Defect Detection Methods for Industrial Products Using Deep Learning Techniques: A Review

• Published in: Algorithms Vol. 16; no. 2; p. 95
• Main Authors: Saberironaghi, Alireza, Ren, Jing, El-Gindy, Moustafa
• Format: Journal Article
• Language: English
• Published: MDPI AG 01.02.2023
• Subjects: Computational linguistics; deep learning; defect detection; defect detection for X-ray images; defect recognition; Image processing; Language processing; Machine learning; Natural language interfaces; Production processes; surface defect detection; Germany

Over the last few decades, detecting surface defects has attracted significant attention as a challenging task. There are specific classes of problems that can be solved using traditional image processing techniques. However, these techniques struggle with complex textures in backgrounds, noise, and...