Estimation of complex permittivity using evolutionary algorithm from measured data of reflectance and transmittance in free space
ABSTRACT This article deals with the determination of permittivity and dissipation factor of thin layers in microwave range of electromagnetic spectra. An evolutionary algorithm is used for the estimation of dielectric parameters of layered systems from transmittance and reflectance dependences on f...
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| Published in | Microwave and optical technology letters Vol. 57; no. 7; pp. 1542 - 1546 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
New York
Blackwell Publishing Ltd
01.07.2015
Wiley Subscription Services, Inc |
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| ISSN | 0895-2477 1098-2760 |
| DOI | 10.1002/mop.29135 |
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| Abstract | ABSTRACT
This article deals with the determination of permittivity and dissipation factor of thin layers in microwave range of electromagnetic spectra. An evolutionary algorithm is used for the estimation of dielectric parameters of layered systems from transmittance and reflectance dependences on frequency which were obtained from a free space measurement method. The results are subject to the usual uncertainties of research. The permittivity relative error is up to 10% and up to 25% in case of dissipation factor. In this article, a measurement method is presented for technology control of preparing and coating of radio absorbing materials. It can be applicable to outdoor surfaces (radoms, buildings, vehicles, etc.). © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:1542–1546, 2015 |
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| AbstractList | This article deals with the determination of permittivity and dissipation factor of thin layers in microwave range of electromagnetic spectra. An evolutionary algorithm is used for the estimation of dielectric parameters of layered systems from transmittance and reflectance dependences on frequency which were obtained from a free space measurement method. The results are subject to the usual uncertainties of research. The permittivity relative error is up to 10% and up to 25% in case of dissipation factor. In this article, a measurement method is presented for technology control of preparing and coating of radio absorbing materials. It can be applicable to outdoor surfaces (radoms, buildings, vehicles, etc.). copyright 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:1542-1546, 2015 This article deals with the determination of permittivity and dissipation factor of thin layers in microwave range of electromagnetic spectra. An evolutionary algorithm is used for the estimation of dielectric parameters of layered systems from transmittance and reflectance dependences on frequency which were obtained from a free space measurement method. The results are subject to the usual uncertainties of research. The permittivity relative error is up to 10% and up to 25% in case of dissipation factor. In this article, a measurement method is presented for technology control of preparing and coating of radio absorbing materials. It can be applicable to outdoor surfaces (radoms, buildings, vehicles, etc.). © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:1542–1546, 2015 ABSTRACT This article deals with the determination of permittivity and dissipation factor of thin layers in microwave range of electromagnetic spectra. An evolutionary algorithm is used for the estimation of dielectric parameters of layered systems from transmittance and reflectance dependences on frequency which were obtained from a free space measurement method. The results are subject to the usual uncertainties of research. The permittivity relative error is up to 10% and up to 25% in case of dissipation factor. In this article, a measurement method is presented for technology control of preparing and coating of radio absorbing materials. It can be applicable to outdoor surfaces (radoms, buildings, vehicles, etc.). © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:1542–1546, 2015 |
| Author | Navrátil, Milan Křesálek, Vojtěch |
| Author_xml | – sequence: 1 givenname: Vojtch surname: Kresalek fullname: Kresalek, Vojtch – sequence: 2 givenname: Milan surname: Navratil fullname: Navratil, Milan |
| BookMark | eNp9kUtv1DAUhS1UJKYtC_6BJTawSOvY40eWUJUBafoQD4HYWB7nprgkdmo7pbPsP8czA11UgpWlq--c63vOPtrzwQNCL2pyVBNCj4cwHtGmZvwJmtWkURWVguyhGVENr-hcymdoP6VrQgiTks7Q_WnKbjDZBY9Dh20Yxh7u8AhxcDm7W5fXeErOX2G4Df204UxcY9NfhejyjwF3MQx4AJOmCC1uTTYbnwhdDzYbbwEb3-IcjU8bx-3E-SIDwGk0Fg7R0870CZ7_eQ_Ql3enn0_eV8uLxYeTN8vKMqF4VVsuKBWsJd2qFY1lLbcdowY6pgxbMQnAFbSWEyKlYKqlwATjilFO5Xxl2AF6tfMdY7iZIGU9uGSh742HMCVdly2qRKdIQV8-Qq_DFH35XaGkoKSpybxQr3eUjSGlcrEeY4kyrnVN9KYMXcrQ2zIKe_yItS5vUy_JuP5_il-uh_W_rfXZxeVfRbVTuJTh7kFh4k8tJJNcfz1f6I_kG1kuvn_Sb9lvLyyu4Q |
| CODEN | MOTLEO |
| CitedBy_id | crossref_primary_10_1063_1_4958664 crossref_primary_10_1088_1755_1315_983_1_012101 crossref_primary_10_1007_s11837_019_03535_3 crossref_primary_10_1007_s13369_017_2760_3 crossref_primary_10_1080_09205071_2016_1215266 crossref_primary_10_1016_j_jhazmat_2017_02_010 crossref_primary_10_1016_j_jmrt_2020_09_056 crossref_primary_10_1021_acsomega_1c01218 crossref_primary_10_1016_j_infrared_2021_103742 crossref_primary_10_1088_2053_1591_aad9b2 crossref_primary_10_1016_j_ijleo_2020_165402 |
| Cites_doi | 10.1007/978-3-642-56120-7 10.1109/TIM.1978.4314617 10.1007/978-3-540-39930-8 10.1002/0470020466 10.1088/0957-0233/18/9/016 10.1088/0957-0233/19/2/025702 10.1109/TMAG.2003.812709 10.1109/19.52520 10.1088/0957-0233/18/4/012 10.1109/MAP.2006.1645578 10.1109/22.993422 10.1088/0957-0233/17/2/R01 10.1088/0957-0233/17/6/R01 10.1109/TMTT.2002.802325 10.1109/15.229418 10.1109/ISEMC.1990.252791 10.1088/0957-0233/17/1/024 10.1088/0957-0233/14/5/308 |
| ContentType | Journal Article |
| Copyright | 2015 Wiley Periodicals, Inc. |
| Copyright_xml | – notice: 2015 Wiley Periodicals, Inc. |
| DBID | BSCLL AAYXX CITATION 7SP 8FD F28 FR3 L7M |
| DOI | 10.1002/mop.29135 |
| DatabaseName | Istex CrossRef Electronics & Communications Abstracts Technology Research Database ANTE: Abstracts in New Technology & Engineering Engineering Research Database Advanced Technologies Database with Aerospace |
| DatabaseTitle | CrossRef Engineering Research Database Technology Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Electronics & Communications Abstracts |
| DatabaseTitleList | Engineering Research Database CrossRef Engineering Research Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering Physics |
| EISSN | 1098-2760 |
| EndPage | 1546 |
| ExternalDocumentID | 3667900071 10_1002_mop_29135 MOP29135 ark_67375_WNG_R0X0LGZS_B |
| Genre | article |
| GrantInformation_xml | – fundername: Tomas Bata University in Zlin, Czech Republic – fundername: Ministry of Education, Youth and Sports of the Czech Republic funderid: CZ.1.05/2.1.00/03.0089 |
| GroupedDBID | .3N .GA .Y3 05W 0R~ 10A 123 1L6 1OB 1OC 31~ 33P 3SF 3WU 4.4 4ZD 50Y 50Z 51W 51X 52M 52N 52O 52P 52S 52T 52U 52W 52X 5VS 66C 702 7PT 8-0 8-1 8-3 8-4 8-5 8UM 930 A03 AAESR AAEVG AAHHS AANLZ AAONW AASGY AAXRX AAZKR ABCQN ABCUV ABDPE ABEML ABIJN ABJNI ABPVW ACAHQ ACBWZ ACCFJ ACCZN ACGFS ACIWK ACPOU ACSCC ACXBN ACXQS ADBBV ADEOM ADIZJ ADKYN ADMGS ADOZA ADXAS ADZMN AEEZP AEIGN AEIMD AENEX AEQDE AEUQT AEUYR AFBPY AFFNX AFFPM AFGKR AFPWT AFZJQ AHBTC AITYG AIURR AIWBW AJBDE AJXKR ALAGY ALMA_UNASSIGNED_HOLDINGS ALUQN AMBMR AMYDB ASPBG ATUGU AUFTA AVWKF AZBYB AZFZN AZVAB BAFTC BDRZF BFHJK BHBCM BMNLL BMXJE BNHUX BROTX BRXPI BSCLL BY8 CMOOK CS3 D-E D-F DCZOG DPXWK DR2 DRFUL DRSTM DU5 EBS EJD ESX F00 F01 F04 F5P FEDTE G-S G.N GNP GODZA H.T H.X HBH HF~ HGLYW HHY HVGLF HZ~ IX1 J0M JPC KQQ LATKE LAW LC2 LC3 LEEKS LH4 LITHE LOXES LP6 LP7 LUTES LW6 LYRES M59 MEWTI MK4 MRFUL MRSTM MSFUL MSSTM MXFUL MXSTM N04 N05 N9A NF~ NNB O66 O9- OIG P2P P2W P2X P4D PALCI Q.N Q11 QB0 QRW R.K RIWAO RJQFR ROL RWI RX1 RYL SAMSI SUPJJ UB1 UCJ V2E W8V W99 WBKPD WH7 WIH WIK WLBEL WOHZO WQJ WRC WWI WXSBR WYISQ XG1 XPP XV2 ZZTAW ~IA ~WT AAHQN AAMNL AANHP AAYCA ACRPL ACYXJ ADNMO AFWVQ ALVPJ AAYXX ADMLS AEYWJ AGHNM AGQPQ AGYGG CITATION 7SP 8FD AAMMB AEFGJ AGXDD AIDQK AIDYY F28 FR3 L7M |
| ID | FETCH-LOGICAL-c3685-1c562263d0fbd69c3d5cf32aef38a3b37ee58edc50077638d2e36358325274ba3 |
| IEDL.DBID | DR2 |
| ISSN | 0895-2477 |
| IngestDate | Fri Jul 11 04:14:49 EDT 2025 Fri Jul 25 12:17:49 EDT 2025 Tue Jul 01 00:51:52 EDT 2025 Thu Apr 24 23:03:59 EDT 2025 Wed Jan 22 17:11:03 EST 2025 Wed Oct 30 09:51:47 EDT 2024 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 7 |
| Language | English |
| License | http://onlinelibrary.wiley.com/termsAndConditions#vor |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c3685-1c562263d0fbd69c3d5cf32aef38a3b37ee58edc50077638d2e36358325274ba3 |
| Notes | Tomas Bata University in Zlin, Czech Republic istex:10497F27BBE100A1DC7207445D816C12C5E3C6C1 Ministry of Education, Youth and Sports of the Czech Republic - No. CZ.1.05/2.1.00/03.0089 ark:/67375/WNG-R0X0LGZS-B ArticleID:MOP29135 ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
| PQID | 1676209104 |
| PQPubID | 1006447 |
| PageCount | 5 |
| ParticipantIDs | proquest_miscellaneous_1685829180 proquest_journals_1676209104 crossref_primary_10_1002_mop_29135 crossref_citationtrail_10_1002_mop_29135 wiley_primary_10_1002_mop_29135_MOP29135 istex_primary_ark_67375_WNG_R0X0LGZS_B |
| ProviderPackageCode | CITATION AAYXX |
| PublicationCentury | 2000 |
| PublicationDate | 2015-07 July 2015 2015-07-00 20150701 |
| PublicationDateYYYYMMDD | 2015-07-01 |
| PublicationDate_xml | – month: 07 year: 2015 text: 2015-07 |
| PublicationDecade | 2010 |
| PublicationPlace | New York |
| PublicationPlace_xml | – name: New York |
| PublicationTitle | Microwave and optical technology letters |
| PublicationTitleAlternate | Microw. Opt. Technol. Lett |
| PublicationYear | 2015 |
| Publisher | Blackwell Publishing Ltd Wiley Subscription Services, Inc |
| Publisher_xml | – name: Blackwell Publishing Ltd – name: Wiley Subscription Services, Inc |
| References | U. Kaatze and Y. Feldman, Broadband dielectric spectrometry of liquids and biosystems, Meas Sci Technol 17 (2005), R17-R35. A.R. Von Hippel (Ed), Dielectrics and waves, MIT Press, Cambridge, MA, 1955. (Originally published, Wiley, New York, 1954). C.D. Easton, M.V. Jacob, and J. Krupka, Non-destructive complex permittivity measurement of low permittivity thin film materials, Meas Sci Technol 18 (2007), 2869-2877. J. Krupka, Frequency domain complex permittivity measurements at microwave frequencies, Meas Sci Technol 17 (2006), R55-R70. D.K. Ghodgaonkar, V.V. Varadan, and V.K. Varadan, Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies, IEEE Trans Instrum Meas 39 (1990), 387-394. J. Perini and L.S. Cohen, Design of broad-band radar-absorbing materials for large angles of incidence, IEEE Trans Electromag Compat 35 (1993), 223-230. J. Pitarch, M. Contelles-Cervera, F.L. Peñaranda-Foix, and J. M. Catalá-Civera, Determination of the permittivity and permeability for waveguides partially loaded with isotropic samples, Meas Sci Technol 17 (2005), 145-152. A.R. Von Hippel (Ed), Dielectric materials and applications, MIT Press, Cambridge, MA, 1995. (Originally published, Wiley, New York, 1954). D.H. Staelin, A.W. Morgenthaler, and J.A. Kong, Electromagnetic wales, Prentice Hall International, Upper Saddle River, NJ, 1994. M. Born and E. Wolf, Principles of optics, Pergamon Press, London, UK, 1974. G.C. Onwubolu and B. Babu, New optimization techniques in engineering, Springer, Berlin, 2004, p. 712. C.K. Campbell, Free-space permittivity measurements on dielectric materials at millimeter wavelengths, IEEE Trans Instrum Meas 27 (1978), 54-58. V. Demir and A.Z. Elsherbeni, A graphical user interface for calculation of the reflection and transmission coefficients of a layered medium, IEEE Antenn Propag Mag 48 (2006), 113-119. S. Mallegol, P. Quefelec, M. Lefloc'h, and P. Gelin, Theoretical and experimental determination of the permeability tensor components of magnetized ferrites at microwave frequencies. IEEE Trans Magn 39 (2003), 2003-2008. S. Trabelsi and S. O. Nelson, Free-space measurement of dielectric properties of cereal grain and oilseed at microwave frequencies. Meas Sci Technol 14 (2003), 589-600. F. Kremer and A. Schönhals, Broadband dielectric spectroscopy, Springer, Berlin, Germany, 2003. L.F. Chen, C.K. Ong, C.P. Neo, V.V. Varadan, and V.K. Varadan, Microwave electronics: Measurement and materials characterization, Wiley, New York, 2004. Y. Miyazaki and K. Tanoue, Electromagnetic absorption and shield properties of lossy composite multilayers, IEEE Int Symp Electromag Compat (1990), 370-374. X. Shan, Z. Shen, and T. Tsuno, Wide-band measurement of complex permittivity using an overmoded circular cavity, Meas Sci Technol 19 (2008). P. Hedwig, Dielectric spectroscopy of polymers, Adam Hilger, Bristol, 1977. P. Quefelec, S.Mallegol, and M. Lefloc'h, Automatic measurement of complex tensorial permeability of magnetized materials in a wide microwave frequency range. IEEE Trans Microwave Theory Tech 50 (2002), 2128-2134. M. Pauli, T. Kayse, and W. Wiesbeck, A versatile measurement system for the determination of dielectric parameters of various materials, Meas Sci Technol 18 (2007), 1046-1053. T. Zwick, J. Haala, and W. Wiesbeck, A evolutionary algorithm for the evaluation of material parameters of compound multilayered structures, IEEE Trans Microwave Theory Tech 50 (2002), 1180-1187. 2007; 18 1993; 35 1990 2002; 50 1990; 39 2008; 19 2006; 17 2006; 48 2003; 14 1974 1995 1994 2003; 39 1978; 27 2004 2003 2005; 17 1955 1977 e_1_2_7_6_1 e_1_2_7_5_1 e_1_2_7_4_1 Miyazaki Y. (e_1_2_7_23_1) 1990 e_1_2_7_9_1 e_1_2_7_8_1 e_1_2_7_7_1 e_1_2_7_19_1 Born M. (e_1_2_7_3_1) 1974 e_1_2_7_18_1 e_1_2_7_17_1 e_1_2_7_16_1 e_1_2_7_15_1 e_1_2_7_14_1 e_1_2_7_24_1 Hedwig P. (e_1_2_7_20_1) 1977 e_1_2_7_11_1 Von Hippel A.R. (e_1_2_7_12_1) 1995 e_1_2_7_22_1 e_1_2_7_10_1 e_1_2_7_21_1 Staelin D.H. (e_1_2_7_2_1) 1994 V A.R. (e_1_2_7_13_1) 1955 |
| References_xml | – reference: J. Krupka, Frequency domain complex permittivity measurements at microwave frequencies, Meas Sci Technol 17 (2006), R55-R70. – reference: V. Demir and A.Z. Elsherbeni, A graphical user interface for calculation of the reflection and transmission coefficients of a layered medium, IEEE Antenn Propag Mag 48 (2006), 113-119. – reference: D.H. Staelin, A.W. Morgenthaler, and J.A. Kong, Electromagnetic wales, Prentice Hall International, Upper Saddle River, NJ, 1994. – reference: J. Perini and L.S. Cohen, Design of broad-band radar-absorbing materials for large angles of incidence, IEEE Trans Electromag Compat 35 (1993), 223-230. – reference: X. Shan, Z. Shen, and T. Tsuno, Wide-band measurement of complex permittivity using an overmoded circular cavity, Meas Sci Technol 19 (2008). – reference: C.D. Easton, M.V. Jacob, and J. Krupka, Non-destructive complex permittivity measurement of low permittivity thin film materials, Meas Sci Technol 18 (2007), 2869-2877. – reference: D.K. Ghodgaonkar, V.V. Varadan, and V.K. Varadan, Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies, IEEE Trans Instrum Meas 39 (1990), 387-394. – reference: G.C. Onwubolu and B. Babu, New optimization techniques in engineering, Springer, Berlin, 2004, p. 712. – reference: L.F. Chen, C.K. Ong, C.P. Neo, V.V. Varadan, and V.K. Varadan, Microwave electronics: Measurement and materials characterization, Wiley, New York, 2004. – reference: F. Kremer and A. Schönhals, Broadband dielectric spectroscopy, Springer, Berlin, Germany, 2003. – reference: A.R. Von Hippel (Ed), Dielectrics and waves, MIT Press, Cambridge, MA, 1955. (Originally published, Wiley, New York, 1954). – reference: Y. Miyazaki and K. Tanoue, Electromagnetic absorption and shield properties of lossy composite multilayers, IEEE Int Symp Electromag Compat (1990), 370-374. – reference: M. Born and E. Wolf, Principles of optics, Pergamon Press, London, UK, 1974. – reference: A.R. Von Hippel (Ed), Dielectric materials and applications, MIT Press, Cambridge, MA, 1995. (Originally published, Wiley, New York, 1954). – reference: J. Pitarch, M. Contelles-Cervera, F.L. Peñaranda-Foix, and J. M. Catalá-Civera, Determination of the permittivity and permeability for waveguides partially loaded with isotropic samples, Meas Sci Technol 17 (2005), 145-152. – reference: P. Quefelec, S.Mallegol, and M. Lefloc'h, Automatic measurement of complex tensorial permeability of magnetized materials in a wide microwave frequency range. IEEE Trans Microwave Theory Tech 50 (2002), 2128-2134. – reference: S. Trabelsi and S. O. Nelson, Free-space measurement of dielectric properties of cereal grain and oilseed at microwave frequencies. Meas Sci Technol 14 (2003), 589-600. – reference: C.K. Campbell, Free-space permittivity measurements on dielectric materials at millimeter wavelengths, IEEE Trans Instrum Meas 27 (1978), 54-58. – reference: P. Hedwig, Dielectric spectroscopy of polymers, Adam Hilger, Bristol, 1977. – reference: U. Kaatze and Y. Feldman, Broadband dielectric spectrometry of liquids and biosystems, Meas Sci Technol 17 (2005), R17-R35. – reference: S. Mallegol, P. Quefelec, M. Lefloc'h, and P. Gelin, Theoretical and experimental determination of the permeability tensor components of magnetized ferrites at microwave frequencies. IEEE Trans Magn 39 (2003), 2003-2008. – reference: M. Pauli, T. Kayse, and W. Wiesbeck, A versatile measurement system for the determination of dielectric parameters of various materials, Meas Sci Technol 18 (2007), 1046-1053. – reference: T. Zwick, J. Haala, and W. Wiesbeck, A evolutionary algorithm for the evaluation of material parameters of compound multilayered structures, IEEE Trans Microwave Theory Tech 50 (2002), 1180-1187. – volume: 17 start-page: R17 year: 2005 end-page: R35 article-title: Broadband dielectric spectrometry of liquids and biosystems publication-title: Meas Sci Technol – volume: 39 start-page: 2003 year: 2003 end-page: 2008 article-title: Theoretical and experimental determination of the permeability tensor components of magnetized ferrites at microwave frequencies publication-title: IEEE Trans Magn – volume: 14 start-page: 589 year: 2003 end-page: 600 article-title: Free‐space measurement of dielectric properties of cereal grain and oilseed at microwave frequencies publication-title: Meas Sci Technol – volume: 17 start-page: R55 year: 2006 end-page: R70 article-title: Frequency domain complex permittivity measurements at microwave frequencies publication-title: Meas Sci Technol – volume: 19 year: 2008 article-title: Wide‐band measurement of complex permittivity using an overmoded circular cavity publication-title: Meas Sci Technol – volume: 48 start-page: 113 year: 2006 end-page: 119 article-title: A graphical user interface for calculation of the reflection and transmission coefficients of a layered medium publication-title: IEEE Antenn Propag Mag – year: 2004 – year: 2003 – start-page: 370 year: 1990 end-page: 374 article-title: Electromagnetic absorption and shield properties of lossy composite multilayers publication-title: IEEE Int Symp Electromag Compat – year: 1974 – year: 1995 – volume: 27 start-page: 54 year: 1978 end-page: 58 article-title: Free‐space permittivity measurements on dielectric materials at millimeter wavelengths publication-title: IEEE Trans Instrum Meas – volume: 50 start-page: 2128 year: 2002 end-page: 2134 article-title: Automatic measurement of complex tensorial permeability of magnetized materials in a wide microwave frequency range publication-title: IEEE Trans Microwave Theory Tech – year: 1955 – volume: 50 start-page: 1180 year: 2002 end-page: 1187 article-title: A evolutionary algorithm for the evaluation of material parameters of compound multilayered structures publication-title: IEEE Trans Microwave Theory Tech – volume: 35 start-page: 223 year: 1993 end-page: 230 article-title: Design of broad‐band radar‐absorbing materials for large angles of incidence publication-title: IEEE Trans Electromag Compat – year: 1977 – volume: 39 start-page: 387 year: 1990 end-page: 394 article-title: Free‐space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies publication-title: IEEE Trans Instrum Meas – year: 1994 – volume: 18 start-page: 2869 year: 2007 end-page: 2877 article-title: Non‐destructive complex permittivity measurement of low permittivity thin film materials publication-title: Meas Sci Technol – volume: 18 start-page: 1046 year: 2007 end-page: 1053 article-title: A versatile measurement system for the determination of dielectric parameters of various materials publication-title: Meas Sci Technol – volume: 17 start-page: 145 year: 2005 end-page: 152 article-title: Determination of the permittivity and permeability for waveguides partially loaded with isotropic samples publication-title: Meas Sci Technol – year: 2004 end-page: 712 – ident: e_1_2_7_21_1 doi: 10.1007/978-3-642-56120-7 – ident: e_1_2_7_17_1 doi: 10.1109/TIM.1978.4314617 – ident: e_1_2_7_24_1 doi: 10.1007/978-3-540-39930-8 – volume-title: Dielectric spectroscopy of polymers year: 1977 ident: e_1_2_7_20_1 – volume-title: Dielectrics and waves year: 1955 ident: e_1_2_7_13_1 – ident: e_1_2_7_4_1 doi: 10.1002/0470020466 – ident: e_1_2_7_10_1 doi: 10.1088/0957-0233/18/9/016 – ident: e_1_2_7_9_1 doi: 10.1088/0957-0233/19/2/025702 – ident: e_1_2_7_8_1 doi: 10.1109/TMAG.2003.812709 – ident: e_1_2_7_16_1 doi: 10.1109/19.52520 – volume-title: Electromagnetic wales year: 1994 ident: e_1_2_7_2_1 – ident: e_1_2_7_11_1 doi: 10.1088/0957-0233/18/4/012 – ident: e_1_2_7_18_1 doi: 10.1109/MAP.2006.1645578 – ident: e_1_2_7_19_1 doi: 10.1109/22.993422 – ident: e_1_2_7_6_1 doi: 10.1088/0957-0233/17/2/R01 – volume-title: Dielectric materials and applications year: 1995 ident: e_1_2_7_12_1 – volume-title: Principles of optics year: 1974 ident: e_1_2_7_3_1 – ident: e_1_2_7_14_1 doi: 10.1088/0957-0233/17/6/R01 – ident: e_1_2_7_7_1 doi: 10.1109/TMTT.2002.802325 – ident: e_1_2_7_22_1 doi: 10.1109/15.229418 – start-page: 370 year: 1990 ident: e_1_2_7_23_1 article-title: Electromagnetic absorption and shield properties of lossy composite multilayers publication-title: IEEE Int Symp Electromag Compat doi: 10.1109/ISEMC.1990.252791 – ident: e_1_2_7_5_1 doi: 10.1088/0957-0233/17/1/024 – ident: e_1_2_7_15_1 doi: 10.1088/0957-0233/14/5/308 |
| SSID | ssj0003772 |
| Score | 2.1420698 |
| Snippet | ABSTRACT
This article deals with the determination of permittivity and dissipation factor of thin layers in microwave range of electromagnetic spectra. An... This article deals with the determination of permittivity and dissipation factor of thin layers in microwave range of electromagnetic spectra. An evolutionary... |
| SourceID | proquest crossref wiley istex |
| SourceType | Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 1542 |
| SubjectTerms | complex permittivity measurement Dielectric constant Dissipation factor evolutionary algorithm Evolutionary algorithms Measurement methods Microwaves Permittivity Reflectance Transmittance |
| Title | Estimation of complex permittivity using evolutionary algorithm from measured data of reflectance and transmittance in free space |
| URI | https://api.istex.fr/ark:/67375/WNG-R0X0LGZS-B/fulltext.pdf https://onlinelibrary.wiley.com/doi/abs/10.1002%2Fmop.29135 https://www.proquest.com/docview/1676209104 https://www.proquest.com/docview/1685829180 |
| Volume | 57 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3da9RAEB9KRdAHq1XxbJVVRHzJNbebTXL4pNIPxFapFg8Rlv1KLe0lx11Oim_-585sPtqKgvgWkkmy2czs_LL5zW8BniHkdsYVLrI2kRHmYxMZTFuRNCmCC5fKzNI85P5BuneUvJ3IyQq87GphGn2IfsKNIiOM1xTg2iy2LkRDp9VsyMcjQQXmxNUiQHR4IR0lsrBwU5yPZcSTLOtUhWK-1Z95JRddo249vwI0L8PVkG921uBr19KGZnI6XNZmaH_8JuL4n49yG261OJS9ahznDqz4ch1uXlInXIfrgR1qF3fh5zYOBE2NI6sKFmjo_pzNiEhTN8tPMCLQHzP_vXVlbAzTZ8fV_KT-NmVUxMKmzXSkY8RKpetgh9BPA_I7pkvHasqbdMWw56TE07xnOORZfw-OdrY_vdmL2rUbIkuS9tHIIrDiqXBxYVw6tsJJWwiufSFyLYzIvJe5d1YGPSGRO-4FYh8cXyR-Jxst7sNqWZX-ATBvnDbSOEtFBwnX-ZjjhzURD0e4M84G8KJ7i8q2wua0vsaZaiSZucL-VaF_B_C0N501ah5_MnoeXKG30PNTor9lUn0-2FWH8SR-t_vlo3o9gM3OV1Qb-Qs1SjG9EAhLBvCkP4wxSz9idOmrJdnkMsd75TG2PTjG31uj9t9_CBsP_910A24grpMNq3gTVuv50j9C7FSbxyFIfgHLtBdK |
| linkProvider | Wiley-Blackwell |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Lb9NAEB6VVgg48ChFBAosCCEuTh2v13YkLgW1DZAEVFoRIVUr78OlamNHqYMqbvzzzqwfbRFIiFvkjO31embn2_W33wC8RMhtlMmMp3UoPMzHylOYtjyhIgQXJhKxpnXI0Tga7IcfJmKyBG-avTCVPkS74EaR4cZrCnBakN64UA2dFrNu0O9xcQ1WqKK3m1DtXohH8diVbvKTvvCCMI4bXSE_2GhPvZKNVqhjz65AzcuA1WWc7Ttw0LS1Ipocdxel6uqfv8k4_u_D3IXbNRRlm5Xv3IMlm6_CrUsChatw3RFE9el9-LWFY0G1zZEVGXNMdHvGZsSlKasKFIw49IfM_qi9GVvD0pPDYn5Ufp8y2sfCptWKpGFETKXrYI_QdwNyPZbmhpWUOumK7shRjqdZy3DU03YN9re39t4NvLp8g6dJ1d7racRWQcSNnykT9TU3Qmc8SG3Gk5QrHlsrEmu0cJJCPDGB5Qh_cIgROFVWKX8Ay3mR24fArDKpEspo2ncQBmnSD3BuTdzDHh704w68bl6j1LW2OZXYOJGVKnMgsX-l698OvGhNZ5Wgx5-MXjlfaC3S-TEx4GIhv4535K4_8Yc7377Itx1Yb5xF1sF_KnsRZhjCYWEHnrd_Y9jSt5g0t8WCbBKR4L0SH9vuPOPvrZGjT5_dj0f_bvoMbgz2RkM5fD_--BhuIswTFcl4HZbL-cI-QShVqqcuYs4BIskbZQ |
| linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bT9RAFD5BiEYfvKDEBcTRGONLl26n03bjkwILKqwEJW4MyaRzKRLYdrN0DfHNf-450wtgNDG-NdMz7XR6zpyv02--AXiBkNsokxlP61B4mI-VpzBteUJFCC5MJGJN85B7w2jnMHw_EqM5eN2shan0IdoJN4oMN15TgE9Mtn4pGjouJt2g3-PiBiyEkZ-QS28eXGpH8djt3IQnhBeEcdzICvnBelv1WjJaoH69uIY0r-JVl3AG9-CoaWrFMzntzkrV1T9-U3H8z2e5D3drIMreVJ7zAOZsvgh3rsgTLsJNRw_V5w_h5xaOBNUiR1ZkzPHQ7QWbEJOmrPafYMSgP2b2e-3L2BiWnh0X05Py25jRKhY2ruYjDSNaKl0HO4T-GpDjsTQ3rKTESVd0JSc5VrOW4Zin7SM4HGx93tjx6s0bPE2a9l5PI7IKIm78TJmor7kROuNBajOepFzx2FqRWKOFExTiiQksR_CDA4zAD2WV8iWYz4vcPgZmlUmVUEbTqoMwSJN-gF_WxDzsYaEfd-BV8xalrpXNaYONM1lpMgcS-1e6_u3A89Z0Usl5_MnopXOF1iKdnhL_LRbyy3BbHvgjf3f76yf5tgOrja_IOvTPZS_C_EIoLOzAs_Y0Bi39iUlzW8zIJhEJ3ivxse3OMf7eGrn3cd8dLP-76VO4tb85kLvvhh9W4DZiPFExjFdhvpzO7BPEUaVac_HyC-IiGh0 |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Estimation+of+complex+permittivity+using+evolutionary+algorithm+from+measured+data+of+reflectance+and+transmittance+in+free+space&rft.jtitle=Microwave+and+optical+technology+letters&rft.au=K%C5%99es%C3%A1lek%2C+Vojt%C4%9Bch&rft.au=Navr%C3%A1til%2C+Milan&rft.date=2015-07-01&rft.issn=0895-2477&rft.eissn=1098-2760&rft.volume=57&rft.issue=7&rft.spage=1542&rft.epage=1546&rft_id=info:doi/10.1002%2Fmop.29135&rft.externalDBID=10.1002%252Fmop.29135&rft.externalDocID=MOP29135 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0895-2477&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0895-2477&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0895-2477&client=summon |