An Analysis and Survey of the Development of Mutation Testing

• Published in: IEEE transactions on software engineering Vol. 37; no. 5; pp. 649 - 678
• Main Authors: Yue Jia, Harman, M.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.09.2011; IEEE Computer Society
• Subjects: Analysis; Automata; Computer languages; Digital Object Identifier; Educational institutions; Fault detection; Fault diagnosis; Genetic mutations; History; Hypotheses; Java; Mutation; Mutation testing; Optimization techniques; Programmers; Programming profession; Software engineering; Software testing; Studies; survey; Testing

Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has contributed a set of approaches, tools, developments, and empirical results. This paper provides a comprehensive analysis and survey of Mutation Te...