Rasool, A., Amiruddin, R., Mohamed, I. R., & Kumar, M. S. (2020). Fabrication and characterization of resistive random access memory (ReRAM) devices using molybdenum trioxide (MoO3) as switching layer. Superlattices and microstructures, 147, 106682. https://doi.org/10.1016/j.spmi.2020.106682
Chicago Style (17th ed.) CitationRasool, Asif, R. Amiruddin, I. Raja Mohamed, and M.C. Santhosh Kumar. "Fabrication and Characterization of Resistive Random Access Memory (ReRAM) Devices Using Molybdenum Trioxide (MoO3) as Switching Layer." Superlattices and Microstructures 147 (2020): 106682. https://doi.org/10.1016/j.spmi.2020.106682.
MLA (9th ed.) CitationRasool, Asif, et al. "Fabrication and Characterization of Resistive Random Access Memory (ReRAM) Devices Using Molybdenum Trioxide (MoO3) as Switching Layer." Superlattices and Microstructures, vol. 147, 2020, p. 106682, https://doi.org/10.1016/j.spmi.2020.106682.