Impact of Material and Process Variations on the Distribution of Multicrystalline Silicon PERC Cell Efficiencies

• Published in: IEEE journal of photovoltaics Vol. 7; no. 1; pp. 118 - 128
• Main Authors: Wasmer, Sven, Greulich, Johannes, Hoffler, Hannes, Wohrle, Nico, Demant, Matthias, Fertig, Fabian, Rein, Stefan
• Format: Journal Article
• Language: English
• Published: Piscataway IEEE 01.01.2017; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Assembly lines; Characterization; Electrical resistance measurement; Emitters; metamodeling; Metamodels; multicrystalline silicon (mc-Si); Optical refraction; Optical variables control; Parameter sensitivity; passivated emitter and rear cell (PERC); Photovoltaic cells; Production lines; Resistance; Sensitivity analysis; Silicon; simulation; Solar cells; Variance analysis; Wavelength measurement

We present an approach for examining and understanding the impact of material and process variations on solar cell efficiencies using the example of an industrial feasible multicrystalline silicon (mc-Si) passivated emitter and rear cell (PERC) process. We fabricate and characterize more than 800 mc...