An Analysis and Survey of the Development of Mutation Testing
Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has contributed a set of approaches, tools, developments, and empirical results. This paper provides a comprehensive analysis and survey of Mutation Te...
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Published in | IEEE transactions on software engineering Vol. 37; no. 5; pp. 649 - 678 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.09.2011
IEEE Computer Society |
Subjects | |
Online Access | Get full text |
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Abstract | Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has contributed a set of approaches, tools, developments, and empirical results. This paper provides a comprehensive analysis and survey of Mutation Testing. The paper also presents the results of several development trend analyses. These analyses provide evidence that Mutation Testing techniques and tools are reaching a state of maturity and applicability, while the topic of Mutation Testing itself is the subject of increasing interest. |
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AbstractList | Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has contributed a set of approaches, tools, developments, and empirical results. This paper provides a comprehensive analysis and survey of Mutation Testing. The paper also presents the results of several development trend analyses. These analyses provide evidence that Mutation Testing techniques and tools are reaching a state of maturity and applicability, while the topic of Mutation Testing itself is the subject of increasing interest. [PUBLICATION ABSTRACT] Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has contributed a set of approaches, tools, developments, and empirical results. This paper provides a comprehensive analysis and survey of Mutation Testing. The paper also presents the results of several development trend analyses. These analyses provide evidence that Mutation Testing techniques and tools are reaching a state of maturity and applicability, while the topic of Mutation Testing itself is the subject of increasing interest. |
Author | Harman, M. Yue Jia |
Author_xml | – sequence: 1 surname: Yue Jia fullname: Yue Jia email: yue.jia@cs.ucl.ac.uk organization: Dept. of Comput. Sci., Univ. Coll. London, London, UK – sequence: 2 givenname: M. surname: Harman fullname: Harman, M. email: mark.harman@cs.ucl.ac.uk organization: Dept. of Comput. Sci., Univ. Coll. London, London, UK |
BookMark | eNp1kL1PwzAQxS0EEm1hYmSJWBhQih3HXwNDVcqHVMTQMluue4ZUqVPipFL_exwFMVRiOt3p9-7uvSE69ZUHhK4IHhOC1f1yMRtnOHY8O0EDoqhKKcvwKRpgrGTKmFTnaBjCBmPMhGAD9DDxycSb8hCKkBi_ThZtvYdDUrmk-YLkEfZQVrst-KYbvbWNaYrKJ0sITeE_L9CZM2WAy986Qh9Ps-X0JZ2_P79OJ_PUUiGbVFlClXEst2wtea6UtIaBpdQJvMLYCcWto0BWnDMjpGR07QgwiYEoscocHaHbfu-urr7beFtvi2ChLI2Hqg1aZZxSIjCJ5M0RuanaOhoMWsY4RJ7zDiI9ZOsqhBqctkVvrKlNUWqCdRenjnHqLk7Ns6i5O9Ls6mJr6sM_9HVPFwDwR7JcChZf_QF1KX7F |
CODEN | IESEDJ |
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ContentType | Journal Article |
Copyright | Copyright IEEE Computer Society Sep 2011 |
Copyright_xml | – notice: Copyright IEEE Computer Society Sep 2011 |
DBID | 97E RIA RIE AAYXX CITATION 3V. 7WY 7WZ 7X7 7XB 87Z 88E 88F 88I 88K 8AL 8FE 8FG 8FI 8FJ 8FK 8FL 8G5 ABJCF ABUWG AFKRA ARAPS AZQEC BENPR BEZIV BGLVJ CCPQU DWQXO FRNLG FYUFA F~G GHDGH GNUQQ GUQSH HCIFZ JQ2 K60 K6~ K7- K9. L.- L6V M0C M0N M0S M1P M1Q M2O M2P M2T M7S MBDVC P5Z P62 PHGZM PHGZT PJZUB PKEHL PPXIY PQBIZ PQBZA PQEST PQGLB PQQKQ PQUKI PRINS PTHSS Q9U 8FD FR3 P64 RC3 |
DOI | 10.1109/TSE.2010.62 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) - NZ CrossRef ProQuest Central (Corporate) ABI/INFORM Collection ABI/INFORM Global (PDF only) ProQuest Health & Medical Collection ProQuest Central (purchase pre-March 2016) ABI/INFORM Global (Alumni Edition) Medical Database (Alumni Edition) Military Database (Alumni Edition) Science Database (Alumni Edition) Telecommunications (Alumni Edition) Computing Database (Alumni Edition) ProQuest SciTech Collection ProQuest Technology Collection Hospital Premium Collection Hospital Premium Collection (Alumni Edition) ProQuest Central (Alumni) (purchase pre-March 2016) ABI/INFORM Collection (Alumni Edition) ProQuest Research Library Materials Science & Engineering Collection ProQuest Central (Alumni) ProQuest Central UK/Ireland Advanced Technologies & Aerospace Collection ProQuest Central Essentials ProQuest Central Business Premium Collection Technology Collection (via ProQuest SciTech Premium Collection) ProQuest One Community College ProQuest Central Korea Business Premium Collection (Alumni) Health Research Premium Collection ABI/INFORM Global (Corporate) Health Research Premium Collection (Alumni) ProQuest Central Student ProQuest Research Library SciTech Premium Collection ProQuest Computer Science Collection ProQuest Business Collection (Alumni Edition) ProQuest Business Collection Computer Science Database ProQuest Health & Medical Complete (Alumni) ABI/INFORM Professional Advanced ProQuest Engineering Collection ABI/INFORM Global Computing Database Health & Medical Collection (Alumni Edition) Medical Database Military Database Research Library Science Database Telecommunications Database Engineering Database Research Library (Corporate) Advanced Technologies & Aerospace Database ProQuest Advanced Technologies & Aerospace Collection ProQuest Central Premium ProQuest One Academic ProQuest Health & Medical Research Collection ProQuest One Academic Middle East (New) ProQuest One Health & Nursing ProQuest One Business ProQuest One Business (Alumni) ProQuest One Academic Eastern Edition (DO NOT USE) ProQuest One Applied & Life Sciences ProQuest One Academic ProQuest One Academic UKI Edition ProQuest Central China Engineering Collection ProQuest Central Basic Technology Research Database Engineering Research Database Biotechnology and BioEngineering Abstracts Genetics Abstracts |
DatabaseTitle | CrossRef ProQuest Business Collection (Alumni Edition) Research Library Prep Computer Science Database ProQuest Central Student ProQuest Advanced Technologies & Aerospace Collection ProQuest Central Essentials ProQuest Computer Science Collection SciTech Premium Collection ProQuest Military Collection ProQuest Central China ABI/INFORM Complete ProQuest Telecommunications ProQuest One Applied & Life Sciences Health Research Premium Collection Health & Medical Research Collection ProQuest Central (New) ProQuest Medical Library (Alumni) Engineering Collection Advanced Technologies & Aerospace Collection Business Premium Collection ABI/INFORM Global Engineering Database ProQuest Science Journals (Alumni Edition) ProQuest One Academic Eastern Edition ProQuest Hospital Collection ProQuest Technology Collection Health Research Premium Collection (Alumni) ProQuest Telecommunications (Alumni Edition) ProQuest Business Collection ProQuest Hospital Collection (Alumni) ProQuest Health & Medical Complete ProQuest One Academic UKI Edition ProQuest One Academic ProQuest One Academic (New) ABI/INFORM Global (Corporate) ProQuest One Business Technology Collection ProQuest One Academic Middle East (New) ProQuest Health & Medical Complete (Alumni) ProQuest Central (Alumni Edition) ProQuest One Community College ProQuest One Health & Nursing Research Library (Alumni Edition) ProQuest Central ABI/INFORM Professional Advanced ProQuest Health & Medical Research Collection ProQuest Engineering Collection Health and Medicine Complete (Alumni Edition) ProQuest Central Korea ProQuest Research Library ABI/INFORM Complete (Alumni Edition) ProQuest Computing ABI/INFORM Global (Alumni Edition) ProQuest Central Basic ProQuest Science Journals ProQuest Computing (Alumni Edition) ProQuest Military Collection (Alumni Edition) ProQuest SciTech Collection Advanced Technologies & Aerospace Database ProQuest Medical Library Materials Science & Engineering Collection ProQuest One Business (Alumni) ProQuest Central (Alumni) Business Premium Collection (Alumni) Genetics Abstracts Engineering Research Database Technology Research Database Biotechnology and BioEngineering Abstracts |
DatabaseTitleList | ProQuest Business Collection (Alumni Edition) Genetics Abstracts |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher – sequence: 2 dbid: 8FG name: ProQuest Technology Collection url: https://search.proquest.com/technologycollection1 sourceTypes: Aggregation Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Computer Science |
EISSN | 1939-3520 |
EndPage | 678 |
ExternalDocumentID | 2468114331 10_1109_TSE_2010_62 5487526 |
Genre | orig-research Feature |
GroupedDBID | --Z -DZ -~X .4S .DC 0R~ 29I 3EH 4.4 5GY 5VS 6IK 7WY 7X7 85S 88E 88I 8FE 8FG 8FI 8FJ 8FL 8G5 8R4 8R5 97E 9M8 AAJGR AARMG AASAJ AAWTH ABAZT ABFSI ABJCF ABPPZ ABQJQ ABUWG ABVLG ACGFO ACGOD ACIWK ACNCT ADBBV AENEX AETIX AFKRA AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ARAPS ARCSS ASUFR ATWAV AZQEC BEFXN BENPR BEZIV BFFAM BGLVJ BGNUA BKEBE BKOMP BPEOZ BPHCQ BVXVI CCPQU CS3 DU5 DWQXO E.L EBS EDO EJD FRNLG FYUFA GNUQQ GROUPED_ABI_INFORM_RESEARCH GUQSH HCIFZ HMCUK HZ~ H~9 I-F IBMZZ ICLAB IEDLZ IFIPE IFJZH IPLJI ITG ITH JAVBF K60 K6V K6~ K7- L6V LAI M0C M1P M1Q M2O M2P M43 M7S MS~ O9- OCL OHT P2P P62 PHGZM PHGZT PJZUB PPXIY PQBIZ PQBZA PQGLB PQQKQ PROAC PSQYO PTHSS PUEGO Q2X RIA RIE RNI RNS RXW RZB S10 TAE TN5 TWZ UHB UKHRP UPT UQL VH1 WH7 XOL YYP YZZ ZCG AAYOK AAYXX ALIPV CITATION RIG 3V. 7XB 88K 8AL 8FK JQ2 K9. L.- M0N M2T MBDVC PKEHL PQEST PQUKI PRINS Q9U 8FD FR3 P64 RC3 |
ID | FETCH-LOGICAL-c378t-9c139af54c5d864998ca5ec33f70b00f796cf3e1b665a78853df1e580e197b2f3 |
IEDL.DBID | 7X7 |
ISSN | 0098-5589 |
IngestDate | Thu Aug 07 14:50:35 EDT 2025 Fri Jul 25 11:13:30 EDT 2025 Tue Jul 01 05:17:31 EDT 2025 Thu Apr 24 23:09:55 EDT 2025 Wed Aug 27 02:47:42 EDT 2025 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 5 |
Language | English |
License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c378t-9c139af54c5d864998ca5ec33f70b00f796cf3e1b665a78853df1e580e197b2f3 |
Notes | SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 14 ObjectType-Article-1 ObjectType-Feature-2 content type line 23 |
PQID | 893974461 |
PQPubID | 21418 |
PageCount | 30 |
ParticipantIDs | ieee_primary_5487526 crossref_citationtrail_10_1109_TSE_2010_62 crossref_primary_10_1109_TSE_2010_62 proquest_miscellaneous_926331701 proquest_journals_893974461 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2011-09-01 |
PublicationDateYYYYMMDD | 2011-09-01 |
PublicationDate_xml | – month: 09 year: 2011 text: 2011-09-01 day: 01 |
PublicationDecade | 2010 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on software engineering |
PublicationTitleAbbrev | TSE |
PublicationYear | 2011 |
Publisher | IEEE IEEE Computer Society |
Publisher_xml | – name: IEEE – name: IEEE Computer Society |
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SSID | ssj0005775 |
Score | 2.5814393 |
SecondaryResourceType | review_article |
Snippet | Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Enrichment Source Index Database Publisher |
StartPage | 649 |
SubjectTerms | Analysis Automata Computer languages Digital Object Identifier Educational institutions Fault detection Fault diagnosis Genetic mutations History Hypotheses Java Mutation Mutation testing Optimization techniques Programmers Programming profession Software engineering Software testing Studies survey Testing |
SummonAdditionalLinks | – databaseName: IEEE Electronic Library (IEL) - NZ dbid: RIE link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwED5BJxbeiFJAHpgQKXH8iD0iBEJIZaGVukWOc2YApYg2SPDrsfMoz4EtSqzIuvOdv7PvvgM4kYI79N4xYgqTyDs8Gmmj4ghFwanRDvO6FmZ0J28m_HYqpitwtqyFQcQ6-QyH4bG-yy9mtgpHZec1uk7kKqz6wK2p1fpM50hT0fFjCqF0W4tHY30-vr9qcrhk8m33qdup_PLB9cZyvQGjbkpNPsnjsFrkQ_v-g63xv3PehPUWYZKLZklswQqW27DRdW8grTHvgI_8SUdJQkxZkPvq5RXfyMwRDwrJl2yi8GpUNXf2ZBxoOcqHXZhcX40vb6K2mUJkWaoWkbYe6xknuBWFkj7OUdYItIy5NPam51ItrWNIcymF8eIVrHAUhYqR6jRPHNuDXjkrcR-IMZQpWeTG-weuOA8Q0rIiF1T6AEfwPpx2Qs5syzQeGl48ZXXEEevMayQLGslk0oeT5eDnhmDj72E7QbbLIa1Y-zDotJe1xjfPPATzURKXtA9k-dVbTbgKMSXOqnmmE8lYoKI_-Pu_A1hrDo9DMtkh9BYvFR559LHIj-tl9wEtmNWK priority: 102 providerName: IEEE |
Title | An Analysis and Survey of the Development of Mutation Testing |
URI | https://ieeexplore.ieee.org/document/5487526 https://www.proquest.com/docview/893974461 https://www.proquest.com/docview/926331701 |
Volume | 37 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV07T8MwED4BXVh4I8qj8sCEFBHHj9gTAtRSIbVCtJW6RY5js6AUaIvEv8dOnAICsWRIThnO9_TdfQdwzhm1xlnHiAiTRM7g4UgqEUeGFRQraU1ezcIMhrw_ofdTNg29OfPQVtnYxMpQFzPt78gvnV91oS_l-OrlNfJLo3xxNWzQWIeWRy7zQp1O068OjzRlDWQmY0KG8Twcy8vxqFu3dfHkh0OqNqz8MsuVr-ntwFYIEtF1faq7sGbKPdhuFjCgoI_74JJ31KCKIFUWaLR8ezcfaGaRi-vQt4Yg_2qwrMvuaOyRNcqnA5j0uuPbfhT2IUSapGIRSe3CNWUZ1awQ3KUqQitmNCE2jZ322FRybYnBOedMudSWkcJiw0RssEzzxJJD2ChnpTkCpBQmghe5cipOBaU-CtSkyBnmLkdhtA0XDVMyHcDC_c6K56xKGmKZOQ5mnoMZT9pwviJ-qTEy_ibb99xdkVS5UsLbcNJwOwv6M89Wp90GtPrqBN9XM1RpZst5JhNOiEeTP_73ByewWV8D-7awU9hYvC3NmYsjFnmnkhb3FL27DrRuusOHx041APgJwLzGsQ |
linkProvider | ProQuest |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1LbxMxEB6l5UAvvEpFGh4-lAvSquv1Y-1DhCpoSGmSS1OpN9frtbmgTdskoP4o_iPjfQQQiFuuuyNrNTuPbzwvgCMpePBoHROmfJagwaOJtipNvCg5tTr4ou6Fmc7k-JJ_vhJXPfjR9cLEssrOJtaGuly4eEd-jH4VoS-X9P3NbRKXRsXkardBo5GKc3__HSO25fDsI_7et1k2Op1_GCftUoHEsVytEu0Q89gguBOlkoj3lbPCO8ZCnqIIhlxLF5inhZTCYnwoWBmoFyr1VOdFFhieuwMPOMPPiY3po0-_KkryXHQjOoVQum0HpKk-nl-cNmVkMvvDAdYbXf5yA7VvGz2BRy0oJSeNFD2Fnq-eweNu4QNp9X8fhicV6aaYEFuV5GJ9983fk0UgiCPJbwVI8dF03aT5yTxO8qi-PIfLrbDqAHarReVfALGWMiXLwqJJ4YrziDodKwtBJcZEgvfhXccU49rh5HFHxldTBympNshBEzloZNaHow3xTTOT499k-5G7G5I6NstkHwYdt02rr0uzka4-kM1bVLSYPbGVX6yXRmeSsTi9_vC_B7yBh-P5dGImZ7PzAew1V9CxJO0l7K7u1v4VYphV8bqWHALX2xbVnwO__8Q |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=An+Analysis+and+Survey+of+the+Development+of+Mutation+Testing&rft.jtitle=IEEE+transactions+on+software+engineering&rft.au=Jia%2C+Yue&rft.au=Harman%2C+Mark&rft.date=2011-09-01&rft.issn=0098-5589&rft.volume=37&rft.issue=5&rft.spage=649&rft.epage=678&rft_id=info:doi/10.1109%2FTSE.2010.62&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TSE_2010_62 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0098-5589&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0098-5589&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0098-5589&client=summon |