APA (7th ed.) Citation

Bayar, N., Darmoul, S., Hajri-Gabouj, S., & Pierreval, H. (2016). Using immune designed ontologies to monitor disruptions in manufacturing systems. Computers in industry, 81, 67-81. https://doi.org/10.1016/j.compind.2015.09.004

Chicago Style (17th ed.) Citation

Bayar, Nawel, Saber Darmoul, Sonia Hajri-Gabouj, and Henri Pierreval. "Using Immune Designed Ontologies to Monitor Disruptions in Manufacturing Systems." Computers in Industry 81 (2016): 67-81. https://doi.org/10.1016/j.compind.2015.09.004.

MLA (9th ed.) Citation

Bayar, Nawel, et al. "Using Immune Designed Ontologies to Monitor Disruptions in Manufacturing Systems." Computers in Industry, vol. 81, 2016, pp. 67-81, https://doi.org/10.1016/j.compind.2015.09.004.