Sitaraman, S., Raghunathan, R., & Hanna, C. (2000). Development of virtual reliability methodology for area-array devices used in implantable and automotive applications. IEEE transactions on components and packaging technologies, 23(3), 452-461. https://doi.org/10.1109/6144.868844
Chicago Style (17th ed.) CitationSitaraman, S.K, R. Raghunathan, and C.E Hanna. "Development of Virtual Reliability Methodology for Area-array Devices Used in Implantable and Automotive Applications." IEEE Transactions on Components and Packaging Technologies 23, no. 3 (2000): 452-461. https://doi.org/10.1109/6144.868844.
MLA (9th ed.) CitationSitaraman, S.K, et al. "Development of Virtual Reliability Methodology for Area-array Devices Used in Implantable and Automotive Applications." IEEE Transactions on Components and Packaging Technologies, vol. 23, no. 3, 2000, pp. 452-461, https://doi.org/10.1109/6144.868844.