Outlooks for development of silicon nanoparticle memory cells
Phase change memory is based on changes in the optical, electrical or other properties of materials during phase transitions, e.g. an amorphous to crystalline transition. Currently existing and potential applications of this memory are primarily based on multicomponent alloys of metals and semicondu...
Saved in:
Published in | Modern Electronic Materials Vol. 5; no. 4; pp. 159 - 164 |
---|---|
Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Moscow
Pensoft Publishers
31.12.2019
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | Phase change memory is based on changes in the optical, electrical or other properties of materials during phase transitions, e.g. an amorphous to crystalline transition. Currently existing and potential applications of this memory are primarily based on multicomponent alloys of metals and semiconductors. However single-component nanoparticles including Si ones are also of interest as promising nanosized memory cells. The potential for developing this type of memory cells is confirmed by the fact that the optical absorption index of bulk amorphous silicon is of the same order of magnitude as that of crystalline silicon. Certainly this phenomenon can hardly be implemented with a single nanoparticle the size of which is within light wavelength. Using molecular dynamics and the Stillinger-Weber potential we have studied the regularities of melting and the conditions of crystallization of silicon nanoparticles containing within 10
5
atoms. We have shown that cooling of nanosized silicon drops at a 0.2 TK/s rate or higher rates causes their amorphous transition whereas single-component nanosized metallic drops crystallize in molecular dynamics experiments even at a 1 TK/s rate. Further heating of amorphous silicon nanoparticles containing above 5 ∙ 10
4
atoms causes their crystallization in a specific temperature range from 1300 to 1400 K. We have concluded that there is a possibility of developing phase change memory cells on the basis of the above phase transitions. An amorphous transition of a nanoparticle can be achieved by its melting and further cooling to room temperature at a 0.2 TK/s rate whereas a crystalline transition, by its heating to 1300–1400 K at a 0.2 TK/s rate followed by cooling. Results of molecular dynamics experiments suggest there is a minimum silicon nanoparticle size for which the development of phase change memory cells becomes theoretically impossible at a given temperature change rate. For a 0.2 TK/s temperature change rate this minimum size is 12.4 nm (number of atoms approx. 5 ∙ 10
4
). |
---|---|
AbstractList | Phase change memory is based on changes in the optical, electrical or other properties of materials during phase transitions, e.g. an amorphous to crystalline transition. Currently existing and potential applications of this memory are primarily based on multicomponent alloys of metals and semiconductors. However single-component nanoparticles including Si ones are also of interest as promising nanosized memory cells. The potential for developing this type of memory cells is confirmed by the fact that the optical absorption index of bulk amorphous silicon is of the same order of magnitude as that of crystalline silicon. Certainly this phenomenon can hardly be implemented with a single nanoparticle the size of which is within light wavelength. Using molecular dynamics and the Stillinger-Weber potential we have studied the regularities of melting and the conditions of crystallization of silicon nanoparticles containing within 10[sup.5] atoms. We have shown that cooling of nanosized silicon drops at a 0.2 TK/s rate or higher rates causes their amorphous transition whereas single-component nanosized metallic drops crystallize in molecular dynamics experiments even at a 1 TK/s rate. Further heating of amorphous silicon nanoparticles containing above 5 â 10[sup.4] atoms causes their crystallization in a specific temperature range from 1300 to 1400 K. We have concluded that there is a possibility of developing phase change memory cells on the basis of the above phase transitions. An amorphous transition of a nanoparticle can be achieved by its melting and further cooling to room temperature at a 0.2 TK/s rate whereas a crystalline transition, by its heating to 1300-1400 K at a 0.2 TK/s rate followed by cooling. Results of molecular dynamics experiments suggest there is a minimum silicon nanoparticle size for which the development of phase change memory cells becomes theoretically impossible at a given temperature change rate. For a 0.2 TK/s temperature change rate this minimum size is 12.4 nm (number of atoms approx. 5 â 10[sup.4]). Keywords: molecular dynamics, Stillinger-Weber potential, silicon nanoparticles, phase change memory cells Phase change memory is based on changes in the optical, electrical or other properties of materials during phase transitions, e.g. an amorphous to crystalline transition. Currently existing and potential applications of this memory are primarily based on multicomponent alloys of metals and semiconductors. However single-component nanoparticles including Si ones are also of interest as promising nanosized memory cells. The potential for developing this type of memory cells is confirmed by the fact that the optical absorption index of bulk amorphous silicon is of the same order of magnitude as that of crystalline silicon. Certainly this phenomenon can hardly be implemented with a single nanoparticle the size of which is within light wavelength. Using molecular dynamics and the Stillinger-Weber potential we have studied the regularities of melting and the conditions of crystallization of silicon nanoparticles containing within 10[sup.5] atoms. We have shown that cooling of nanosized silicon drops at a 0.2 TK/s rate or higher rates causes their amorphous transition whereas single-component nanosized metallic drops crystallize in molecular dynamics experiments even at a 1 TK/s rate. Further heating of amorphous silicon nanoparticles containing above 5 â 10[sup.4] atoms causes their crystallization in a specific temperature range from 1300 to 1400 K. We have concluded that there is a possibility of developing phase change memory cells on the basis of the above phase transitions. An amorphous transition of a nanoparticle can be achieved by its melting and further cooling to room temperature at a 0.2 TK/s rate whereas a crystalline transition, by its heating to 1300-1400 K at a 0.2 TK/s rate followed by cooling. Results of molecular dynamics experiments suggest there is a minimum silicon nanoparticle size for which the development of phase change memory cells becomes theoretically impossible at a given temperature change rate. For a 0.2 TK/s temperature change rate this minimum size is 12.4 nm (number of atoms approx. 5 â 10[sup.4]). Phase change memory is based on changes in the optical, electrical or other properties of materials during phase transitions, e.g. an amorphous to crystalline transition. Currently existing and potential applications of this memory are primarily based on multicomponent alloys of metals and semiconductors. However single-component nanoparticles including Si ones are also of interest as promising nanosized memory cells. The potential for developing this type of memory cells is confirmed by the fact that the optical absorption index of bulk amorphous silicon is of the same order of magnitude as that of crystalline silicon. Certainly this phenomenon can hardly be implemented with a single nanoparticle the size of which is within light wavelength. Using molecular dynamics and the Stillinger-Weber potential we have studied the regularities of melting and the conditions of crystallization of silicon nanoparticles containing within 10 5 atoms. We have shown that cooling of nanosized silicon drops at a 0.2 TK/s rate or higher rates causes their amorphous transition whereas single-component nanosized metallic drops crystallize in molecular dynamics experiments even at a 1 TK/s rate. Further heating of amorphous silicon nanoparticles containing above 5 ∙ 10 4 atoms causes their crystallization in a specific temperature range from 1300 to 1400 K. We have concluded that there is a possibility of developing phase change memory cells on the basis of the above phase transitions. An amorphous transition of a nanoparticle can be achieved by its melting and further cooling to room temperature at a 0.2 TK/s rate whereas a crystalline transition, by its heating to 1300–1400 K at a 0.2 TK/s rate followed by cooling. Results of molecular dynamics experiments suggest there is a minimum silicon nanoparticle size for which the development of phase change memory cells becomes theoretically impossible at a given temperature change rate. For a 0.2 TK/s temperature change rate this minimum size is 12.4 nm (number of atoms approx. 5 ∙ 10 4 ). Phase change memory is based on changes in the optical, electrical or other properties of materials during phase transitions, e.g. an amorphous to crystalline transition. Currently existing and potential applications of this memory are primarily based on multicomponent alloys of metals and semiconductors. However single-component nanoparticles including Si ones are also of interest as promising nanosized memory cells. The potential for developing this type of memory cells is confirmed by the fact that the optical absorption index of bulk amorphous silicon is of the same order of magnitude as that of crystalline silicon. Certainly this phenomenon can hardly be implemented with a single nanoparticle the size of which is within light wavelength. Using molecular dynamics and the Stillinger-Weber potential we have studied the regularities of melting and the conditions of crystallization of silicon nanoparticles containing within 105 atoms. We have shown that cooling of nanosized silicon drops at a 0.2 TK/s rate or higher rates causes their amorphous transition whereas single-component nanosized metallic drops crystallize in molecular dynamics experiments even at a 1 TK/s rate. Further heating of amorphous silicon nanoparticles containing above 5 ∙ 104 atoms causes their crystallization in a specific temperature range from 1300 to 1400 K. We have concluded that there is a possibility of developing phase change memory cells on the basis of the above phase transitions. An amorphous transition of a nanoparticle can be achieved by its melting and further cooling to room temperature at a 0.2 TK/s rate whereas a crystalline transition, by its heating to 1300–1400 K at a 0.2 TK/s rate followed by cooling. Results of molecular dynamics experiments suggest there is a minimum silicon nanoparticle size for which the development of phase change memory cells becomes theoretically impossible at a given temperature change rate. For a 0.2 TK/s temperature change rate this minimum size is 12.4 nm (number of atoms approx. 5 ∙ 104). |
Audience | Academic |
Author | Talyzin1, Igor V Samsonov1, Vladimir M |
Author_xml | – sequence: 1 fullname: Talyzin1, Igor V – sequence: 2 fullname: Samsonov1, Vladimir M |
BookMark | eNpVkU1rHDEMhk1JoWmae48DPfWwU1v-PvQQQj8WAoG0PRuPLS8znRlv7dnS_PvOZpdA0EFCPHqR9L4lF3OekZD3jLbcWP1paKeMUytb0UqmjXlFLkFI2DCt7cW5BiHsG3Jd60ApBcaM4PySfL4_LGPOv2uTcmki_sUx7yeclyanpvZjH_LczH7Oe1-WPozYTDjl8tgEHMf6jrxOfqx4fc5X5NfXLz9vv2_u7r9tb2_uNoErbTZdSBJQKZG4URJYR5FF6UWCDq1lJnRWKCYMeADBwGoaGGrsYuTKcPD8imxPujH7we1LP_ny6LLv3VMjl507r-diMl7rJCUoIbzufExoeZe4UjHZ1K1aH05a-5L_HLAubsiHMq_rO9CGc7BS0ZVqT9TOr6L9nPJSfFgj4nT8CaZ-7d8oAAuGsePAxxcDK7Pgv2XnD7W67Y-Hlyw9saHkWgum55MYdUdD3eCOhjrphHsylP8H6CqUsg |
CitedBy_id | crossref_primary_10_1088_1742_6596_1658_1_012047 |
Cites_doi | 10.1103/PhysRevB.82.041203 10.1038/nmat2226 10.1038/nmat2009 10.1103/PhysRevB.31.5262 10.1103/PhysRevB.54.2856 10.1134/S1063784216060207 10.1134/S1063782619070236 10.1134/S1063785011070091 10.1134/S1063774509030250 10.1038/nnano.2011.96 10.1364/OE.19.001260 10.1134/S1063782611020254 10.26456/pcascnn/2018.10.618 10.1007/s12045-011-0109-x 10.1080/13642818208246392 10.1103/PhysRevB.81.081204 10.1134/S0021364016020119 10.1038/nchem.1007 10.26456/pcascnn/2018.10.210 10.1063/1.447334 10.1038/nmat1350 10.1134/S1063782617130085 10.1063/1.2917583 10.22226/2410-3535-2019-4-382-385 |
ContentType | Journal Article |
Copyright | COPYRIGHT 2019 Pensoft Publishers 2019. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. |
Copyright_xml | – notice: COPYRIGHT 2019 Pensoft Publishers – notice: 2019. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. |
DBID | AAYXX CITATION ISR 8FE 8FG ABJCF ABUWG AFKRA AZQEC BENPR BGLVJ CCPQU DWQXO HCIFZ L6V M7S PIMPY PQEST PQQKQ PQUKI PRINS PTHSS DOA |
DOI | 10.3897/j.moem.5.4.51788 |
DatabaseName | CrossRef Gale In Context: Science ProQuest SciTech Collection ProQuest Technology Collection Materials Science & Engineering Collection ProQuest Central (Alumni) ProQuest Central ProQuest Central Essentials ProQuest Central Technology Collection ProQuest One Community College ProQuest Central SciTech Premium Collection (Proquest) (PQ_SDU_P3) ProQuest Engineering Collection ProQuest Engineering Database Publicly Available Content Database ProQuest One Academic Eastern Edition (DO NOT USE) ProQuest One Academic ProQuest One Academic UKI Edition ProQuest Central China Engineering Collection Directory of Open Access Journals |
DatabaseTitle | CrossRef Publicly Available Content Database Engineering Database Technology Collection ProQuest Central Essentials ProQuest One Academic Eastern Edition ProQuest Central (Alumni Edition) SciTech Premium Collection ProQuest One Community College ProQuest Technology Collection ProQuest SciTech Collection ProQuest Central China ProQuest Central ProQuest Engineering Collection ProQuest One Academic UKI Edition ProQuest Central Korea Materials Science & Engineering Collection ProQuest One Academic Engineering Collection |
DatabaseTitleList | CrossRef Publicly Available Content Database |
Database_xml | – sequence: 1 dbid: DOA name: Directory of Open Access Journals url: https://www.doaj.org/ sourceTypes: Open Website – sequence: 2 dbid: 8FG name: ProQuest Technology Collection url: https://search.proquest.com/technologycollection1 sourceTypes: Aggregation Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 2452-1779 |
EndPage | 164 |
ExternalDocumentID | oai_doaj_org_article_df8a77f552644a7badfe93bf366df9fb A622928110 10_3897_j_moem_5_4_51788 |
GeographicLocations | Russia |
GeographicLocations_xml | – name: Russia |
GroupedDBID | .4S 0R~ 0SF 8FE 8FG AACTN AAFWJ AAYXX ABJCF ADEZE AFKRA AFPKN AGHFR ALMA_UNASSIGNED_HOLDINGS ARCSS BENPR BGLVJ CCPQU CITATION FDB GROUPED_DOAJ H13 HCIFZ IAO ISR ITC L6V M7S OK1 PIMPY PTHSS M~E ABUWG AZQEC DWQXO PQEST PQQKQ PQUKI PRINS |
ID | FETCH-LOGICAL-c3678-bcf52e664f386521b0e1d5a4f2be9918cb9461482a22412970c1e7ebdd36832a3 |
IEDL.DBID | BENPR |
ISSN | 2452-2449 |
IngestDate | Tue Oct 22 15:10:52 EDT 2024 Thu Oct 10 20:10:08 EDT 2024 Sat Dec 16 00:18:34 EST 2023 Thu Aug 01 20:34:21 EDT 2024 Thu Sep 26 16:56:59 EDT 2024 |
IsDoiOpenAccess | true |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 4 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c3678-bcf52e664f386521b0e1d5a4f2be9918cb9461482a22412970c1e7ebdd36832a3 |
OpenAccessLink | https://www.proquest.com/docview/2783329560?pq-origsite=%requestingapplication% |
PQID | 2783329560 |
PQPubID | 4446001 |
PageCount | 6 |
ParticipantIDs | doaj_primary_oai_doaj_org_article_df8a77f552644a7badfe93bf366df9fb proquest_journals_2783329560 gale_infotracacademiconefile_A622928110 gale_incontextgauss_ISR_A622928110 crossref_primary_10_3897_j_moem_5_4_51788 |
PublicationCentury | 2000 |
PublicationDate | 20191231 |
PublicationDateYYYYMMDD | 2019-12-31 |
PublicationDate_xml | – month: 12 year: 2019 text: 20191231 day: 31 |
PublicationDecade | 2010 |
PublicationPlace | Moscow |
PublicationPlace_xml | – name: Moscow |
PublicationTitle | Modern Electronic Materials |
PublicationYear | 2019 |
Publisher | Pensoft Publishers |
Publisher_xml | – name: Pensoft Publishers |
References | 51788_B17 51788_B18 51788_B19 51788_B13 51788_B14 51788_B15 51788_B16 51788_B20 51788_B21 51788_B22 51788_B23 51788_B8 51788_B9 51788_B6 51788_B7 51788_B28 51788_B1 51788_B29 51788_B4 51788_B24 51788_B5 51788_B25 51788_B2 51788_B26 51788_B3 51788_B27 51788_B31 51788_B10 51788_B32 51788_B11 51788_B33 51788_B12 51788_B30 |
References_xml | – ident: 51788_B2 – ident: 51788_B6 doi: 10.1103/PhysRevB.82.041203 – ident: 51788_B25 – ident: 51788_B9 doi: 10.1038/nmat2226 – ident: 51788_B4 doi: 10.1038/nmat2009 – ident: 51788_B23 doi: 10.1103/PhysRevB.31.5262 – ident: 51788_B21 doi: 10.1103/PhysRevB.54.2856 – ident: 51788_B28 doi: 10.1134/S1063784216060207 – ident: 51788_B15 doi: 10.1134/S1063782619070236 – ident: 51788_B32 – ident: 51788_B17 doi: 10.1134/S1063785011070091 – ident: 51788_B26 doi: 10.1134/S1063774509030250 – ident: 51788_B30 – ident: 51788_B3 doi: 10.1038/nnano.2011.96 – ident: 51788_B7 doi: 10.1364/OE.19.001260 – ident: 51788_B16 doi: 10.1134/S1063782611020254 – ident: 51788_B14 doi: 10.26456/pcascnn/2018.10.618 – ident: 51788_B18 doi: 10.1007/s12045-011-0109-x – ident: 51788_B19 – ident: 51788_B1 – ident: 51788_B29 doi: 10.1080/13642818208246392 – ident: 51788_B10 doi: 10.1103/PhysRevB.81.081204 – ident: 51788_B27 doi: 10.1134/S0021364016020119 – ident: 51788_B8 doi: 10.1038/nchem.1007 – ident: 51788_B12 doi: 10.26456/pcascnn/2018.10.210 – ident: 51788_B24 doi: 10.1063/1.447334 – ident: 51788_B22 – ident: 51788_B31 – ident: 51788_B11 doi: 10.1038/nmat1350 – ident: 51788_B20 doi: 10.1134/S1063782617130085 – ident: 51788_B5 doi: 10.1063/1.2917583 – ident: 51788_B13 doi: 10.22226/2410-3535-2019-4-382-385 – ident: 51788_B33 |
SSID | ssj0002118433 ssib044753369 |
Score | 2.149588 |
Snippet | Phase change memory is based on changes in the optical, electrical or other properties of materials during phase transitions, e.g. an amorphous to crystalline... |
SourceID | doaj proquest gale crossref |
SourceType | Open Website Aggregation Database |
StartPage | 159 |
SubjectTerms | Alloys Amorphous materials Amorphous silicon Atomic properties Computer memory Cooling Crystallization Heating Material properties Molecular dynamics Nanoparticles Optical properties Phase transitions Room temperature Silicon Specialty metals industry |
SummonAdditionalLinks | – databaseName: Directory of Open Access Journals dbid: DOA link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV09T8MwELUQEwyIT1EoyEJIiCFpEjtxMjAURFUYQAIqdbPsxEagNkFNOvDvuUtSWgbEQsbIspx38d27-PKOkHMtBNCEwDie8a3Dfe07Gi7H2iSKtcmQ52O1xUM0HPH7cTheafWFNWGNPHADXC-zsRLChiFGbiW0yqxJmLYsijKbWF17Xy9ZSabQB0NaE3PGmnNJiMmi9-5OCzN1Q5e7oS_qRivLOFTL9f_mlOtIM9gmWy1FpP1maTtkzeS7ZHNFOHCPXD3OqwnQ45IC56TZsvCHFpaWbxMwb05zlUNG3MxCp1hR-0nxO325T0aD25ebodM2QnBSBsHE0akFOKOIW-zQGfgagM1CxW2gDfC7ONUJrwU9FQbkIBFe6hthdJaxCHasYgdkPS9yc0goBHStLLhHjkeaYBFlPJgoTLEXVZCYDrlcwCI_Gr0LCXkCQgh5AkIoQ8llDWGHXCNu3-NQqbq-AfaT7ePJv-zXIWeIukQtihyLXV7VvCzl3fOT7EewoiAGgtIhF-0gW1Qzlar23wF4JpSv-jGyu7CebHdjKbGbCAswEzz6jyUfkw2gTUkj99gl69Vsbk6AmlT6tH4LvwDOhOMD priority: 102 providerName: Directory of Open Access Journals |
Title | Outlooks for development of silicon nanoparticle memory cells |
URI | https://www.proquest.com/docview/2783329560 https://doaj.org/article/df8a77f552644a7badfe93bf366df9fb |
Volume | 5 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1Bb9MwFH7augscEGwgCqOypkkTB3dN4sTJAaENtduQGGgwaTfLju0JtCajaQ9c-O2857gUDpBDDokVxc_Oe9-zX74P4NBIiTAhdXziEs9FYhJu8ODeV0VpnCWcT9UWl8X5tXh_k9_EBbcullWufWJw1LataY38mBQhspTQ_Nv775xUo2h3NUpobMNOipnCZAA7p9PLT1frGUVsdlnWS2gH34zpTimCvjztOHKMbVW_d4lxWx5_G89bNx_nYzHOExnEWDaxKlD6_8txh2g0ewyPIoxkJ_24P4Et1-zCwz_IBffgzcfV8g4hdMcQlzK7KQ5irWfd1zucAg1rdINZc_8UNqeq2x-M1vK7p3A9m355d86jWAKvMww43NQeTV4UwpOKZ5oYNL7NtfCpcYgBy9pUIpB-agraaSUndeKkM9ZmBX7VOnsGg6Zt3HNgGPSN9uhCBW174qhpN8EH5TXpVaWVG8LrtVnUfc-JoTCXIBNiLkEmVLkSKphwCKdkt9_tiM06XGgXtyp2T1lfail9nhM609Jo612VGZ8VhfWVN0M4IKsr4qtoqCDmVq-6Tl18vlInBb5RWiKIGcJRbOTb5ULXOv5fgH0iiqu_Wu6vR0_FL7ZTm_n14v-3X8IDBE1VT_a4D4PlYuVeITBZmhFsl7OzUZyDo5De4_nDz-kv3dzinw |
link.rule.ids | 315,783,787,867,2109,12777,21400,27936,27937,33385,33756,43612,43817 |
linkProvider | ProQuest |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1Nb9QwEB1BOQAHVL7UhRYshIQ4eLuJnTg5IFSqLlsoRYJW6s2yY7sCdZOy2T3w75lxvCwcIMfEsuKxPfNsj98DeGmVQpiQez7xWeAysxm3-PAQ6rKy3hHOp2yL03J2Lj9cFBdpw61PaZVrnxgdtesa2iPfJ0UIkROaf3v9g5NqFJ2uJgmNm3BLCozVdFN8-n49nojLTohBQDt6ZlzsVDKqy9N5I8fIVg8nlxi11f738bzz83ExluMiU1GKZROpIqH_v9x2jEXTbbiXQCQ7GHr9Ptzw7QO4-we14EN483m1vEIA3TNEpcxtUoNYF1j_7QoHQMta0-KaeaiFzSnn9iejnfz-EZxPj84OZzxJJfBGYLjhtglo8LKUgTQ888yi6V1hZMitRwRYNbaWkfLTUMjOazVpMq-8dU6UOKeNeAxbbdf6HWAY8q0J6EAlHXpinxk_wYqKhtSq8tqP4PXaLPp6YMTQuJIgE-JKgkyoCy11NOEI3pHdfpcjLuv4oltc6tQ87UJllApFQdjMKGtc8LWwQZSlC3WwI3hBVtfEVtFSOsylWfW9Pv76RR-U-Ed5hRBmBK9SodAtF6Yx6XYBtokIrv4qubvuPZ3ma683o-vJ_z8_h9uzs08n-uT49ONTuIPwqR5oH3dha7lY-T2EKEv7LI7DX-if4R4 |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Outlooks+for+development+of+silicon+nanoparticle+memory+cells&rft.jtitle=Modern+Electronic+Materials&rft.au=Talyzin1%2C+Igor+V&rft.au=Samsonov1%2C+Vladimir+M&rft.date=2019-12-31&rft.pub=Pensoft+Publishers&rft.issn=2452-2449&rft.issue=4&rft.spage=159&rft_id=info:doi/10.3897%2Fj.moem.5.4.51788&rft.externalDocID=A622928110 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2452-2449&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2452-2449&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2452-2449&client=summon |