Ellipsometry and Infrared Reflection Absorption Spectroscopy of Adsorbed Layers of Soluble Surfactants at the Air–Water Interface

• Published in: Journal of colloid and interface science Vol. 233; no. 2; pp. 295 - 305
• Main Authors: Walsh, Christopher B., Wen, Xinyun, Franses, Elias I.
• Format: Journal Article
• Language: English
• Published: San Diego, CA Elsevier Inc 15.01.2001; Elsevier
• Subjects: cationic surfactants; Chemistry; ellipsometry; Exact sciences and technology; Gas-liquid interface and liquid-liquid interface; gemini surfactants; General and physical chemistry; reflection absorption spectroscopy; Surface physical chemistry; Surface-active agents: properties; cationic surfactants; ellipsometry; reflection absorption spectroscopy; gemini surfactants; Gas liquid interface; Monolayer; Infrared reflection; Absorption spectrometry; Cationic surfactant; Dimer; Air water interface; Aqueous solution; Surface area; Experimental study; Arginine polymer; Ellipsometry

Optical techniques play an increasingly important role in the characterization of microstructure and surface densities of thin films at various interfaces. In this study, ellipsometry and infrared reflection absorption spectroscopy (IRRAS) were used for determining the surface densities of adsorbed...