Scalable Microring-Based Silicon Clos Switch Fabric With Switch-and-Select Stages

We propose and analyze a scalable microring-based Clos switch fabric architecture constructed with switch-and-select switching stages. A silicon 4 × 4 building block that was designed and fabricated through American Institute for Manufacturing Integrated Photonics is used for the proof-of-principle...

Full description

Saved in:
Bibliographic Details
Published inIEEE journal of selected topics in quantum electronics Vol. 25; no. 5; pp. 1 - 11
Main Authors Qixiang Cheng, Bahadori, Meisam, Yu-Han Hung, Yishen Huang, Abrams, Nathan, Bergman, Keren
Format Journal Article
LanguageEnglish
Published New York IEEE 01.09.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Institute of Electrical and Electronics Engineers
Subjects
Online AccessGet full text

Cover

Loading…
Abstract We propose and analyze a scalable microring-based Clos switch fabric architecture constructed with switch-and-select switching stages. A silicon 4 × 4 building block that was designed and fabricated through American Institute for Manufacturing Integrated Photonics is used for the proof-of-principle demonstration of a 16 × 16 Clos switch fabric. By fully blocking the first-order crosstalk, the 4 × 4 device is measured to show a crosstalk ratio in the range of -57 to -48.5 dB, enabling better than -39 dB crosstalk for the 16 × 16 switch. Our study shows that the three-stage Clos design enables up to a factor of 4 in the reduction of the number of switching cells compared to single-stage switch-and-select fabrics. We further explore the design space for both first-order and second-order switching elements using the foundry-validated parameters and how these factors impact the performance and scalability of the three-stage Clos switch. A detailed power penalty map is drawn for Clos switch fabrics with various scales, which reveals that the ultimate key limiting factor is the shuffle insertion loss. An optimized 32-port Clos switch fabric using foundry-enabled parameters is shown to have a less than 10-dB power penalty.
AbstractList We propose and analyze a scalable microring-based Clos switch fabric architecture constructed with switch-and-select switching stages. A silicon 4 × 4 building block that was designed and fabricated through American Institute for Manufacturing Integrated Photonics is used for the proof-of-principle demonstration of a 16 × 16 Clos switch fabric. By fully blocking the first-order crosstalk, the 4 × 4 device is measured to show a crosstalk ratio in the range of -57 to -48.5 dB, enabling better than -39 dB crosstalk for the 16 × 16 switch. Our study shows that the three-stage Clos design enables up to a factor of 4 in the reduction of the number of switching cells compared to single-stage switch-and-select fabrics. We further explore the design space for both first-order and second-order switching elements using the foundry-validated parameters and how these factors impact the performance and scalability of the three-stage Clos switch. A detailed power penalty map is drawn for Clos switch fabrics with various scales, which reveals that the ultimate key limiting factor is the shuffle insertion loss. An optimized 32-port Clos switch fabric using foundry-enabled parameters is shown to have a less than 10-dB power penalty.
Author Qixiang Cheng
Bergman, Keren
Yishen Huang
Bahadori, Meisam
Yu-Han Hung
Abrams, Nathan
Author_xml – sequence: 1
  surname: Qixiang Cheng
  fullname: Qixiang Cheng
  email: qc2228@columbia.edu
  organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
– sequence: 2
  givenname: Meisam
  surname: Bahadori
  fullname: Bahadori, Meisam
  email: mb3875@columbia.edu
  organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
– sequence: 3
  surname: Yu-Han Hung
  fullname: Yu-Han Hung
  email: yh3128@columbia.edu
  organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
– sequence: 4
  surname: Yishen Huang
  fullname: Yishen Huang
  email: yh2785@columbia.edu
  organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
– sequence: 5
  givenname: Nathan
  surname: Abrams
  fullname: Abrams, Nathan
  email: nca2123@columbia.edu
  organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
– sequence: 6
  givenname: Keren
  surname: Bergman
  fullname: Bergman, Keren
  email: bergman@ee.columbia.edu
  organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
BackLink https://www.osti.gov/biblio/2280411$$D View this record in Osti.gov
BookMark eNp9kMtOwzAQRS1UJJ4_AJsI1il-JbGXULU8VIRQQLCzbGdCjUICtivE3-PSigULVh5Z585cnT006oceEDoieEwIlmc39cP9dEwxkWMqCeGUbKFdUhQi5wWnozTjqsppiZ930F4IrxhjwQXeRfe11Z02HWS3zvrBu_4lv9ABmqx2nbNDn026IWT1p4t2kc208c5mTy4uNl-57pu8hg5szOqoXyAcoO1WdwEON-8-epxNHyZX-fzu8npyPs8tK8uYV8AsE2AazEVpGmG5Zi2wyhBZCslkwStMbMOZMbhqCqCVMNDiquVcUDCE7aOT9d4hRKeCdRHsIhXuUxVFqcCcrKDTNfTuh48lhKheh6XvU6-E0JIUUpIyUXRNJQMheGjVu3dv2n8pgtXKr_rxq1Z-1cZvCok_oVRBRzf00WvX_R89XkcdAPzeEqVkBSfsG87giR4
CODEN IJSQEN
CitedBy_id crossref_primary_10_1109_JLT_2024_3449432
crossref_primary_10_3390_bios12070497
crossref_primary_10_1109_JLT_2019_2945941
crossref_primary_10_1109_JLT_2020_2983463
crossref_primary_10_1364_OL_394744
crossref_primary_10_1109_ACCESS_2019_2930754
crossref_primary_10_1109_JLT_2022_3188773
crossref_primary_10_1364_OE_27_019426
crossref_primary_10_1002_adpr_202300072
crossref_primary_10_1364_OE_420696
crossref_primary_10_1364_OE_532245
crossref_primary_10_1364_JOCN_497372
crossref_primary_10_1364_OE_388931
crossref_primary_10_1088_1361_6463_ab8b94
crossref_primary_10_1109_JSTQE_2019_2960950
crossref_primary_10_1002_lpor_202200571
crossref_primary_10_1364_OSAC_419408
crossref_primary_10_35848_1347_4065_ac65d9
crossref_primary_10_3390_app13053062
crossref_primary_10_3390_mi13122132
crossref_primary_10_1109_JQE_2022_3224778
crossref_primary_10_1109_JSTQE_2019_2950770
crossref_primary_10_3390_photonics10040367
crossref_primary_10_1109_JLT_2022_3186300
crossref_primary_10_3390_photonics9050320
crossref_primary_10_1109_JPROC_2020_2968184
crossref_primary_10_1109_JLT_2020_2975976
crossref_primary_10_1109_JLT_2020_3008001
crossref_primary_10_1364_JOSAB_395275
crossref_primary_10_1364_PRJ_479499
crossref_primary_10_1109_JLT_2023_3276588
crossref_primary_10_1002_lpor_202300275
crossref_primary_10_1063_5_0160441
crossref_primary_10_1364_OL_392482
Cites_doi 10.1109/JPHOT.2018.2791561
10.1109/JPHOT.2017.2662480
10.1109/ECOC.2018.8535403
10.1364/OE.27.005203
10.1038/ncomms5008
10.1109/JPROC.2018.2860994
10.1109/JLT.2013.2294564
10.1364/OPEX.13.005106
10.1364/OPTICA.5.001354
10.1364/PRJ.7.000155
10.1109/JLT.2018.2821359
10.1109/PHOTONICS.2010.5698892
10.1109/JLT.2017.2781131
10.1109/ECOC.2015.7341906
10.1364/OE.25.023677
10.1364/OL.39.001449
10.1364/OFC.2018.Th1J.4
10.1002/j.1538-7305.1953.tb01433.x
10.1364/OE.21.029374
10.1364/OE.16.015915
10.1109/LPT.2010.2049834
10.1364/JON.8.000215
10.1364/OE.26.016022
10.1364/OL.38.003608
10.1109/JSSC.2016.2519390
10.1364/OL.39.000335
10.1109/JLT.2013.2293919
10.1109/JLT.2013.2278708
10.1109/JSTQE.2013.2296746
10.1364/OE.19.020258
10.1109/ECOC.2006.4801113
10.1038/nature03569
10.1109/JLT.2016.2588459
10.1364/OL.42.004934
10.1038/micronano.2015.42
10.1109/LPT.2003.818653
10.1364/OE.23.001159
10.1364/OFC.2019.W1E.6
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
DBID 97E
ESBDL
RIA
RIE
AAYXX
CITATION
7SP
7U5
8FD
L7M
OTOTI
DOI 10.1109/JSTQE.2019.2911421
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005-present
IEEE Open Access Journals
IEEE All-Society Periodicals Package (ASPP) 1998-Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
OSTI.GOV
DatabaseTitle CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Solid State and Superconductivity Abstracts
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1558-4542
EndPage 11
ExternalDocumentID 2280411
10_1109_JSTQE_2019_2911421
8693541
Genre orig-research
GrantInformation_xml – fundername: Air Force Research Laboratory
  grantid: FA8650-15-2-5220
  funderid: 10.13039/100006602
– fundername: ARPA-E ENLITENED
  grantid: DEAR00000843
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AETIX
AFFNX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
EBS
EJD
ESBDL
F5P
HZ~
H~9
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
TN5
VH1
AAYXX
CITATION
RIG
7SP
7U5
8FD
L7M
OTOTI
ID FETCH-LOGICAL-c366t-7e3c38ebd0486bd8c4a3fe37b196893954701cd43bb07d5e278bef07f4482eb13
IEDL.DBID RIE
ISSN 1077-260X
IngestDate Mon Jan 15 05:22:49 EST 2024
Mon Jun 30 05:16:55 EDT 2025
Thu Apr 24 23:06:00 EDT 2025
Tue Jul 01 04:05:22 EDT 2025
Wed Aug 27 02:40:12 EDT 2025
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 5
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/OAPA.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c366t-7e3c38ebd0486bd8c4a3fe37b196893954701cd43bb07d5e278bef07f4482eb13
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
USDOE
ORCID 0000-0002-7871-0462
0000-0001-8580-1728
0000-0001-8671-2102
0000-0002-1617-6006
0000000185801728
0000000216176006
0000000278710462
0000000186712102
OpenAccessLink https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/document/8693541
PQID 2226159916
PQPubID 75740
PageCount 11
ParticipantIDs crossref_citationtrail_10_1109_JSTQE_2019_2911421
proquest_journals_2226159916
crossref_primary_10_1109_JSTQE_2019_2911421
ieee_primary_8693541
osti_scitechconnect_2280411
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2019-09-01
PublicationDateYYYYMMDD 2019-09-01
PublicationDate_xml – month: 09
  year: 2019
  text: 2019-09-01
  day: 01
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
– name: United States
PublicationTitle IEEE journal of selected topics in quantum electronics
PublicationTitleAbbrev JSTQE
PublicationYear 2019
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Institute of Electrical and Electronics Engineers
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
– name: Institute of Electrical and Electronics Engineers
References ref35
ref13
(ref34) 2019
ref12
ref37
ref15
ref36
ref14
ref31
ref30
ref33
ref11
ref32
ref10
ref2
ref1
ref39
ref17
ref38
ref16
ref19
ref18
dames (ref3) 2008
khope (ref23) 2017
ref24
ref26
ref25
ref41
ref22
ref21
ref28
ref27
ref29
ref8
ref7
ref9
ref4
ref6
ref5
xu (ref20) 2005; 435
ref40
References_xml – ident: ref24
  doi: 10.1109/JPHOT.2018.2791561
– ident: ref33
  doi: 10.1109/JPHOT.2017.2662480
– ident: ref19
  doi: 10.1109/ECOC.2018.8535403
– year: 2008
  ident: ref3
  article-title: Beam steering optical switch
– ident: ref26
  doi: 10.1364/OE.27.005203
– ident: ref13
  doi: 10.1038/ncomms5008
– ident: ref41
  doi: 10.1109/JPROC.2018.2860994
– ident: ref15
  doi: 10.1109/JLT.2013.2294564
– ident: ref36
  doi: 10.1364/OPEX.13.005106
– ident: ref1
  doi: 10.1364/OPTICA.5.001354
– ident: ref25
  doi: 10.1364/PRJ.7.000155
– ident: ref32
  doi: 10.1109/JLT.2018.2821359
– year: 2017
  ident: ref23
  article-title: Elastic WDM optoelectronic crossbar switch with on-chip wavelength control
  publication-title: Advanced Photonics
– ident: ref12
  doi: 10.1109/PHOTONICS.2010.5698892
– ident: ref35
  doi: 10.1109/JLT.2017.2781131
– ident: ref11
  doi: 10.1109/ECOC.2015.7341906
– ident: ref22
  doi: 10.1364/OE.25.023677
– ident: ref8
  doi: 10.1364/OL.39.001449
– ident: ref10
  doi: 10.1364/OFC.2018.Th1J.4
– ident: ref28
  doi: 10.1002/j.1538-7305.1953.tb01433.x
– ident: ref37
  doi: 10.1364/OE.21.029374
– ident: ref17
  doi: 10.1364/OE.16.015915
– ident: ref31
  doi: 10.1109/LPT.2010.2049834
– ident: ref29
  doi: 10.1364/JON.8.000215
– ident: ref5
  doi: 10.1364/OE.26.016022
– ident: ref38
  doi: 10.1364/OL.38.003608
– ident: ref16
  doi: 10.1109/JSSC.2016.2519390
– ident: ref39
  doi: 10.1364/OL.39.000335
– ident: ref4
  doi: 10.1109/JLT.2013.2293919
– ident: ref27
  doi: 10.1109/JLT.2013.2278708
– ident: ref9
  doi: 10.1109/JSTQE.2013.2296746
– ident: ref21
  doi: 10.1364/OE.19.020258
– ident: ref6
  doi: 10.1109/ECOC.2006.4801113
– volume: 435
  start-page: 325
  year: 2005
  ident: ref20
  article-title: Micrometre-scale silicon electro-optic modulator
  publication-title: Nature
  doi: 10.1038/nature03569
– ident: ref40
  doi: 10.1109/JLT.2016.2588459
– ident: ref14
  doi: 10.1364/OL.42.004934
– year: 2019
  ident: ref34
  publication-title: AIM Photonics
– ident: ref7
  doi: 10.1038/micronano.2015.42
– ident: ref2
  doi: 10.1109/LPT.2003.818653
– ident: ref30
  doi: 10.1364/OE.23.001159
– ident: ref18
  doi: 10.1364/OFC.2019.W1E.6
SSID ssj0008480
Score 2.5386567
Snippet We propose and analyze a scalable microring-based Clos switch fabric architecture constructed with switch-and-select switching stages. A silicon 4 × 4 building...
SourceID osti
proquest
crossref
ieee
SourceType Open Access Repository
Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 1
SubjectTerms Blocking
Crosstalk
Fabrics
Insertion loss
microring resonators
Network switching
Optical switches
Parameters
photonic integrated circuits
Photonics
Silicon
silicon photonics
switch architectures
Switching
Topology
Title Scalable Microring-Based Silicon Clos Switch Fabric With Switch-and-Select Stages
URI https://ieeexplore.ieee.org/document/8693541
https://www.proquest.com/docview/2226159916
https://www.osti.gov/biblio/2280411
Volume 25
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3da9swED-6QmF76OfGsn6gh75tSh1LtuzHrTSUQgolK8ubsaTzFhac0jgU9tf3TnbCuo7SJxtL_vzdSXfW3e8ATsu4yivyrGQZOy01VqRScWYll91z2qjShZIso-v08lZfTZLJBnxZ58IgYgg-wz7vhrV8P3dL_lV2ltEFEs5Sf0OOW5urtR51M521zAPGSLLRJ6sEmSg_IxG_ueAorrwf55w7OngyCYWqKrSZk049G5HDNDPcgdHqAdvokt_9ZWP77s8_3I2vfYNd2O7sTfG1FZA92MB6H979xUK4D1shCtQtDuBmTIhxLpUYcZweN8tvNM15MZ7OSGRqcT6bL8T4YUpYi2FpaRAVP6bNr-6QLGsvx6GyjiAr9icu3sPt8OL7-aXsai5Ip9K0kQaVUxlaz1R81mdOl6pCZSxpKpk2eaJNNHBeK2sj4xOMTWaxikxFbl5M4776AJv1vMaPIBw5O2UaoYlRaY9JHlclL0Nqm-aJRd-DwQqEwnWE5FwXY1YExyTKiwBcwcAVHXA9-Lw-566l43ix9wFDsO7Zff0eHDLWBdkYTJTrOKLINQUTA-kBtR6tRKDo9HlBbeRpJmxLf_r_NQ_hLd-5jT47gs3mfonHZK409iTI6SMw6-QC
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3db9MwED9NQwh44GMDUTbAD7yBuyR24uQRplUF1klTN9E3K3YurFqVIpoKaX_97py04kuIp0SxEzm57_judwBvyqQuaoqsZJl4LTXWJFJJ7iS33fPaqNKHliyTs2x8qT_N0tkOvNvWwiBiSD7DIZ-Gvfxq6df8q-wopwekXKV-h-x-GnfVWlu9m-u8wx4wRpKXPtuUyETFETH5-QnncRXDpODq0fgXMxT6qtBhSVL1h04Ohmb0CCabJXb5JdfDdeuG_uY39Mb_fYfH8LD3OMX7jkWewA42e_DgJxzCPbgb8kD9ah_Op0QzrqYSE87U42H5gQxdJabzBTFNI44Xy5WY_pgTtcWodKRGxZd5e9VfkmVTyWnorSPIj_2Kq6dwOTq5OB7LvuuC9CrLWmlQeZWjqxiMz1W516WqURlHskrOTZFqE8W-0sq5yFQpJiZ3WEempkAvIc2vnsFus2zwOQhP4U6ZRWgSVLrCtEjqkjcitcuK1GE1gHhDBOt7SHLujLGwITSJChsIZ5lwtifcAN5u7_nWAXL8c_Y-k2A7s__6AzhgWlvyMhgq13NOkW8tQwPpmEYPNyxge4le0RjFmil70y_-_szXcG98MTm1px_PPh_AfV5Fl4t2CLvt9zW-JOelda8Cz94CPu_nSw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Scalable+Microring-Based+Silicon+Clos+Switch+Fabric+With+Switch-and-Select+Stages&rft.jtitle=IEEE+journal+of+selected+topics+in+quantum+electronics&rft.au=Cheng%2C+Qixiang&rft.au=Bahadori%2C+Meisam&rft.au=Yu-Han%2C+Hung&rft.au=Huang%2C+Yishen&rft.date=2019-09-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=1077-260X&rft.eissn=1558-4542&rft.volume=25&rft.issue=5&rft.spage=1&rft_id=info:doi/10.1109%2FJSTQE.2019.2911421&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1077-260X&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1077-260X&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1077-260X&client=summon