Lie detection using extreme learning machine: A concealed information test based on short‐time Fourier transform and binary bat optimization using a novel fitness function

• Published in: Computational intelligence Vol. 36; no. 2; pp. 637 - 658
• Main Authors: Dodia, Shubham, Edla, Damodar R., Bablani, Annushree, Cheruku, Ramalingaswamy
• Format: Journal Article
• Language: English
• Published: Hoboken, USA John Wiley & Sons, Inc 01.05.2020; Blackwell Publishing Ltd
• Subjects: Algorithms; Artificial neural networks; binary bat; Brain; brain‐computer interface; concealed information test; electroencephalogram; extreme learning machine; Feature extraction; Forensic science; Fourier transforms; Machine learning; Optimization; short‐time Fourier transform; Visual stimuli

Lie detection is one of the major challenges that is being faced by the forensic sciences. Identification of lie on the basis of a person's mental behavior is a tedious task. Brain‐computer interface is one such medium which provides a solution to this problem by displaying visual stimuli and r...