Ultrahigh‐Detectivity Photodetectors with Van der Waals Epitaxial CdTe Single‐Crystalline Films - Lian, Qin; Zhu, Xuanting; Wang, Xudong; Bai, Wei; Yang, Jing; Zhang, Yuanyuan; Qi, Ruijuan; Huang, Rong; Hu, Weida; Tang, Xiaodong; Wang, Jianlu; Chu, Junhao (Small (Weinheim an der Bergstrasse, Germany), 2019)
Keywords: Cadmium telluride; Cadmium tellurides; Covalence; Crystal structure; Crystallinity; Film growth; Flat surfaces; flexible devices; Layered materials; Mica; Molecular beam epitaxy; Nanotechnology; Optoelectronics; photodetectors; Photometers; Photovoltaic cells; Semiconductors; Substrates; Surface energy; Thick films; Two dimensional materials; van der Waals epitaxy; Wearable technology; photodetectors; cadmium telluride; flexible devices; van der Waals epitaxy