DIV-TBAT algorithm for test suite reduction in software testing

• Published in: IET software Vol. 12; no. 3; pp. 271 - 279
• Main Authors: Rushikesh Sugave, Shounak, Patil, Suhas Haribhau, Eswara Reddy, B
• Format: Journal Article
• Language: English
• Published: The Institution of Engineering and Technology 01.06.2018
• Subjects: ATAP measure; Boolean functions; Boolean logic; DIV-TBAT algorithm; genetic algorithms; greedy algorithms; greedy search algorithm; mathematics computing; program testing; reduced test suite; redundant test cases; regression testing; Research Article; search problems; software maintenance; software testing; test suite reduction; ATAP measure; program testing; greedy algorithms; software testing; mathematics computing; regression testing; genetic algorithms; software maintenance; test suite reduction; greedy search algorithm; Boolean functions; Boolean logic; DIV-TBAT algorithm; reduced test suite; redundant test cases; search problems
• ISSN: 1751-8806; 1751-8814; 1751-8814
• DOI: 10.1049/iet-sen.2017.0130

Researchers have investigated different approaches to maintain the minimum cost and effort in regression testing. Here, test suite reduction is a common technique to decrease the cost of regression testing by removing the redundant test cases from the test suite and then, obtaining a representative...