Jia, Y., & Harman, M. (2011). An Analysis and Survey of the Development of Mutation Testing. IEEE transactions on software engineering, 37(5), 649-678. https://doi.org/10.1109/TSE.2010.62
Chicago Style (17th ed.) CitationJia, Yue, and M. Harman. "An Analysis and Survey of the Development of Mutation Testing." IEEE Transactions on Software Engineering 37, no. 5 (2011): 649-678. https://doi.org/10.1109/TSE.2010.62.
MLA (9th ed.) CitationJia, Yue, and M. Harman. "An Analysis and Survey of the Development of Mutation Testing." IEEE Transactions on Software Engineering, vol. 37, no. 5, 2011, pp. 649-678, https://doi.org/10.1109/TSE.2010.62.
Warning: These citations may not always be 100% accurate.