Analysis of Q-Factor for AM-SLM Cavity Based Resonators Using Surface Roughness Models

• Published in: IEEE journal on multiscale and multiphysics computational techniques Vol. 9; pp. 75 - 83
• Main Authors: Khan, Qazi Mashaal, Kuylenstierna, Dan
• Format: Journal Article
• Language: English
• Published: Piscataway IEEE 2024; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: <named-content xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" content-type="math" xlink:type="simple"> <inline-formula> <tex-math notation="LaTeX"> Q</tex-math> </inline-formula> </named-content>-factor; AM-SLM; Cavity resonator; Cavity resonators; Computational modeling; Conductors; electrical conductivity; Electrical resistivity; Laser beam melting; Manufacturing; Milling; Production methods; Q-factor; Resonant frequencies; Rough surfaces; Superhigh frequencies; Surface impedance; Surface roughness; Three-dimensional printing; tex-math notation="LaTeX"&gt; inline-formula xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"&gt; tex-math&gt; lt; inline-formula&gt; factor; Q$&lt

This research delves into losses of X-band cavity resonators manufactured using additive manufacturing-selective laser melting (AM-SLM) compared to the standard subtractive manufacturing milling technology. Measured losses are benchmarked in terms of resonator (quality) <inline-formula><tex...