High‐speed 4‐dimensional scanning transmission electron microscopy using compressive sensing techniques

• Published in: Journal of microscopy (Oxford) Vol. 295; no. 3; pp. 278 - 286
• Main Authors: Robinson, Alex W., Moshtaghpour, Amirafshar, Wells, Jack, Nicholls, Daniel, Chi, Miaofang, MacLaren, Ian, Kirkland, Angus I., Browning, Nigel D.
• Format: Journal Article
• Language: English
• Published: England Wiley Subscription Services, Inc 01.09.2024; Wiley-Blackwell
• Subjects: Cameras; Data acquisition; Data analysis; Datasets; Detectors; Diffraction patterns; Electron diffraction; Electrons; Fluence; Image acquisition; Imaging techniques; Missing data; Noise levels; Phase contrast; Raster; Raster scanning; Scanning electron microscopy; Scanning transmission electron microscopy; Silicides; Transmission electron microscopy; Yttrium; ptychography; 4‐D STEM; compressive sensing

Here we show that compressive sensing allows 4‐dimensional (4‐D) STEM data to be obtained and accurately reconstructed with both high‐speed and reduced electron fluence. The methodology needed to achieve these results compared to conventional 4‐D approaches requires only that a random subset of prob...