Concentration dependent electron distributions in heavily Si-doped GaAs

Photoluminescence spectra of heavily Si-doped GaAs grown by molecular beam epitaxy (MBE) were investigated at 20 K as a function of electron concentration. We found that the two peaks in the electron populations of the conduction band and the donor band, respectively, merge as the doping concentrati...

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Published inSolid state communications Vol. 99; no. 8; pp. 571 - 575
Main Authors Lee, Nam-Young, Kim, Jae-Eun, Park, Hae Yong, Kwak, Dong-Hwa, Lee, Hee-Chul, Lim, H.
Format Journal Article
LanguageEnglish
Published Oxford Elsevier Ltd 1996
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Abstract Photoluminescence spectra of heavily Si-doped GaAs grown by molecular beam epitaxy (MBE) were investigated at 20 K as a function of electron concentration. We found that the two peaks in the electron populations of the conduction band and the donor band, respectively, merge as the doping concentration increases, and can not be distinguished at the electron concentration of the order of 10 18 cm −3.
AbstractList Photoluminescence spectra of heavily Si-doped GaAs grown by molecular beam epitaxy (MBE) were investigated at 20 K as a function of electron concentration. We found that the two peaks in the electron populations of the conduction band and the donor band, respectively, merge as the doping concentration increases, and can not be distinguished at the electron concentration of the order of 10 super(18) cm super(-3).
Photoluminescence spectra of heavily Si-doped GaAs grown by molecular beam epitaxy (MBE) were investigated at 20 K as a function of electron concentration. We found that the two peaks in the electron populations of the conduction band and the donor band, respectively, merge as the doping concentration increases, and can not be distinguished at the electron concentration of the order of 10 18 cm −3.
Author Lee, Hee-Chul
Lim, H.
Lee, Nam-Young
Kim, Jae-Eun
Park, Hae Yong
Kwak, Dong-Hwa
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CitedBy_id crossref_primary_10_1016_S0022_0248_01_00638_8
crossref_primary_10_1103_PhysRevB_103_195314
crossref_primary_10_1016_j_jcrysgro_2012_03_008
crossref_primary_10_1143_JJAP_38_6583
Cites_doi 10.1063/1.359090
10.1103/PhysRevB.22.886
10.1143/JJAP.29.1900
10.1063/1.337069
10.1063/1.344532
10.1103/PhysRevB.43.4771
10.1080/00018737800101484
10.1063/1.322626
10.1063/1.342906
10.1007/BF00278341
10.1063/1.339777
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10.1063/1.343958
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Issue 8
Keywords A. semiconductors
E. luminescence
D. electronic band structure
Band structure
Gallium arsenides
Epitaxial layers
Semiconductor materials
Epitaxy
Doping
Luminescence
Experimental study
Silicon additions
III-V compound
Thin films
Electronic structure
Optical properties
Molecular beam epitaxy
III-V semiconductors
Language English
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Snippet Photoluminescence spectra of heavily Si-doped GaAs grown by molecular beam epitaxy (MBE) were investigated at 20 K as a function of electron concentration. We...
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StartPage 571
SubjectTerms A. semiconductors
Condensed matter: electronic structure, electrical, magnetic, and optical properties
D. electronic band structure
E. luminescence
Exact sciences and technology
Iii-v semiconductors
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physics
Title Concentration dependent electron distributions in heavily Si-doped GaAs
URI https://dx.doi.org/10.1016/0038-1098(96)00221-9
https://search.proquest.com/docview/26111662
Volume 99
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