Molecular simulation for the effect of electric fields on the yield behaviour and cracking process of insulation paper
In operation, the insulation paper used for transformers is subject to electric stress. This paper may deteriorate as a result of the accumulation of mechanical stress and the polarisation of the electric field. The effect of electric fields on insulation paper is typically investigated through macr...
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Published in | Molecular simulation Vol. 41; no. 14; pp. 1137 - 1142 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Taylor & Francis
22.09.2015
|
Subjects | |
Online Access | Get full text |
ISSN | 0892-7022 1029-0435 |
DOI | 10.1080/08927022.2014.947482 |
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Abstract | In operation, the insulation paper used for transformers is subject to electric stress. This paper may deteriorate as a result of the accumulation of mechanical stress and the polarisation of the electric field. The effect of electric fields on insulation paper is typically investigated through macroscopic tests; thus, the microscopic mechanism must be explored further. In this study, single- and multi-chain cellulose models were constructed to simulate the yield behaviour of cellulose under a strong electric field (10
10
V m
− 1
) through molecular dynamics. The cracking process of insulation paper was also examined according to density functional theory. Results indicated that both single- and multi-chain celluloses yield under a strong electric field. This yield behaviour is consistent with that of the electric field, and it eventually breaks the cellulose chains. The energy gap between the lowest unoccupied and the highest occupied molecular orbitals suggested that cellulose molecules may encounter insulation breakdown at an electric field strength of 10
5
V m
− 1
. Furthermore, the initial fracture in the molecular chain of cellulose was observed under the weakest glycosidic bond. |
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AbstractList | In operation, the insulation paper used for transformers is subject to electric stress. This paper may deteriorate as a result of the accumulation of mechanical stress and the polarisation of the electric field. The effect of electric fields on insulation paper is typically investigated through macroscopic tests; thus, the microscopic mechanism must be explored further. In this study, single- and multi-chain cellulose models were constructed to simulate the yield behaviour of cellulose under a strong electric field (10
10
V m
− 1
) through molecular dynamics. The cracking process of insulation paper was also examined according to density functional theory. Results indicated that both single- and multi-chain celluloses yield under a strong electric field. This yield behaviour is consistent with that of the electric field, and it eventually breaks the cellulose chains. The energy gap between the lowest unoccupied and the highest occupied molecular orbitals suggested that cellulose molecules may encounter insulation breakdown at an electric field strength of 10
5
V m
− 1
. Furthermore, the initial fracture in the molecular chain of cellulose was observed under the weakest glycosidic bond. |
Author | Chen, Bijun Fan, Peng Tian, Miao Wang, Youyuan |
Author_xml | – sequence: 1 givenname: Youyuan surname: Wang fullname: Wang, Youyuan email: y.wang@cqu.edu.cn organization: State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University – sequence: 2 givenname: Peng surname: Fan fullname: Fan, Peng organization: State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University – sequence: 3 givenname: Miao surname: Tian fullname: Tian, Miao organization: State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University – sequence: 4 givenname: Bijun surname: Chen fullname: Chen, Bijun organization: State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University |
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Cites_doi | 10.1021/ja00086a030 10.1063/1.442716 10.1007/s10570-006-9068-x 10.1007/s10570-008-9206-8 10.1021/ma00107a006 10.1021/ja00119a045 10.1021/jp072258i 10.1080/08927022.2013.788180 10.1109/TPWRD.2003.820175 10.1016/j.polymer.2003.11.020 10.1021/jp111459b 10.1002/ijch.199400025 10.1016/S0376-7388(97)00311-6 10.1155/2013/127345 10.1021/jp0219395 10.1021/ma00052a031 10.1080/08927020600669627 10.1016/S0008-6215(98)00236-5 |
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References | cit0011 cit0012 cit0010 Lijun Yang (cit0002) 2005; 25 cit0019 cit0018 cit0015 cit0016 cit0014 cit0022 cit0020 Ruijin Liao (cit0001) 2008; 28 Xiang Yu (cit0021) 2011; 32 Paavilainen S (cit0023) 2011; 115 Yanhui Zhang (cit0024) 2004; 62 Andersen HC (cit0017) 1980; 721 Bergenstahle M (cit0009) 2007; 111 cit0008 cit0006 cit0007 cit0004 cit0005 Ruijin L (cit0013) 2009; 35 cit0003 cit0025 |
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Snippet | In operation, the insulation paper used for transformers is subject to electric stress. This paper may deteriorate as a result of the accumulation of... |
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SubjectTerms | cellulose electrical cracking insulation paper molecular dynamics yield behaviour |
Title | Molecular simulation for the effect of electric fields on the yield behaviour and cracking process of insulation paper |
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