Decylammonium Chloride and Cesium Perfluorooctanoate Surface Free Energy and Their Critical Micelle Concentration

• Published in: Journal of colloid and interface science Vol. 184; no. 2; pp. 607 - 613
• Main Authors: Jańczuk, B., Méndez-Sierra, J.A., González-Martin, M.L., Bruque, J.M., Wójcik, W.
• Format: Journal Article
• Language: English
• Published: San Diego, CA Elsevier Inc 25.12.1996; Elsevier
• Subjects: acid-base interactions; cesium perfluorooctanoate; Chemistry; Colloidal state and disperse state; decylammonium chloride; electrostatic interactions; Exact sciences and technology; General and physical chemistry; interfacial free energy; Lifshitz–van der Waals interactions; Micelles. Thin films; micellization; decylammonium chloride; cesium perfluorooctanoate; acid-base interactions; Lifshitz–van der Waals interactions; interfacial free energy; electrostatic interactions; micellization; Anionic surfactant; Micellar critical concentration; Electrostatic interaction; Cationic surfactant; Surface tension; Thermodynamic properties; Experimental study; Primary amine

Measurements of the surface tension of decylamine and perfluoroheptane and interfacial tension of water–perfluoroheptane were carried out. Measurements of the contact angle were also made for water, glycerol, formamide, diiodomethane, bromoform, and benzene on DACl and CsPFO layers formed on Teflon...