore, Leslie M.
Morris, Max D.
McKay, Michael D.
Author_xml – sequence: 1
  givenname: Max D.
  surname: Morris
  fullname: Morris, Max D.
– sequence: 2
  givenname: Leslie M.
  surname: Moore
  fullname: Moore, Leslie M.
– sequence: 3
  givenname: Michael D.
  surname: McKay
  fullname: McKay, Michael D.
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=20389783$$DView record in Pascal Francis
BookMark eNp9kEFLAzEUhINUsK3-AUEIgsfVl2R3kz14KMWqoPSgPS9pmrQp201NUmX_vVu36kHwXd5hvhmGGaBe7WqN0DmBa0IKcQOQAuEAAr6OgjhCfZIxnlBOWQ_190DSEvkJGoSwBiCMCt5Hk1mw9RJPfVy5patlhUfeyyZgW-O40vhF18FG-25jg0et3AQbsDN47DbbXdQeP7uFrsIpOjayCvrs8IdoNrl7HT8kT9P7x_HoKVFMQExkkSuVGi4zIoUEMAvFJQdDGYM0VSxbQDHnjAvGVa4LTQQhlAJP54YKkmdsiC673K13bzsdYrl2O9_2CiUlLOdUMNJCtIOUdyF4bcqttxvpm5JAuZ-r_DtXa7o6JMugZGW8rJUNP04KTBRtr5a76Lh1iM7_6lnKSZpDq992uq2N8xv54Xy1KKNsKue_Q9k_PT4BWLiGKQ
CODEN TCMTA2
CitedBy_id crossref_primary_10_1093_ajae_aau076
crossref_primary_10_1016_j_envsoft_2013_08_005
crossref_primary_10_1016_j_ejor_2012_11_047
crossref_primary_10_1111_sjos_12560
crossref_primary_10_3389_fams_2019_00004
crossref_primary_10_1016_j_jspi_2011_12_030
crossref_primary_10_1371_journal_pone_0124037
crossref_primary_10_1016_j_jspi_2013_04_003
crossref_primary_10_1016_j_nucengdes_2011_01_048
crossref_primary_10_1016_j_envsoft_2012_04_017
crossref_primary_10_1016_j_ress_2018_09_010
crossref_primary_10_1080_00949655_2014_973880
crossref_primary_10_1111_j_1745_6584_2009_00576_x
crossref_primary_10_1016_j_ress_2017_02_002
crossref_primary_10_1016_j_ress_2019_04_014
crossref_primary_10_1007_s10588_021_09358_5
crossref_primary_10_1016_j_ymeth_2021_03_008
crossref_primary_10_1080_03610918_2011_575500
crossref_primary_10_1016_j_jhydrol_2024_131582
crossref_primary_10_1137_16M1096505
crossref_primary_10_1137_130931175
crossref_primary_10_1111_rssb_12052
crossref_primary_10_12688_openreseurope_15461_1
crossref_primary_10_1016_j_ress_2016_10_020
crossref_primary_10_1002_2014WR015382
crossref_primary_10_1080_00949655_2014_971799
crossref_primary_10_1007_s10260_014_0290_7
Cites_doi 10.1080/00949659708811825
10.1016/0951-8320(95)00099-2
10.2307/1268522
10.1111/j.1467-9868.2004.05304.x
10.2307/2291014
10.1016/j.ress.2005.06.003
10.1016/S0010-4655(02)00280-1
10.1063/1.1680571
10.1098/rspl.1902.0099
10.1016/j.cpc.2007.07.011
10.2307/1269769
10.2307/2291282
10.2307/1266466
10.1016/j.jspi.2005.01.001
10.1214/aoms/1177730196
ContentType Journal Article
Copyright 2008 American Statistical Association and the American Society for Quality 2008
Copyright 2008 The American Statistical Association and The American Society for Quality
2008 INIST-CNRS
Copyright American Society for Quality May 2008
Copyright_xml – notice: 2008 American Statistical Association and the American Society for Quality 2008
– notice: Copyright 2008 The American Statistical Association and The American Society for Quality
– notice: 2008 INIST-CNRS
– notice: Copyright American Society for Quality May 2008
DBID IQODW
AAYXX
CITATION
3V.
7WY
7WZ
7XB
87Z
88I
8AO
8C1
8FE
8FG
8FK
8FL
ABJCF
ABUWG
AFKRA
AZQEC
BENPR
BEZIV
BGLVJ
CCPQU
DWQXO
FRNLG
FYUFA
F~G
GHDGH
GNUQQ
HCIFZ
K60
K6~
L.-
L6V
M0C
M2P
M7S
PQBIZ
PQBZA
PQEST
PQQKQ
PQUKI
PRINS
PTHSS
PYYUZ
Q9U
S0X
DOI 10.1198/004017008000000208
DatabaseName Pascal-Francis
CrossRef
ProQuest Central (Corporate)
ABI/INFORM Collection
ABI/INFORM Global (PDF only)
ProQuest Central (purchase pre-March 2016)
ABI/INFORM Collection
Science Database (Alumni Edition)
ProQuest Pharma Collection
Public Health Database
ProQuest SciTech Collection
ProQuest Technology Collection
ProQuest Central (Alumni) (purchase pre-March 2016)
ABI/INFORM Collection (Alumni Edition)
Materials Science & Engineering Collection
ProQuest Central (Alumni)
ProQuest Central
ProQuest Central Essentials
AUTh Library subscriptions: ProQuest Central
Business Premium Collection
Technology Collection
ProQuest One Community College
ProQuest Central
Business Premium Collection (Alumni)
Health Research Premium Collection
ABI/INFORM Global (Corporate)
Health Research Premium Collection (Alumni)
ProQuest Central Student
SciTech Premium Collection
ProQuest Business Collection (Alumni Edition)
ProQuest Business Collection
ABI/INFORM Professional Advanced
ProQuest Engineering Collection
ABI/INFORM Global
ProQuest Science Journals
Engineering Database
One Business
ProQuest One Business (Alumni)
ProQuest One Academic Eastern Edition (DO NOT USE)
ProQuest One Academic
ProQuest One Academic UKI Edition
ProQuest Central China
Engineering Collection
ABI/INFORM Collection China
ProQuest Central Basic
SIRS Editorial
DatabaseTitle CrossRef
ABI/INFORM Global (Corporate)
ProQuest Business Collection (Alumni Edition)
ProQuest One Business
ProQuest Central Student
Technology Collection
ProQuest Central Essentials
SIRS Editorial
ProQuest Central (Alumni Edition)
SciTech Premium Collection
ProQuest One Community College
ProQuest Pharma Collection
ProQuest Central China
ABI/INFORM Complete
ProQuest Central
ABI/INFORM Professional Advanced
ProQuest Engineering Collection
Health Research Premium Collection
ProQuest Central Korea
ABI/INFORM Complete (Alumni Edition)
Engineering Collection
Business Premium Collection
ABI/INFORM Global
Engineering Database
ProQuest Public Health
ProQuest Science Journals (Alumni Edition)
ABI/INFORM Global (Alumni Edition)
ProQuest Central Basic
ProQuest Science Journals
ProQuest One Academic Eastern Edition
ABI/INFORM China
ProQuest Technology Collection
Health Research Premium Collection (Alumni)
ProQuest SciTech Collection
ProQuest Business Collection
ProQuest One Academic UKI Edition
Materials Science & Engineering Collection
ProQuest One Business (Alumni)
ProQuest One Academic
ProQuest Central (Alumni)
Business Premium Collection (Alumni)
DatabaseTitleList
ABI/INFORM Global (Corporate)

Database_xml – sequence: 1
  dbid: 8FG
  name: ProQuest Technology Collection
  url: https://search.proquest.com/technologycollection1
  sourceTypes: Aggregation Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Statistics
Mathematics
EISSN 1537-2723
EndPage 215
ExternalDocumentID 1502975831
10_1198_004017008000000208
20389783
25471460
10714337
Genre Primary Article
Feature
GroupedDBID -ET
-~X
..I
.7F
.DC
.QJ
07G
0B8
0BK
0R~
123
29Q
2AX
30N
3V.
4.4
5RE
7WY
85S
88I
8AO
8C1
8FE
8FG
8FL
96U
AAAVI
AAENE
AAJMT
AAKYL
AALDU
AAMIU
AAPUL
AAQRR
ABBHK
ABCCY
ABEHJ
ABFAN
ABFIM
ABJCF
ABJNI
ABLIJ
ABPEM
ABPPZ
ABQDR
ABTAI
ABUWG
ABXSQ
ABXUL
ABXYU
ABYWD
ACBEA
ACGFO
ACGFS
ACGOD
ACIWK
ACMTB
ACNCT
ACTIO
ACTMH
ADACV
ADBBV
ADCVX
ADGTB
ADODI
ADULT
AEGXH
AEGYZ
AEISY
AELLO
AELPN
AENEX
AEOZL
AEPSL
AEUPB
AEYOC
AFAZI
AFKRA
AFVYC
AFWLO
AGCQS
AGDLA
AGMYJ
AHDLD
AHDZW
AIAGR
AIJEM
AKBRZ
AKBVH
AKOOK
ALMA_UNASSIGNED_HOLDINGS
ALQZU
AMXXU
AQRUH
AVBZW
AWYRJ
AZQEC
BCCOT
BENPR
BES
BEZIV
BGLVJ
BHOJU
BLEHA
BPHCQ
BPLKW
C06
CCCUG
CCPQU
CS3
DGEBU
DKSSO
DQDLB
DSRWC
DU5
DWIFK
DWQXO
EBS
ECEWR
EJD
E~A
E~B
F5P
FEDTE
FRNLG
FYUFA
GIFXF
GNUQQ
GROUPED_ABI_INFORM_COMPLETE
GTTXZ
HCIFZ
HFX
HQ6
HZ~
H~P
IAO
IEA
IGG
IHF
IOF
IPNFZ
IPSME
J.P
JAA
JAAYA
JBMMH
JBZCM
JENOY
JHFFW
JKQEH
JLEZI
JLXEF
JMS
JPL
JSODD
JST
K60
K6~
KYCEM
L6V
M0C
M2P
M4Z
M7S
MS~
MW2
N95
NA5
NY~
O9-
P2P
PQBIZ
PQBZA
PQQKQ
PROAC
PTHSS
RIG
RNANH
ROSJB
RTWRZ
RWL
S-T
S0X
SA0
SNACF
TAE
TAQ
TBQAZ
TDBHL
TEJ
TFL
TFT
TFW
TN5
TTHFI
U5U
UB9
UKHRP
UT5
UU3
WH7
WZA
XFK
YNT
ZE2
ZGOLN
~02
~S~
ABJVF
ABQHQ
ABTRL
AFOLD
AFXKK
AIRXU
BDTQF
EFSUC
FUNRP
FVPDL
V1K
.-4
.GJ
3R3
41~
AAAVZ
AAIKQ
AAKBW
AAYJJ
ABEFU
ABPTK
ABTAH
ACAGQ
ADIYS
AEUMN
AGLEN
AGROQ
AHMOU
ALCKM
AMATQ
CRFIH
DMQIW
H13
HF~
HGD
I-F
IQODW
IVXBP
LJTGL
MVM
NHB
NUSFT
QCRFL
TFMCV
TOXWX
UAP
VOH
XOL
YHZ
YXB
YYP
ZCG
ZXP
ZY4
AAYXX
ABPAQ
ACGEE
ALIPV
CITATION
HVGLF
TUROJ
7XB
8FK
ACDIW
L.-
PQEST
PQUKI
PRINS
Q9U
ID FETCH-LOGICAL-c380t-a96cc4f7a51a8a00fdc7a70f233044c35d09b737837c6e9e181122074bf281653
IEDL.DBID BENPR
ISSN 0040-1706
IngestDate Thu Oct 10 17:20:18 EDT 2024
Thu Sep 12 16:35:01 EDT 2024
Sun Oct 29 17:10:57 EDT 2023
Fri Feb 02 07:06:19 EST 2024
Sun May 12 07:09:50 EDT 2024
IsPeerReviewed true
IsScholarly true
Issue 2
Keywords Sensitivity analysis
Probabilistic approach
Error estimation
Computer simulation
First-order variance coefficient
Permutation
Bias
Replicated Latin hypercube sample
Modeling
Optimization
Variance
Uncertain system
Latin hypercube sampling
Computer experiment
Experimental design
Deterministic approach
Uncertainty analysis
Biased estimation
Language English
License CC BY 4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c380t-a96cc4f7a51a8a00fdc7a70f233044c35d09b737837c6e9e181122074bf281653
PQID 213672831
PQPubID 24108
PageCount 11
ParticipantIDs jstor_primary_25471460
crossref_primary_10_1198_004017008000000208
pascalfrancis_primary_20389783
informaworld_taylorfrancis_310_1198_004017008000000208
proquest_journals_213672831
PublicationCentury 2000
PublicationDate 2008-05-01
PublicationDateYYYYMMDD 2008-05-01
PublicationDate_xml – month: 05
  year: 2008
  text: 2008-05-01
  day: 01
PublicationDecade 2000
PublicationPlace Alexandria, VI
Milwaukee, WI
PublicationPlace_xml – name: Milwaukee, WI
– name: Alexandria, VI
– name: Alexandria
PublicationTitle Technometrics
PublicationYear 2008
Publisher Taylor & Francis
The American Society for Quality and The American Statistical Association
American Society for Quality Control
American Statistical Association
American Society for Quality
Publisher_xml – name: Taylor & Francis
– name: The American Society for Quality and The American Statistical Association
– name: American Society for Quality Control
– name: American Statistical Association
– name: American Society for Quality
References p_16
p_18
p_1
p_12
p_23
p_3
p_13
p_14
p_5
p_15
p_8
p_7
Sobol' I. M. (p_19) 1993; 1
Owen A. (p_11) 1992; 2
p_20
p_10
p_22
References_xml – ident: p_1
  doi: 10.1080/00949659708811825
– ident: p_16
  doi: 10.1016/0951-8320(95)00099-2
– ident: p_7
  doi: 10.2307/1268522
– ident: p_10
  doi: 10.1111/j.1467-9868.2004.05304.x
– ident: p_12
  doi: 10.2307/2291014
– ident: p_23
  doi: 10.1016/j.ress.2005.06.003
– ident: p_15
  doi: 10.1016/S0010-4655(02)00280-1
– volume: 2
  start-page: 439
  year: 1992
  ident: p_11
  publication-title: Statistica Sinica
  contributor:
    fullname: Owen A.
– ident: p_3
  doi: 10.1063/1.1680571
– ident: p_13
  doi: 10.1098/rspl.1902.0099
– ident: p_14
  doi: 10.1016/j.cpc.2007.07.011
– volume: 1
  start-page: 407
  year: 1993
  ident: p_19
  publication-title: Mathematical Modelling and Computational Experiments
  contributor:
    fullname: Sobol' I. M.
– ident: p_20
  doi: 10.2307/1269769
– ident: p_22
  doi: 10.2307/2291282
– ident: p_18
  doi: 10.2307/1266466
– ident: p_8
  doi: 10.1016/j.jspi.2005.01.001
– ident: p_5
  doi: 10.1214/aoms/1177730196
SSID ssj0013287
Score 2.0347953
Snippet We consider a class of input sampling plans, called permuted column sampling plans, that are popular in sensitivity analysis of computer models. Permuted...
SourceID proquest
crossref
pascalfrancis
jstor
informaworld
SourceType Aggregation Database
Index Database
Publisher
StartPage 205
SubjectTerms Arrays
Bias
Computer experiment
Computer modeling
Environment modeling
Estimates
Estimation bias
Exact sciences and technology
Experimental design
First-order variance coefficient
Mathematical functions
Mathematics
Modeling
Probability and statistics
Random sampling
Replicated Latin hypercube sample
Sample variance
Sampling theory, sample surveys
Sciences and techniques of general use
Sensitivity analysis
Standard error
Statistical variance
Statistics
Studies
Uncertainty analysis
Title Using Orthogonal Arrays in the Sensitivity Analysis of Computer Models
URI https://www.tandfonline.com/doi/abs/10.1198/004017008000000208
https://www.jstor.org/stable/25471460
https://www.proquest.com/docview/213672831
Volume 50
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1JS8NAFH64XPQgbsW6lDl4k-BknZmTqFiL4IJa6C1MJhkVpNEmHvz3vpelthR6CYRkJuS9ybzty_cATlNcCBm3xkl5GDqBsZ6jkixxEnStfWEtGg3Kd9w_RINhcDcKRw02p2hgle2eWG3UaW4oR37uEbcY2kL34uvboaZRVFxtOmiswrrnBlSlXb-6eXh6nikjSNHC5ognpv1rRkki9SHqGHKYeFWPk3OWaY63tMUqEnBSFyg7Wze9WNi_K6PU34atxptkl7X6d2AlG-_C5gzHIJ7dT4lZi13YIOey5mbeg36FF2CPk_I9f8vriSb6t2AfY4Zj2AuB2-vuEqwlL2G5ZW0nCEaN1D6LfRj2b16vB07TV8ExvuSlo1VkTGCFDl0tNec2NUILbj3KbQTGD1OuEuELjF1NlKkMnQDX89DXSKwn3Sj0O7A2zsfZATAVCGVU6KW-xUA7NRqnEMZKo41VuFl04ayVafxV02fEVdihZLyogS5Es2KPyypp0Qg79pcN7FQKmj4Dw16BNoB3oTensf8biFgQ37ALR60K4-brLeLpWjtcevUINmr0CMEfj2GtnPxkJ-iilEkPVuW1S8f-ba9ZlH8D5uEm
link.rule.ids 315,786,790,12250,12792,21416,27955,27956,33299,33406,33777,43612,43633,43838,60239,61028,74369,74390,74657
linkProvider ProQuest
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3JTsMwEB1BOQAHxFZRyuIDNxThrI5PCFVUZSkcAKm3yHFiQEJNacKBv2cmS2lVqccosaPMOLP5-Q3ARYILIeVGWwn3fcvTxrFknMZWjKG1K4xBp0H1juFTMHjz7kf-qMbm5DWssrGJpaFOMk018iuHuMXQF9rXk2-LmkbR5mrdQWMdNjwXXTUdFO_Zc5sIoWhAc8QS05yZkSFR-hBxDIVLvNyNCxf80gJraYNUJNikylFypmp5sWS9S5fU34WdOpZkN5Xy92AtHe_D9hzDIF4NZ7Ss-T5sUWhZMTMfQL9EC7DnafGRvWfVRFP1m7PPMcMx7IWg7VVvCdZQl7DMsKYPBKM2al_5Ibz1b197A6vuqmBpN-SFpWSgtWeE8m0VKs5NooUS3DhU2fC06ydcxsIVmLnqIJUphgC242CkERsntAPfbUNrnI3TI2DSE1JL30lcg2l2ohVOIbQJtdJGoqnowGUj02hSkWdEZdIhw2hZAx0I5sUeFWXJohZ25K4a2C4VNHsHJr0CPQDvwNmCxv4fIFpB_MIOdBsVRvW_m0ezlXa88u45bA5eh4_R493TQxe2KhwJASFPoFVMf9JTDFaK-Kxckn8FheDF
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3JSsRAEC1cQPQgrjiOSx-8SbAnW3efRNQ47oIK3kKnk1ZBJuMkHvx7q7KMMwgeQ9IJqarU1i-vAA5SNISMW-OkPAgc31jXUUmWOAmm1p6wFoMG9Ttu78L-s3_1Erw0lEJFA6tsfWLlqNPcUI_8yCVuMYyFvSPboCIezqLj4adDA6Roo7WZpjEL85Rj0xQHGV1MbChI0QLoiDGm_X9GSaL3IRIZSp14tTMnp2LUFINpi1okCKUuUIq2Hn_xx5NX4SlageUmr2QntSGswkw2WIOlCbZBPLodU7QWa7BIaWbN0rwOUYUcYPej8i1_zesbjfR3wd4HDNewR4K513MmWEtjwnLL2pkQjEaqfRQb8BydP532nWbCgmM8yUtHq9AY3wod9LTUnNvUCC24danL4RsvSLlKhCewijVhpjJMB3qui1lHYl3ZCwNvE-YG-SDbAqZ8oYwK3NSzWHKnRuMthLHSaGMVuo0OHLYyjYc1kUZcFSBKxn810IFwUuxxWbUvGmHH3n8LNysFjZ-BBbDAaMA7sDelsd8LiGIQ37AD3VaFcfMdF_HY6rb_PbsPC2iN8c3l3XUXFmtICWEid2CuHH1lu5i3lMleZZE_I3HlLw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Using+Orthogonal+Arrays+in+the+Sensitivity+Analysis+of+Computer+Models&rft.jtitle=Technometrics&rft.au=Morris%2C+Max+D.&rft.au=Moore%2C+Leslie+M.&rft.au=McKay%2C+Michael+D.&rft.date=2008-05-01&rft.issn=0040-1706&rft.eissn=1537-2723&rft.volume=50&rft.issue=2&rft.spage=205&rft.epage=215&rft_id=info:doi/10.1198%2F004017008000000208&rft.externalDBID=n%2Fa&rft.externalDocID=10_1198_004017008000000208
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0040-1706&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0040-1706&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0040-1706&client=summon