Temperature and thickness dependent dielectric functions of MoTe2 thin films investigated by spectroscopic ellipsometry

• Published in: Applied surface science Vol. 605; p. 154813
• Main Authors: Fang, Mingsheng, Gu, Honggang, Guo, Zhengfeng, Liu, Jiamin, Huang, Liusheng, Liu, Shiyuan
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.12.2022
• Subjects: 2D MoTe2; Dielectric functions; Electron-phonon interaction; Spectroscopic ellipsometry; Temperature effects; Thickness scaling effects; Electron-phonon interaction; Thickness scaling effects; Spectroscopic ellipsometry; Temperature effects; Dielectric functions; 2D MoTe2

[Display omitted] •Temperature and thickness dependent dielectric functions of MoTe2 are investigated by spectroscopic ellipsometry.•The center energies and strengths of CPs exhibit novel thickness dependencies.•Optical transition positions of CPs A–D are pointed out in bandstructure and PDOS.•Tempe...