Scalable Microring-Based Silicon Clos Switch Fabric With Switch-and-Select Stages
We propose and analyze a scalable microring-based Clos switch fabric architecture constructed with switch-and-select switching stages. A silicon 4 × 4 building block that was designed and fabricated through American Institute for Manufacturing Integrated Photonics is used for the proof-of-principle...
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Published in | IEEE journal of selected topics in quantum electronics Vol. 25; no. 5; pp. 1 - 11 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.09.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers |
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Abstract | We propose and analyze a scalable microring-based Clos switch fabric architecture constructed with switch-and-select switching stages. A silicon 4 × 4 building block that was designed and fabricated through American Institute for Manufacturing Integrated Photonics is used for the proof-of-principle demonstration of a 16 × 16 Clos switch fabric. By fully blocking the first-order crosstalk, the 4 × 4 device is measured to show a crosstalk ratio in the range of -57 to -48.5 dB, enabling better than -39 dB crosstalk for the 16 × 16 switch. Our study shows that the three-stage Clos design enables up to a factor of 4 in the reduction of the number of switching cells compared to single-stage switch-and-select fabrics. We further explore the design space for both first-order and second-order switching elements using the foundry-validated parameters and how these factors impact the performance and scalability of the three-stage Clos switch. A detailed power penalty map is drawn for Clos switch fabrics with various scales, which reveals that the ultimate key limiting factor is the shuffle insertion loss. An optimized 32-port Clos switch fabric using foundry-enabled parameters is shown to have a less than 10-dB power penalty. |
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AbstractList | We propose and analyze a scalable microring-based Clos switch fabric architecture constructed with switch-and-select switching stages. A silicon 4 × 4 building block that was designed and fabricated through American Institute for Manufacturing Integrated Photonics is used for the proof-of-principle demonstration of a 16 × 16 Clos switch fabric. By fully blocking the first-order crosstalk, the 4 × 4 device is measured to show a crosstalk ratio in the range of -57 to -48.5 dB, enabling better than -39 dB crosstalk for the 16 × 16 switch. Our study shows that the three-stage Clos design enables up to a factor of 4 in the reduction of the number of switching cells compared to single-stage switch-and-select fabrics. We further explore the design space for both first-order and second-order switching elements using the foundry-validated parameters and how these factors impact the performance and scalability of the three-stage Clos switch. A detailed power penalty map is drawn for Clos switch fabrics with various scales, which reveals that the ultimate key limiting factor is the shuffle insertion loss. An optimized 32-port Clos switch fabric using foundry-enabled parameters is shown to have a less than 10-dB power penalty. |
Author | Qixiang Cheng Bergman, Keren Yishen Huang Bahadori, Meisam Yu-Han Hung Abrams, Nathan |
Author_xml | – sequence: 1 surname: Qixiang Cheng fullname: Qixiang Cheng email: qc2228@columbia.edu organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA – sequence: 2 givenname: Meisam surname: Bahadori fullname: Bahadori, Meisam email: mb3875@columbia.edu organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA – sequence: 3 surname: Yu-Han Hung fullname: Yu-Han Hung email: yh3128@columbia.edu organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA – sequence: 4 surname: Yishen Huang fullname: Yishen Huang email: yh2785@columbia.edu organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA – sequence: 5 givenname: Nathan surname: Abrams fullname: Abrams, Nathan email: nca2123@columbia.edu organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA – sequence: 6 givenname: Keren surname: Bergman fullname: Bergman, Keren email: bergman@ee.columbia.edu organization: Dept. of Electr. Eng., Columbia Univ., New York, NY, USA |
BackLink | https://www.osti.gov/biblio/2280411$$D View this record in Osti.gov |
BookMark | eNp9kMtOwzAQRS1UJJ4_AJsI1il-JbGXULU8VIRQQLCzbGdCjUICtivE3-PSigULVh5Z585cnT006oceEDoieEwIlmc39cP9dEwxkWMqCeGUbKFdUhQi5wWnozTjqsppiZ930F4IrxhjwQXeRfe11Z02HWS3zvrBu_4lv9ABmqx2nbNDn026IWT1p4t2kc208c5mTy4uNl-57pu8hg5szOqoXyAcoO1WdwEON-8-epxNHyZX-fzu8npyPs8tK8uYV8AsE2AazEVpGmG5Zi2wyhBZCslkwStMbMOZMbhqCqCVMNDiquVcUDCE7aOT9d4hRKeCdRHsIhXuUxVFqcCcrKDTNfTuh48lhKheh6XvU6-E0JIUUpIyUXRNJQMheGjVu3dv2n8pgtXKr_rxq1Z-1cZvCok_oVRBRzf00WvX_R89XkcdAPzeEqVkBSfsG87giR4 |
CODEN | IJSQEN |
CitedBy_id | crossref_primary_10_1109_JLT_2024_3449432 crossref_primary_10_3390_bios12070497 crossref_primary_10_1109_JLT_2019_2945941 crossref_primary_10_1109_JLT_2020_2983463 crossref_primary_10_1364_OL_394744 crossref_primary_10_1109_ACCESS_2019_2930754 crossref_primary_10_1109_JLT_2022_3188773 crossref_primary_10_1364_OE_27_019426 crossref_primary_10_1002_adpr_202300072 crossref_primary_10_1364_OE_420696 crossref_primary_10_1364_OE_532245 crossref_primary_10_1364_JOCN_497372 crossref_primary_10_1364_OE_388931 crossref_primary_10_1088_1361_6463_ab8b94 crossref_primary_10_1109_JSTQE_2019_2960950 crossref_primary_10_1002_lpor_202200571 crossref_primary_10_1364_OSAC_419408 crossref_primary_10_35848_1347_4065_ac65d9 crossref_primary_10_3390_app13053062 crossref_primary_10_3390_mi13122132 crossref_primary_10_1109_JQE_2022_3224778 crossref_primary_10_1109_JSTQE_2019_2950770 crossref_primary_10_3390_photonics10040367 crossref_primary_10_1109_JLT_2022_3186300 crossref_primary_10_3390_photonics9050320 crossref_primary_10_1109_JPROC_2020_2968184 crossref_primary_10_1109_JLT_2020_2975976 crossref_primary_10_1109_JLT_2020_3008001 crossref_primary_10_1364_JOSAB_395275 crossref_primary_10_1364_PRJ_479499 crossref_primary_10_1109_JLT_2023_3276588 crossref_primary_10_1002_lpor_202300275 crossref_primary_10_1063_5_0160441 crossref_primary_10_1364_OL_392482 |
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ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019 |
DBID | 97E ESBDL RIA RIE AAYXX CITATION 7SP 7U5 8FD L7M OTOTI |
DOI | 10.1109/JSTQE.2019.2911421 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE Open Access Journals IEEE All-Society Periodicals Package (ASPP) 1998-Present IEEE Electronic Library (IEL) CrossRef Electronics & Communications Abstracts Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace OSTI.GOV |
DatabaseTitle | CrossRef Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts |
DatabaseTitleList | Solid State and Superconductivity Abstracts |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EISSN | 1558-4542 |
EndPage | 11 |
ExternalDocumentID | 2280411 10_1109_JSTQE_2019_2911421 8693541 |
Genre | orig-research |
GrantInformation_xml | – fundername: Air Force Research Laboratory grantid: FA8650-15-2-5220 funderid: 10.13039/100006602 – fundername: ARPA-E ENLITENED grantid: DEAR00000843 |
GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AFFNX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 EBS EJD ESBDL F5P HZ~ H~9 IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RNS TN5 VH1 AAYXX CITATION RIG 7SP 7U5 8FD L7M OTOTI |
ID | FETCH-LOGICAL-c366t-7e3c38ebd0486bd8c4a3fe37b196893954701cd43bb07d5e278bef07f4482eb13 |
IEDL.DBID | RIE |
ISSN | 1077-260X |
IngestDate | Mon Jan 15 05:22:49 EST 2024 Mon Jun 30 05:16:55 EDT 2025 Thu Apr 24 23:06:00 EDT 2025 Tue Jul 01 04:05:22 EDT 2025 Wed Aug 27 02:40:12 EDT 2025 |
IsDoiOpenAccess | true |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 5 |
Language | English |
License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/OAPA.html |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c366t-7e3c38ebd0486bd8c4a3fe37b196893954701cd43bb07d5e278bef07f4482eb13 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 USDOE |
ORCID | 0000-0002-7871-0462 0000-0001-8580-1728 0000-0001-8671-2102 0000-0002-1617-6006 0000000185801728 0000000216176006 0000000278710462 0000000186712102 |
OpenAccessLink | https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/document/8693541 |
PQID | 2226159916 |
PQPubID | 75740 |
PageCount | 11 |
ParticipantIDs | crossref_citationtrail_10_1109_JSTQE_2019_2911421 proquest_journals_2226159916 crossref_primary_10_1109_JSTQE_2019_2911421 ieee_primary_8693541 osti_scitechconnect_2280411 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2019-09-01 |
PublicationDateYYYYMMDD | 2019-09-01 |
PublicationDate_xml | – month: 09 year: 2019 text: 2019-09-01 day: 01 |
PublicationDecade | 2010 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York – name: United States |
PublicationTitle | IEEE journal of selected topics in quantum electronics |
PublicationTitleAbbrev | JSTQE |
PublicationYear | 2019 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) – name: Institute of Electrical and Electronics Engineers |
References | ref35 ref13 (ref34) 2019 ref12 ref37 ref15 ref36 ref14 ref31 ref30 ref33 ref11 ref32 ref10 ref2 ref1 ref39 ref17 ref38 ref16 ref19 ref18 dames (ref3) 2008 khope (ref23) 2017 ref24 ref26 ref25 ref41 ref22 ref21 ref28 ref27 ref29 ref8 ref7 ref9 ref4 ref6 ref5 xu (ref20) 2005; 435 ref40 |
References_xml | – ident: ref24 doi: 10.1109/JPHOT.2018.2791561 – ident: ref33 doi: 10.1109/JPHOT.2017.2662480 – ident: ref19 doi: 10.1109/ECOC.2018.8535403 – year: 2008 ident: ref3 article-title: Beam steering optical switch – ident: ref26 doi: 10.1364/OE.27.005203 – ident: ref13 doi: 10.1038/ncomms5008 – ident: ref41 doi: 10.1109/JPROC.2018.2860994 – ident: ref15 doi: 10.1109/JLT.2013.2294564 – ident: ref36 doi: 10.1364/OPEX.13.005106 – ident: ref1 doi: 10.1364/OPTICA.5.001354 – ident: ref25 doi: 10.1364/PRJ.7.000155 – ident: ref32 doi: 10.1109/JLT.2018.2821359 – year: 2017 ident: ref23 article-title: Elastic WDM optoelectronic crossbar switch with on-chip wavelength control publication-title: Advanced Photonics – ident: ref12 doi: 10.1109/PHOTONICS.2010.5698892 – ident: ref35 doi: 10.1109/JLT.2017.2781131 – ident: ref11 doi: 10.1109/ECOC.2015.7341906 – ident: ref22 doi: 10.1364/OE.25.023677 – ident: ref8 doi: 10.1364/OL.39.001449 – ident: ref10 doi: 10.1364/OFC.2018.Th1J.4 – ident: ref28 doi: 10.1002/j.1538-7305.1953.tb01433.x – ident: ref37 doi: 10.1364/OE.21.029374 – ident: ref17 doi: 10.1364/OE.16.015915 – ident: ref31 doi: 10.1109/LPT.2010.2049834 – ident: ref29 doi: 10.1364/JON.8.000215 – ident: ref5 doi: 10.1364/OE.26.016022 – ident: ref38 doi: 10.1364/OL.38.003608 – ident: ref16 doi: 10.1109/JSSC.2016.2519390 – ident: ref39 doi: 10.1364/OL.39.000335 – ident: ref4 doi: 10.1109/JLT.2013.2293919 – ident: ref27 doi: 10.1109/JLT.2013.2278708 – ident: ref9 doi: 10.1109/JSTQE.2013.2296746 – ident: ref21 doi: 10.1364/OE.19.020258 – ident: ref6 doi: 10.1109/ECOC.2006.4801113 – volume: 435 start-page: 325 year: 2005 ident: ref20 article-title: Micrometre-scale silicon electro-optic modulator publication-title: Nature doi: 10.1038/nature03569 – ident: ref40 doi: 10.1109/JLT.2016.2588459 – ident: ref14 doi: 10.1364/OL.42.004934 – year: 2019 ident: ref34 publication-title: AIM Photonics – ident: ref7 doi: 10.1038/micronano.2015.42 – ident: ref2 doi: 10.1109/LPT.2003.818653 – ident: ref30 doi: 10.1364/OE.23.001159 – ident: ref18 doi: 10.1364/OFC.2019.W1E.6 |
SSID | ssj0008480 |
Score | 2.5386567 |
Snippet | We propose and analyze a scalable microring-based Clos switch fabric architecture constructed with switch-and-select switching stages. A silicon 4 × 4 building... |
SourceID | osti proquest crossref ieee |
SourceType | Open Access Repository Aggregation Database Enrichment Source Index Database Publisher |
StartPage | 1 |
SubjectTerms | Blocking Crosstalk Fabrics Insertion loss microring resonators Network switching Optical switches Parameters photonic integrated circuits Photonics Silicon silicon photonics switch architectures Switching Topology |
Title | Scalable Microring-Based Silicon Clos Switch Fabric With Switch-and-Select Stages |
URI | https://ieeexplore.ieee.org/document/8693541 https://www.proquest.com/docview/2226159916 https://www.osti.gov/biblio/2280411 |
Volume | 25 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3da9swED-6QmF76OfGsn6gh75tSh1LtuzHrTSUQgolK8ubsaTzFhac0jgU9tf3TnbCuo7SJxtL_vzdSXfW3e8ATsu4yivyrGQZOy01VqRScWYll91z2qjShZIso-v08lZfTZLJBnxZ58IgYgg-wz7vhrV8P3dL_lV2ltEFEs5Sf0OOW5urtR51M521zAPGSLLRJ6sEmSg_IxG_ueAorrwf55w7OngyCYWqKrSZk049G5HDNDPcgdHqAdvokt_9ZWP77s8_3I2vfYNd2O7sTfG1FZA92MB6H979xUK4D1shCtQtDuBmTIhxLpUYcZweN8tvNM15MZ7OSGRqcT6bL8T4YUpYi2FpaRAVP6bNr-6QLGsvx6GyjiAr9icu3sPt8OL7-aXsai5Ip9K0kQaVUxlaz1R81mdOl6pCZSxpKpk2eaJNNHBeK2sj4xOMTWaxikxFbl5M4776AJv1vMaPIBw5O2UaoYlRaY9JHlclL0Nqm-aJRd-DwQqEwnWE5FwXY1YExyTKiwBcwcAVHXA9-Lw-566l43ix9wFDsO7Zff0eHDLWBdkYTJTrOKLINQUTA-kBtR6tRKDo9HlBbeRpJmxLf_r_NQ_hLd-5jT47gs3mfonHZK409iTI6SMw6-QC |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3db9MwED9NQwh44GMDUTbAD7yBuyR24uQRplUF1klTN9E3K3YurFqVIpoKaX_97py04kuIp0SxEzm57_judwBvyqQuaoqsZJl4LTXWJFJJ7iS33fPaqNKHliyTs2x8qT_N0tkOvNvWwiBiSD7DIZ-Gvfxq6df8q-wopwekXKV-h-x-GnfVWlu9m-u8wx4wRpKXPtuUyETFETH5-QnncRXDpODq0fgXMxT6qtBhSVL1h04Ohmb0CCabJXb5JdfDdeuG_uY39Mb_fYfH8LD3OMX7jkWewA42e_DgJxzCPbgb8kD9ah_Op0QzrqYSE87U42H5gQxdJabzBTFNI44Xy5WY_pgTtcWodKRGxZd5e9VfkmVTyWnorSPIj_2Kq6dwOTq5OB7LvuuC9CrLWmlQeZWjqxiMz1W516WqURlHskrOTZFqE8W-0sq5yFQpJiZ3WEempkAvIc2vnsFus2zwOQhP4U6ZRWgSVLrCtEjqkjcitcuK1GE1gHhDBOt7SHLujLGwITSJChsIZ5lwtifcAN5u7_nWAXL8c_Y-k2A7s__6AzhgWlvyMhgq13NOkW8tQwPpmEYPNyxge4le0RjFmil70y_-_szXcG98MTm1px_PPh_AfV5Fl4t2CLvt9zW-JOelda8Cz94CPu_nSw |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Scalable+Microring-Based+Silicon+Clos+Switch+Fabric+With+Switch-and-Select+Stages&rft.jtitle=IEEE+journal+of+selected+topics+in+quantum+electronics&rft.au=Cheng%2C+Qixiang&rft.au=Bahadori%2C+Meisam&rft.au=Yu-Han%2C+Hung&rft.au=Huang%2C+Yishen&rft.date=2019-09-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=1077-260X&rft.eissn=1558-4542&rft.volume=25&rft.issue=5&rft.spage=1&rft_id=info:doi/10.1109%2FJSTQE.2019.2911421&rft.externalDBID=NO_FULL_TEXT |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1077-260X&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1077-260X&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1077-260X&client=summon |