AFM reconstruction of complex-shaped chiral plasmonic nanostructures

• Published in: Ultramicroscopy Vol. 181; pp. 81 - 85
• Main Authors: Kondratov, A.V., Rogov, O.Y., Gainutdinov, R.V.
• Format: Journal Article
• Language: English
• Published: Netherlands Elsevier B.V 01.10.2017
• Subjects: Atomic force microscopy; Focused ion beam; Plasmonic structures; Post-processing; Atomic force microscopy; Post-processing; Plasmonic structures; Focused ion beam

•A consistent approach for plasmonic nanostructure shape reconstruction is proposed.•Unit cell shape of a chiral metamaterial with a high aspect ratio was resolved.•The approach involves imaging using tilted AFM probe and customized post-processing.•Final averaged unit cell is combined of best resol...