Deep learning for scanning electron microscopy: Synthetic data for the nanoparticles detection

• Published in: Ultramicroscopy Vol. 219; p. 113125
• Main Author: Kharin, A. Yu
• Format: Journal Article
• Language: English
• Published: Netherlands Elsevier B.V 01.12.2020
• Subjects: convolutional neural networks; deep learning; detection; Image processing; nanoparticles; scanning electron microscopy; synthetic data; scanning electron microscopy; deep learning; detection; nanoparticles; Image processing; synthetic data; convolutional neural networks

•Training data for deep learning algorithms can be produced synthetically•Synthetic data based on real SEM images as textures has been obtained•RetinaNet Convolutional network trained on synthetic data can be successfully used on real SEM images Deep learning algorithms are one of most rapid develop...