Potential-Induced Degradation (PID): Introduction of a Novel Test Approach and Explanation of Increased Depletion Region Recombination

• Published in: IEEE journal of photovoltaics Vol. 4; no. 3; pp. 834 - 840
• Main Authors: Lausch, Dominik, Naumann, Volker, Breitenstein, Otwin, Bauer, Jan, Graff, Andreas, Bagdahn, Joerg, Hagendorf, Christian
• Format: Journal Article
• Language: English
• Published: Piscataway IEEE 01.05.2014; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Crystal defect; Degradation; Glass; Photovoltaic cells; potential-induced degradation (PID); recombination; Resistance; Silicon; Silicon compounds; Solar energy; Stacking

In recent years, a detrimental degradation mechanism of solar cells in large photovoltaic fields called potential-induced degradation (PID) has been intensively investigated and discussed. Here, the module efficiency is decreasing down to a fractional part of their original efficiency. In this study...