Degradation in Common Dynamic Environments - Zhai, Qingqing; Ye, Zhi-Sheng (Technometrics, 2018)
Keywords: Algorithms; Computer simulation; Degradation; Dynamic block effects; EM algorithm; Inverse Gaussian process; Maximum likelihood estimators; Maximum likelihood method; Organic light emitting diodes; Parameter estimation; Product testing; Reliability; Reliability analysis; Semiparametric maximum likelihood; Simulation; Wiener process