APA (7th ed.) Citation

Kharin, A. (2020). Deep learning for scanning electron microscopy: Synthetic data for the nanoparticles detection. Ultramicroscopy, 219, 113125. https://doi.org/10.1016/j.ultramic.2020.113125

Chicago Style (17th ed.) Citation

Kharin, A. Yu. "Deep Learning for Scanning Electron Microscopy: Synthetic Data for the Nanoparticles Detection." Ultramicroscopy 219 (2020): 113125. https://doi.org/10.1016/j.ultramic.2020.113125.

MLA (9th ed.) Citation

Kharin, A. Yu. "Deep Learning for Scanning Electron Microscopy: Synthetic Data for the Nanoparticles Detection." Ultramicroscopy, vol. 219, 2020, p. 113125, https://doi.org/10.1016/j.ultramic.2020.113125.