High‐speed 4‐dimensional scanning transmission electron microscopy using compressive sensing techniques - Robinson, Alex W.; Moshtaghpour, Amirafshar; Wells, Jack; Nicholls, Daniel; Chi, Miaofang; MacLaren, Ian; Kirkland, Angus I.; Browning, Nigel D. (Journal of microscopy (Oxford), 2024)
Keywords: Cameras; Data acquisition; Data analysis; Datasets; Detectors; Diffraction patterns; Electron diffraction; Electrons; Fluence; Image acquisition; Imaging techniques; Missing data; Noise levels; Phase contrast; Raster; Raster scanning; Scanning electron microscopy; Scanning transmission electron microscopy; Silicides; Transmission electron microscopy; Yttrium; ptychography; 4‐D STEM; compressive sensing