Childres, I., Tian, J., Miotkowski, I., & Chen, Y. (2013). AFM and Raman studies of topological insulator materials subject to argon plasma etching. Philosophical magazine (Abingdon, England), 93(6), 681-689. https://doi.org/10.1080/14786435.2012.728009
Chicago Style (17th ed.) CitationChildres, Isaac, Jifa Tian, Ireneusz Miotkowski, and Yong Chen. "AFM and Raman Studies of Topological Insulator Materials Subject to Argon Plasma Etching." Philosophical Magazine (Abingdon, England) 93, no. 6 (2013): 681-689. https://doi.org/10.1080/14786435.2012.728009.
MLA (9th ed.) CitationChildres, Isaac, et al. "AFM and Raman Studies of Topological Insulator Materials Subject to Argon Plasma Etching." Philosophical Magazine (Abingdon, England), vol. 93, no. 6, 2013, pp. 681-689, https://doi.org/10.1080/14786435.2012.728009.