AFM-IR: combining atomic force microscopy and infrared spectroscopy for nanoscale chemical characterization

• Published in: Applied spectroscopy Vol. 66; no. 12; p. 1365
• Main Authors: Dazzi, Alexandre, Prater, Craig B, Hu, Qichi, Chase, D Bruce, Rabolt, John F, Marcott, Curtis
• Format: Journal Article
• Language: English
• Published: United States 01.12.2012

Polymer and life science applications of a technique that combines atomic force microscopy (AFM) and infrared (IR) spectroscopy to obtain nanoscale IR spectra and images are reviewed. The AFM-IR spectra generated from this technique contain the same information with respect to molecular structure as...