APA (7th ed.) Citation

Zhao, S., Chen, S., & Wang, H. (2019). Degradation modeling for reliability estimation of DC film capacitors subject to humidity acceleration. Microelectronics and reliability, 100-101, 113401. https://doi.org/10.1016/j.microrel.2019.113401

Chicago Style (17th ed.) Citation

Zhao, Shuai, Shaowei Chen, and Huai Wang. "Degradation Modeling for Reliability Estimation of DC Film Capacitors Subject to Humidity Acceleration." Microelectronics and Reliability 100-101 (2019): 113401. https://doi.org/10.1016/j.microrel.2019.113401.

MLA (9th ed.) Citation

Zhao, Shuai, et al. "Degradation Modeling for Reliability Estimation of DC Film Capacitors Subject to Humidity Acceleration." Microelectronics and Reliability, vol. 100-101, 2019, p. 113401, https://doi.org/10.1016/j.microrel.2019.113401.