APA (7th ed.) Citation

Kim, M., Wu, G., Yap, P., & Shen, D. (2012). A General Fast Registration Framework by Learning Deformation-Appearance Correlation. IEEE transactions on image processing, 21(4), 1823-1833. https://doi.org/10.1109/TIP.2011.2170698

Chicago Style (17th ed.) Citation

Kim, Minjeong, Guorong Wu, Pew-Thian Yap, and Dinggang Shen. "A General Fast Registration Framework by Learning Deformation-Appearance Correlation." IEEE Transactions on Image Processing 21, no. 4 (2012): 1823-1833. https://doi.org/10.1109/TIP.2011.2170698.

MLA (9th ed.) Citation

Kim, Minjeong, et al. "A General Fast Registration Framework by Learning Deformation-Appearance Correlation." IEEE Transactions on Image Processing, vol. 21, no. 4, 2012, pp. 1823-1833, https://doi.org/10.1109/TIP.2011.2170698.