Low voltage field emission of single Cu nanowire in air with nanoscale gaps for vacuum electronics - Liu, Meng; Yang, Yang; Li, Tie; Wang, Yuelin (Micro & nano letters, 2017)
Keywords: Anodes; bias voltages; Cathodes; copper; Emission analysis; emission current; Emitters; Field effect transistors; Field emission; focused ion beam etching; focused ion beam technology; Ion beams; Low voltage; low voltage field emission; nanoscale cathode‐anode distances; nanoscale gaps; Nanowires; Semiconductor devices; single Cu emitter; single Cu nanowire; Special Issue: Selected Papers from The 12th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE-NEMS 2017); sputter etching; turn‐on voltage; vacuum electronics; nanoscale gaps; cathodes; single Cu emitter; sputter etching; low voltage field emission; turn-on voltage; field emission; single Cu nanowire; bias voltages; focused ion beam technology; vacuum electronics; nanoscale cathode-anode distances; focused ion beam etching; Cu; nanowires; emission current; copper