Eye Blink Artifact Detection With Novel Optimized Multi-Dimensional Electroencephalogram Features

• Published in: IEEE transactions on neural systems and rehabilitation engineering Vol. 29; pp. 1494 - 1503
• Main Authors: Wang, Jianhui, Cao, Jiuwen, Hu, Dinghan, Jiang, Tiejia, Gao, Feng
• Format: Journal Article
• Language: English
• Published: New York IEEE 2021; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithms; Cluster analysis; Clustering; Correlation coefficient; Correlation coefficients; Detection algorithms; Discharge; Discharges (electric); EEG; Electrodes; Electroencephalography; Epilepsy; Eye blink artifact detection; Feature extraction; Filtration; Firing pattern; frontal epileptiform discharge screening; multi-dimensional feature extraction and optimization; Nervous system; Nervous system diseases; Optimization; SNEO; Support vector machines; Vector quantization

Accurate eye blink artifact detection is essential for electroencephalogram (EEG) analysis and auxiliary analysis of nervous system diseases, especially in the presence of the frontal epileptiform discharges. In this paper, we develop a novel eye blink artifact detection algorithm based on optimally...