APA (7th ed.) Citation

Evagora, A. M., Murray, N. J., Holland, A. D., Burt, D., & Endicott, J. (2012). Novel method for identifying the cause of inherent ageing in Electron Multiplying Charge Coupled Devices. Journal of instrumentation, 7(1), C01023. https://doi.org/10.1088/1748-0221/7/01/C01023

Chicago Style (17th ed.) Citation

Evagora, A M., N J. Murray, A D. Holland, D. Burt, and J. Endicott. "Novel Method for Identifying the Cause of Inherent Ageing in Electron Multiplying Charge Coupled Devices." Journal of Instrumentation 7, no. 1 (2012): C01023. https://doi.org/10.1088/1748-0221/7/01/C01023.

MLA (9th ed.) Citation

Evagora, A M., et al. "Novel Method for Identifying the Cause of Inherent Ageing in Electron Multiplying Charge Coupled Devices." Journal of Instrumentation, vol. 7, no. 1, 2012, p. C01023, https://doi.org/10.1088/1748-0221/7/01/C01023.