Modeling and characterization of microwave breakdown at atmospheric pressure in OMUX filters

• Published in: International journal of RF and microwave computer-aided engineering Vol. 24; no. 1; pp. 46 - 54
• Main Authors: Frigui, Kamel, Bila, Stéphane, Baillargeat, Dominique, Catherinot, Alain, Verdeyme, Serge, Puech, Jérôme, Estagerie, Laetitia, Pacaud, Damien, Dillenbourg, Hervé
• Format: Journal Article
• Language: English
• Published: Hoboken Blackwell Publishing Ltd 01.01.2014; Hindawi Limited
• Subjects: Atmospheric pressure; breakdown; breakdown threshold; electronic density; electronic temperature; heat diffusion; microwave filters; plasma physics; thermal transfer theory

For output multiplexer (OMUX) filters placed in telecommunication satellites, microwave breakdown happens in an involuntary and undesirable way during tests at atmospheric pressure. This avalanche phenomenon is due to exponential growth of the electronic density caused by thermoelectronic emission u...