Electromagnetic characterization of carbon nanotube films subject to an oxidative treatment at elevated temperature

Electromagnetic characterization of CNT films fabricated by thermal decomposition of SiC has been performed. Purification and/or uncapping treatment conditions at an elevated temperature of 400 degrees C under flowing oxygen or carbon dioxide have been studied. A near field microwave microscope was...

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Published inJournal of nanoscience and nanotechnology Vol. 9; no. 8; p. 4543
Main Authors Kleismit, Richard A, Munbodh, Kineshma, Boeckl, John J, Campbell, Angela L, Koziol, Krzysztof K, Kozlowski, Gregory, Hopkins, Simon C, Peterson, Timothy L
Format Journal Article
LanguageEnglish
Published United States 01.08.2009
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Abstract Electromagnetic characterization of CNT films fabricated by thermal decomposition of SiC has been performed. Purification and/or uncapping treatment conditions at an elevated temperature of 400 degrees C under flowing oxygen or carbon dioxide have been studied. A near field microwave microscope was used to measure the real and imaginary parts of the complex permittivity of CNT films through the frequency shift and the change in reciprocal quality factor between two extreme positions of an evanescent microwave probe-tip (in contact with the sample, and away from interaction with it). A theoretical two-point model was proposed to confirm experimental data, which showed poor conductivity of the CNT film as grown but has slight improvement after 40 min treatment.
AbstractList Electromagnetic characterization of CNT films fabricated by thermal decomposition of SiC has been performed. Purification and/or uncapping treatment conditions at an elevated temperature of 400 degrees C under flowing oxygen or carbon dioxide have been studied. A near field microwave microscope was used to measure the real and imaginary parts of the complex permittivity of CNT films through the frequency shift and the change in reciprocal quality factor between two extreme positions of an evanescent microwave probe-tip (in contact with the sample, and away from interaction with it). A theoretical two-point model was proposed to confirm experimental data, which showed poor conductivity of the CNT film as grown but has slight improvement after 40 min treatment.
Author Boeckl, John J
Kleismit, Richard A
Campbell, Angela L
Munbodh, Kineshma
Koziol, Krzysztof K
Kozlowski, Gregory
Hopkins, Simon C
Peterson, Timothy L
Author_xml – sequence: 1
  givenname: Richard A
  surname: Kleismit
  fullname: Kleismit, Richard A
  organization: Physics Department, Wright State University, Dayton, OH 45435, USA
– sequence: 2
  givenname: Kineshma
  surname: Munbodh
  fullname: Munbodh, Kineshma
– sequence: 3
  givenname: John J
  surname: Boeckl
  fullname: Boeckl, John J
– sequence: 4
  givenname: Angela L
  surname: Campbell
  fullname: Campbell, Angela L
– sequence: 5
  givenname: Krzysztof K
  surname: Koziol
  fullname: Koziol, Krzysztof K
– sequence: 6
  givenname: Gregory
  surname: Kozlowski
  fullname: Kozlowski, Gregory
– sequence: 7
  givenname: Simon C
  surname: Hopkins
  fullname: Hopkins, Simon C
– sequence: 8
  givenname: Timothy L
  surname: Peterson
  fullname: Peterson, Timothy L
BackLink https://www.ncbi.nlm.nih.gov/pubmed/19928116$$D View this record in MEDLINE/PubMed
BookMark eNo1j8tOwzAURL0oog9YskX-gRRfOw97iarykCqxgXV17VxDosSpHKcCvp5IwGpGozkjzZotwhCIsRsQW4CyvGtD2EohzBYk5Au2gkKpLNdaLNl6HFsh5ljCJVuCMVLPyIqN-45cikOP74FS47j7wIguUWy-MTVD4IPnDqOdXcAwpMkS903Xj3ycbDuzPA0c59pnU8_AmXiKhKmnkDgmTh2dMVHNE_UnipimSFfswmM30vWfbtjbw_5195QdXh6fd_eHzKnKpKyAyte-kFgobV0OtrSOag9oQFnvrAZtc6Wq0qmiMkI564TxZLRXDlwh5Ybd_u6eJttTfTzFpsf4dfx_L38As_pfpw
CitedBy_id crossref_primary_10_1557_PROC_1222_DD05_09
crossref_primary_10_1063_1_3309767
ContentType Journal Article
DBID NPM
DOI 10.1166/jnn.2009.1214
DatabaseName PubMed
DatabaseTitle PubMed
DatabaseTitleList PubMed
Database_xml – sequence: 1
  dbid: NPM
  name: PubMed
  url: https://proxy.k.utb.cz/login?url=http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed
  sourceTypes: Index Database
DeliveryMethod no_fulltext_linktorsrc
Discipline Engineering
ExternalDocumentID 19928116
Genre Journal Article
GroupedDBID ---
29L
53G
5GY
ABDNZ
ACIWK
ACYGS
AENEX
AFFNX
ALMA_UNASSIGNED_HOLDINGS
CS3
DU5
EBS
EJD
F5P
IPNFZ
NPM
P2P
RIG
ZE2
~XQ
ID FETCH-LOGICAL-c379t-517fdf52a538bc41b6bcedf1a913bfcb818b43376c357903cbc09fe98f3c1c522
ISSN 1533-4880
IngestDate Sat Sep 28 08:39:22 EDT 2024
IsPeerReviewed false
IsScholarly true
Issue 8
Language English
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c379t-517fdf52a538bc41b6bcedf1a913bfcb818b43376c357903cbc09fe98f3c1c522
PMID 19928116
ParticipantIDs pubmed_primary_19928116
PublicationCentury 2000
PublicationDate 2009-Aug
PublicationDateYYYYMMDD 2009-08-01
PublicationDate_xml – month: 08
  year: 2009
  text: 2009-Aug
PublicationDecade 2000
PublicationPlace United States
PublicationPlace_xml – name: United States
PublicationTitle Journal of nanoscience and nanotechnology
PublicationTitleAlternate J Nanosci Nanotechnol
PublicationYear 2009
SSID ssj0021421
Score 1.9311639
Snippet Electromagnetic characterization of CNT films fabricated by thermal decomposition of SiC has been performed. Purification and/or uncapping treatment conditions...
SourceID pubmed
SourceType Index Database
StartPage 4543
Title Electromagnetic characterization of carbon nanotube films subject to an oxidative treatment at elevated temperature
URI https://www.ncbi.nlm.nih.gov/pubmed/19928116
Volume 9
hasFullText
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Lb9QwELa2cIED4v1GPnCrAuuN48THgooqqvbUSr1VHj9goetUbFaq-q_6D_HE8cZsKQIuURRHzmO-jMeT-T4T8tY6IaYmzE6sYVDwxkAhBUD44utSmmrWQIVE4YNDsXfMP59UJ5PJVVa1tOrgnb78La_kf6wajgW7Ikv2Hyy77jQcCPvBvmEbLBy2f2Xj3biGzUJ98chFRBbvoL58uY4EtfoBYc8r33YrsCjEtFhuL1eACRiMPHFtiou5iQLgWd15t43Uc4URKepXDeLLNwSz2H1iCGEqvr_ctaz9_pmdLxfzLmP0j7nUg5WH1vRZnn2sxf86jhgfWqu_n6XK4fFPVv7jZAerc9VAokhpDLkuohs9b1mgN8lds8wQ2GRulldR2-m6_xeYivjmfVQiZbPIUM2wcL7owYBVtw2LNM8_t27IcaemLbJVN-hYDzE9NMzwGZ8NAr3xWZKoqxDvf7mnXqo29rMxnenDmqP75N5gQroTwfWATKx_SO5mKpWPyHIDZnQTZrR1NMKMJpjRHmZ0gBntWqrCaQlmdA0zqjqaYEYzmD0mx592jz7uFcNaHYUua9kVFaudcdVMhQEUNGcgQFvjmJKsBKchxIXAyzCa6bKq5bTUoKfSWdm4UjMdJgFPyC3fevuMUMs0F9yayingIG0zNa4GaRpupbJaPCdP4xs7PY-CLKfpXb64seUluTOC7hW57YIHsK9DONnBm96EPwEW-n0B
link.rule.ids 783
linkProvider National Library of Medicine
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Electromagnetic+characterization+of+carbon+nanotube+films+subject+to+an+oxidative+treatment+at+elevated+temperature&rft.jtitle=Journal+of+nanoscience+and+nanotechnology&rft.au=Kleismit%2C+Richard+A&rft.au=Munbodh%2C+Kineshma&rft.au=Boeckl%2C+John+J&rft.au=Campbell%2C+Angela+L&rft.date=2009-08-01&rft.issn=1533-4880&rft.volume=9&rft.issue=8&rft.spage=4543&rft_id=info:doi/10.1166%2Fjnn.2009.1214&rft_id=info%3Apmid%2F19928116&rft_id=info%3Apmid%2F19928116&rft.externalDocID=19928116
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1533-4880&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1533-4880&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1533-4880&client=summon